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Special Topic Collection: Reproducibility Challenges and Solutions

This Special Topic Collection features articles that address increasingly recognized challenges to reproducibility and replication of data that are impacting most areas of modern science. Because of the importance and growing rate of use, many of the papers provide information related to surface analysis using X-ray Photoelectron Spectroscopy (XPS). The purpose of the "Reproducibility Challenges and Solutions with a Focus on XPS" collection is to describe causes of non-reproducible data and analyses, to help analysts, researchers, and reviewers recognize problematic and erroneous data, and to provide guides and related information regarding best practices with the aim of assisting analysts in conducting and reporting reliable and useful information.

Guest Editors: Don Baer and Gary McGuire

Guest Associate Editors: Mark Engelhard, Alex Shard, Kateryna Artyushkova, Chris Easton

Benjamen P. Reed; David J. H. Cant; Steve J. Spencer; Abraham Jorge Carmona-Carmona; Adam Bushell; Alberto Herrera-Gómez; Akira Kurokawa; Andreas Thissen; Andrew G. Thomas; Andrew J. Britton; Andrzej Bernasik; Anne Fuchs; Arthur P. Baddorf; Bernd Bock; Bill Theilacker; Bin Cheng; David G. Castner; David J. Morgan; David Valley; Elizabeth A. Willneff; Emily F. Smith; Emmanuel Nolot; Fangyan Xie; Gilad Zorn; Graham C. Smith; Hideyuki Yasufuku; Jeffery L. Fenton; Jian Chen; Jonathan D. P. Counsell; Jörg Radnik; Karen J. Gaskell; Kateryna Artyushkova; Li Yang; Lulu Zhang; Makiho Eguchi; Marc Walker; Mariusz Hajdyła; Mateusz M. Marzec; Matthew R. Linford; Naoyoshi Kubota; Orlando Cortazar-Martínez; Paul Dietrich; Riki Satoh; Sven L. M. Schroeder; Tahereh G. Avval; Takaharu Nagatomi; Vincent Fernandez; Wayne Lake; Yasushi Azuma; Yusuke Yoshikawa; Alexander G. Shard