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Atomic Layer Etching (ALE)

Each year, in concert with the annual AVS International Atomic Layer Etching (ALE) Workshop, the Journal of Vacuum Science and Technology A publishes a collection of articles covering the most recent developments and experimental studies in ALE. The collection includes papers presented at the ALE 2022 workshop held on June 26-29, 2022 in Ghent, Belgium, as well as other ALE research articles that were not presented at the conference but were submitted to the collection. The collection features articles dedicated to the science and technology of atomic layer controlled etching.

Image Credit: Nobuya Miyoshi, Nicholas McDowell, and Hiroyuki Kobayashi, JVST A 40, 032601 (2022).

Special Collection Image
Antoine Pacco; Teppei Nakano; Shota Iwahata; Akihisa Iwasaki; Efrain Altamirano Sanchez
Daniel C. Messina; Kevin A. Hatch; Saurabh Vishwakarma; David J. Smith; Yuji Zhao; Robert J. Nemanich
Matthew Eliceiri; Yoonsoo Rho; Runxuan Li; Costas P. Grigoropoulos
Jonas C. Gertsch; Jonathan L. Partridge; Austin M. Cano; Joel W. Clancey; Victor M. Bright; Steven M. George
Chien-Wei Chen; Wen-Hao Cho; Chan-Yuen Chang; Chien-Ying Su; Nien-Nan Chu; Chi-Chung Kei; Bor-Ran Li
Airah P. Osonio; Takayoshi Tsutsumi; Yoshinari Oda; Bablu Mukherjee; Ranjit Borude; Nobuyoshi Kobayashi; Masaru Hori
J.-F. de Marneffe; D. Marinov; A. Goodyear; P.-J. Wyndaele; N. St. J. Braithwaite; S. Kundu; I. Asselberghs; M. Cooke; S. De Gendt
Kevin G. Crawford; James Grant; Dilini Tania Hemakumara; Xu Li; Iain Thayne; David A. J. Moran
Jihyun Kim; Dahee Shim; Yongjae Kim; Heeyeop Chae
Nobuya Miyoshi; Nicholas McDowell; Hiroyuki Kobayashi
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