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Journal Articles

Electron scattering at interfaces in Ru(0001)/Co(0001) multilayers

Poyen Shen, Christian Lavoie, Daniel Gall

J. Appl. Phys. 137, 025303 (2025)

https://doi.org/10.1063/5.0241912

Published: January 2025

View article titled, Electron scattering at interfaces in Ru(0001)/Co(0001) multilayers

Journal Articles

Dopant site analysis of heavily Si-doped GaAs using a combination of electron microscopy and synchrotron radiation

Genki Saito, Akimitsu Ishizuka, Masahiro Ohtsuka, Shuma Ito, Toshihiro Okajima, Shunsuke Muto

J. Appl. Phys. 137, 025703 (2025)

https://doi.org/10.1063/5.0238327

Published: January 2025

View article titled, Dopant site analysis of heavily Si-doped GaAs using a combination of electron microscopy and synchrotron radiation

Journal Articles

Unveiling the origin of multiple peak emission in derivative perovskite single crystals, CH₃NH₃Pb(Br_1−xCl_x)₃ (x = 0–1)

Shankar Dutt, Rajashri Urkude, S. D. Singh, Archna Sagdeo

J. Appl. Phys. 136, 195501 (2024)

https://doi.org/10.1063/5.0228420

Published: November 2024

View article titled, Unveiling the origin of multiple peak emission in derivative perovskite single crystals, CH3NH3Pb(Br1−xClx)3 (x = 0–1)

Journal Articles

Temporary change in NEXAFS spectra of amorphous carbon nitride films with photoinduced deformation by visible light irradiation

Masami Aono, Keiji Komatsu, Kyoji Morita, Tasuku Inoue, Kazuhiro Kanda

J. Appl. Phys. 136, 045301 (2024)

https://doi.org/10.1063/5.0208028

Published: July 2024

View article titled, Temporary change in NEXAFS spectra of amorphous carbon nitride films with photoinduced deformation by visible light irradiation

Journal Articles

Synchrotron-based x-ray diffraction analysis of energetic ion-induced strain in GaAs and 4H-SiC

Anusmita Chakravorty, Alexandre Boulle, Aurélien Debelle, Gouranga Manna, Pinku Saha, D. Kanjilal, Debdulal Kabiraj

J. Appl. Phys. 136, 035902 (2024)

https://doi.org/10.1063/5.0205284

Published: July 2024

View article titled, Synchrotron-based x-ray diffraction analysis of energetic ion-induced strain in GaAs and 4H-SiC

Journal Articles

Structural and interface band alignment properties of transparent p-type α-GaCrO₃:Ni/α-Al₂O₃ heterojunction

Rishav Sharma, Kiran Baraik, Himanshu Srivastava, Satish Kumar Mandal, Tapas Ganguli, Ravindra Jangir

J. Appl. Phys. 136, 025304 (2024)

https://doi.org/10.1063/5.0205892

Published: July 2024

View article titled, Structural and interface band alignment properties of transparent p-type α-GaCrO3:Ni/α-Al2O3 heterojunction

Journal Articles

A single crystal diffuse scattering study of structural relaxations arising from dopants in the semiconductor Cd_0.9Zn_0.1Te

M. J. Gutmann, O. Kopach, V. Kopach, V. Mykhailovych, G. L. Pascut, P. Fochuk

J. Appl. Phys. 135, 215701 (2024)

https://doi.org/10.1063/5.0211429

Published: June 2024

View article titled, A single crystal diffuse scattering study of structural relaxations arising from dopants in the semiconductor Cd0.9Zn0.1Te

Journal Articles

Effect of oxygen-ion implantation on the local electronic structures of strontium-titanate single crystals: An investigation using synchrotron-based x-ray diffraction and x-ray photoemission techniques

A. Kumar, M. Baral, A. Kandasami, S. K. Mandal, R. Urkude, S. Bhunia, V. R. Singh

J. Appl. Phys. 135, 155302 (2024)

https://doi.org/10.1063/5.0202962

Published: April 2024

View article titled, Effect of oxygen-ion implantation on the local electronic structures of strontium-titanate single crystals: An investigation using synchrotron-based x-ray diffraction and x-ray photoemission techniques

Journal Articles

Quantitative x ray phase contrast imaging of oblique shock wave–interface interactions

Andrew F. T. Leong, Christopher M. Romick, Cynthia A. Bolme, Tariq D. Aslam, Nicholas W. Sinclair, Pawel M. Kozlowski, David S. Montgomery, Kyle J. Ramos

J. Appl. Phys. 134, 205901 (2023)

https://doi.org/10.1063/5.0174086

Published: November 2023

View article titled, Quantitative x ray phase contrast imaging of oblique shock wave–interface interactions

Includes: Supplementary data

NARROW

Topics

Electron scattering at interfaces in Ru(0001)/Co(0001) multilayers

Dopant site analysis of heavily Si-doped GaAs using a combination of electron microscopy and synchrotron radiation

Unveiling the origin of multiple peak emission in derivative perovskite single crystals, CH₃NH₃Pb(Br_1−xCl_x)₃ (x = 0–1)

Temporary change in NEXAFS spectra of amorphous carbon nitride films with photoinduced deformation by visible light irradiation

Synchrotron-based x-ray diffraction analysis of energetic ion-induced strain in GaAs and 4H-SiC

Structural and interface band alignment properties of transparent p-type α-GaCrO₃:Ni/α-Al₂O₃ heterojunction

A single crystal diffuse scattering study of structural relaxations arising from dopants in the semiconductor Cd_0.9Zn_0.1Te

Effect of oxygen-ion implantation on the local electronic structures of strontium-titanate single crystals: An investigation using synchrotron-based x-ray diffraction and x-ray photoemission techniques

Quantitative x ray phase contrast imaging of oblique shock wave–interface interactions