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Journal Articles

Interpretation of complex x-ray photoelectron peak shapes. II. Case study of Fe 2p3/2 fitting applied to austenitic stainless steels 316 and 304

A. E. Hughes, C. D. Easton, T. R. Gengenbach, M. C. Biesinger, M. Laleh
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 42, 053206 (2024)
https://doi.org/10.1116/6.0003842
Published: August 2024
View article titled, Interpretation of complex x-ray photoelectron peak shapes. II. Case study of Fe 2p<sub>3/2</sub> fitting applied to austenitic stainless steels 316 and 304
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Journal Articles

Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy

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Kateryna Artyushkova, Stuart R. Leadley, Alexander G. Shard
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 42, 052801 (2024)
https://doi.org/10.1116/6.0003740
Published: July 2024
View article titled, Introduction to reproducible laboratory hard x-ray photoelectron spectroscopy
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Journal Articles

Case study in machine learning for predicting moderate pressure plasma behavior

Shadhin Hussain, David J. Lary, Kentaro Hara, Kallol Bera, Shahid Rauf, Matthew Goeckner
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 42, 043001 (2024)
https://doi.org/10.1116/6.0003434
Published: May 2024
View article titled, Case study in machine learning for predicting moderate pressure plasma behavior
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Journal Articles

Impact of the DC intensity and electrode distance on pulsed-DC powder-pack boride layer growth kinetics

I. Campos-Silva, L. E. Castillo-Vela, I. Mejía-Caballero, J. L. Rosales-Lopez, M. Olivares-Luna, K. D. Chaparro-Pérez, F. P. Espino-Cortes, J. M. González-Carmona
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 063115 (2023)
https://doi.org/10.1116/6.0003167
Published: November 2023
View article titled, Impact of the DC intensity and electrode distance on pulsed-DC powder-pack boride layer growth kinetics
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Journal Articles

ToF-SIMS in battery research: Advantages, limitations, and best practices

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Teo Lombardo, Felix Walther, Christine Kern, Yannik Moryson, Timo Weintraut, Anja Henss, Marcus Rohnke
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 053207 (2023)
https://doi.org/10.1116/6.0002850
Published: August 2023
View article titled, ToF-SIMS in battery research: Advantages, limitations, and best practices
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Includes: Supplementary data
Journal Articles

Erratum: “Secondary ion mass spectrometry quantification: Do you remember when a factor of 2 was good enough?” [J. Vac. Sci. Technol. B 41, 030803 (2023)]

Charles W. Magee, Temel H. Buyuklimanli
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 043413 (2023)
https://doi.org/10.1116/6.0002844
Published: June 2023
View article titled, Erratum: “Secondary ion mass spectrometry quantification: Do you remember when a factor of 2 was good enough?” [J. Vac. Sci. Technol. B 41, 030803 (2023)]
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Journal Articles

Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature

George H. Major, B. Maxwell Clark, Kevin Cayabyab, Nathan Engel, Christopher D. Easton, Jan Čechal, Donald R. Baer, Jeff Terry, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 41, 043201 (2023)
https://doi.org/10.1116/6.0002714
Published: May 2023
View article titled, Insufficient reporting of x-ray photoelectron spectroscopy instrumental and peak fitting parameters (metadata) in the scientific literature
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Journal Articles

Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). I. Introduction to methods useful for large or complex datasets

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Tahereh G. Avval, Neal Gallagher, David Morgan, Pascal Bargiela, Neal Fairley, Vincent Fernandez, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 063206 (2022)
https://doi.org/10.1116/6.0002082
Published: November 2022
View article titled, Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). I. Introduction to methods useful for large or complex datasets
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Journal Articles

Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). II. Example applications of multiple methods to the degradation of cellulose and tartaric acid

Featured
Tahereh G. Avval, Hyrum Haack, Neal Gallagher, David Morgan, Pascal Bargiela, Neal Fairley, Vincent Fernandez, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 063205 (2022)
https://doi.org/10.1116/6.0001969
Published: November 2022
View article titled, Practical guide on chemometrics/informatics in x-ray photoelectron spectroscopy (XPS). II. Example applications of multiple methods to the degradation of cellulose and tartaric acid
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Includes: Supplementary data
Journal Articles

Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting

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George H. Major, Vincent Fernandez, Neal Fairley, Emily F. Smith, Matthew R. Linford
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 063201 (2022)
https://doi.org/10.1116/6.0001975
Published: September 2022
View article titled, Guide to XPS data analysis: Applying appropriate constraints to synthetic peaks in XPS peak fitting
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Journal Articles

X-ray absorption measurements at a bending magnet beamline with an Everhart–Thornley detector: A monolayer of Ho3N@C80 on graphene

Wei Chuang Lee, Ryunosuke Sagehashi, Yang Zhang, Alexey A. Popov, Matthias Muntwiler, Thomas Greber
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 053205 (2022)
https://doi.org/10.1116/6.0001961
Published: September 2022
View article titled, X-ray absorption measurements at a bending magnet beamline with an Everhart–Thornley detector: A monolayer of Ho<sub>3</sub>N@C<sub>80</sub> on graphene
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Journal Articles

Machine learning approach to thickness prediction from in situ spectroscopic ellipsometry data for atomic layer deposition processes

Ayush Arunachalam, S. Novia Berriel, Corbin Feit, Udit Kumar, Sudipta Seal, Kanad Basu, Parag Banerjee
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 40, 012405 (2022)
https://doi.org/10.1116/6.0001482
Published: December 2021
View article titled, Machine learning approach to thickness prediction from <em>in situ</em> spectroscopic ellipsometry data for atomic layer deposition processes
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Journal Articles

Numerical ellipsometry: A method for selecting a near-minimal infrared measurement set for β-gallium oxide

Frank K. Urban, III, David Barton, Mathias Schubert
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 052801 (2021)
https://doi.org/10.1116/6.0001002
Published: July 2021
View article titled, Numerical ellipsometry: A method for selecting a near-minimal infrared measurement set for β-gallium oxide
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Journal Articles

In situ compositional mapping of combinatorial materials libraries by scanning low-angle x-ray spectroscopy

Editor’s Pick
Jeonggoo Kim, Mikhail D. Strikovski, Steven L. Garrahan, Richard Mozelack, Jonathan E. Parkinson, Solomon H. Kolagani
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 033413 (2021)
https://doi.org/10.1116/6.0000862
Published: April 2021
View article titled, <em>In situ</em> compositional mapping of combinatorial materials libraries by scanning low-angle x-ray spectroscopy
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Journal Articles

Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum

Thomas R. Gengenbach, George H. Major, Matthew R. Linford, Christopher D. Easton
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 39, 013204 (2021)
https://doi.org/10.1116/6.0000682
Published: January 2021
View article titled, Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum
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Journal Articles

Introduction to x-ray photoelectron spectroscopy

Fred A. Stevie, Carrie L. Donley
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063204 (2020)
https://doi.org/10.1116/6.0000412
Published: September 2020
View article titled, Introduction to x-ray photoelectron spectroscopy
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Journal Articles

Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities

Mark H. Engelhard, Donald R. Baer, Alberto Herrera-Gomez, Peter M. A. Sherwood
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 063203 (2020)
https://doi.org/10.1116/6.0000359
Published: September 2020
View article titled, Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities
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Journal Articles

Modularity optimization for enhancing edge detection in microstructural features using 3D atomic chemical scale imaging

Arpan Mukherjee, Scott Broderick, Krishna Rajan
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 033207 (2020)
https://doi.org/10.1116/1.5143017
Published: March 2020
View article titled, Modularity optimization for enhancing edge detection in microstructural features using 3D atomic chemical scale imaging
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Journal Articles

Practical guides for x-ray photoelectron spectroscopy: Analysis of polymers

Christopher D. Easton, Calum Kinnear, Sally L. McArthur, Thomas R. Gengenbach
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 023207 (2020)
https://doi.org/10.1116/1.5140587
Published: February 2020
View article titled, Practical guides for x-ray photoelectron spectroscopy: Analysis of polymers
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Journal Articles

Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to β-gallium oxide

Frank K. Urban, III, David Barton, Mathias Schubert
Journal: Journal of Vacuum Science & Technology A
J. Vac. Sci. Technol. A 38, 023406 (2020)
https://doi.org/10.1116/1.5134790
Published: February 2020
View article titled, Numerical ellipsometry: Methods for selecting measurements and techniques for advanced analysis applied to β-gallium oxide
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