1-2 of 2
X-ray interferometry
Close
Save search
Follow your search
Access your saved searches in your account
Close Modal
Sort by
Journal Articles

The Correlation of the NA Measurements by Counting 28Si Atoms

G. Mana, E. Massa, C. P. Sasso, M. Stock, K. Fujii, N. Kuramoto, S. Mizushima, T. Narukawa, M. Borys, I. Busch, A. Nicolaus, A. Pramann
Journal: Journal of Physical and Chemical Reference Data
J. Phys. Chem. Ref. Data 44, 031209 (2015)
https://doi.org/10.1063/1.4921240
Published: July 2015
View article titled, The Correlation of the <em>N</em><sub>A</sub> Measurements by Counting <sup>28</sup>Si Atoms
Open the PDF for The Correlation of the <em>N</em><sub>A</sub> Measurements by Counting <sup>28</sup>Si Atoms in another window
Journal Articles

A More Accurate Measurement of the 28Si Lattice Parameter

E. Massa, C. P. Sasso, G. Mana, C. Palmisano
Journal: Journal of Physical and Chemical Reference Data
J. Phys. Chem. Ref. Data 44, 031208 (2015)
https://doi.org/10.1063/1.4917488
Published: June 2015
View article titled, A More Accurate Measurement of the <sup>28</sup>Si Lattice Parameter
Open the PDF for A More Accurate Measurement of the <sup>28</sup>Si Lattice Parameter in another window