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Artificial Intelligence and Machine Learning for Materials Discovery, Synthesis and Characterization
The use of artificial intelligence, including machine learning, is rapidly rising in all areas of materials science, from materials discovery, synthesis, characterization, and performance. This special collection explores these areas and highlights successes and challenges.
Guest Editors: Parag Banerjee, University of Central Florida Jeffrey Elam, Argonne National Laboratory Tiffany Kaspar, Pacific Northwest National Laboratory Chris Moffitt, Kratos Analytical, Inc.
Editor: Amy Walker, University of Texas at Dallas
Epitaxial Growth of Materials
AI-guided frame prediction techniques to model single crystal diamond growth
Available to Purchase
Rohan Reddy Mekala; Arjun Srinivasan; Matthias Muehle; Elias Garratt; Adam Porter; Mikael Lindvall
Atomic Layer Deposition (ALD)
Benchmarking large language models for materials synthesis: The case of atomic layer deposition
Available to Purchase
Angel Yanguas-Gil; Matthew T. Dearing; Jeffrey W. Elam; Jessica C. Jones; Sungjoon Kim; Adnan Mohammad; Chi Thang Nguyen; Bratin Sengupta
Epitaxial Growth of Materials
Tiffany C. Kaspar; Sarah Akers; Henry W. Sprueill; Arman H. Ter-Petrosyan; Jenna A. Bilbrey; Derek Hopkins; Ajay Harilal; Jijo Christudasjustus; Patrick Gemperline; Ryan B. Comes
Thin Films
On simulating thin-film processes at the atomic scale using machine-learned force fields
Available to Purchase
S. Kondati Natarajan; J. Schneider; N. Pandey; J. Wellendorff; S. Smidstrup
Epitaxial Growth of Materials
Improvement of data analytics techniques in reflection high-energy electron diffraction to enable machine learning
Available to Purchase
Patrick T. Gemperline; Rajendra Paudel; Rama K. Vasudevan; Ryan B. Comes
Review Articles
Applications of machine learning in ion beam analysis of materials
Available to Purchase
Tiago Fiorini da Silva
Thin Films
Comparative study of film quality on c axis oriented AlN deposited by pulsed DC and RF reactive sputtering with optical emission spectroscopy big data analysis
Available to Purchase
Xue-Li Tseng; Hsuan-Fan Chen; Yu-Shin Chen; Shun-Chien Chiu; Hsiao-Han Lo; Yiin-Kuen Fuh; Tomi T. Li
Surfaces and Interfaces
Novel secondary ion mass spectrometry identification system for organic materials using random forest
Available to Purchase
Tetsuya Masuda; Miya Fujita; Tomikazu Ueno; Daisuke Hayashi; Satoka Aoyagi
Thin Films
Numerical ellipsometry: AI for real-time, in situ process control for absorbing films growing on unknown transparent substrates
Available to Purchase
F. K. Urban, III; D. Barton
Plasma Science and Technology
Machine learning-based prediction of the electron energy distribution function and electron density of argon plasma from the optical emission spectra
Available to Purchase
Fatima Jenina Arellano; Minoru Kusaba; Stephen Wu; Ryo Yoshida; Zoltán Donkó; Peter Hartmann; Tsanko V. Tsankov; Satoshi Hamaguchi