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Journal Articles

Angle insensitive filters based on Fabry–Pérot resonance structures

Open Access
Shuhua Cao, Nan Chen, Yanjun Jiang
Journal: Journal of Applied Physics
J. Appl. Phys. 136, 193102 (2024)
https://doi.org/10.1063/5.0224213
Published: November 2024
View articletitled, Angle insensitive filters based on Fabry–Pérot resonance structures
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Journal Articles

Full-Stokes polarization detection enabled by a terahertz all-dielectric metasurface

Open Access
Huaping Zang, Ziyue Yang, Xinyi Zhou, Jingyu Liu, Hui Li, Qiuchi Yu, Chenglong Zheng, Yan Zhang, Jianquan Yao
Journal: Journal of Applied Physics
J. Appl. Phys. 135, 183103 (2024)
https://doi.org/10.1063/5.0208045
Published: May 2024
View articletitled, Full-Stokes polarization detection enabled by a terahertz all-dielectric metasurface
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Journal Articles

Light-trapping structures fabricated in situ for ultrathin III-V solar cells

Editor’s PickOpen Access
Allison N. Perna, Kevin L. Schulte, John Simon, Anna K. Braun, David R. Diercks, Corinne E. Packard, Aaron J. Ptak
Journal: Journal of Applied Physics
J. Appl. Phys. 134, 135307 (2023)
https://doi.org/10.1063/5.0160559
Published: October 2023
View articletitled, Light-trapping structures fabricated in situ for ultrathin III-V solar cells
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Journal Articles

Laser light absorption and Brewster angle on liquid metal

Open Access
Joerg Volpp
Journal: Journal of Applied Physics
J. Appl. Phys. 133, 205902 (2023)
https://doi.org/10.1063/5.0146728
Published: May 2023
View articletitled, Laser light absorption and Brewster angle on liquid metal
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Journal Articles

Analytical model for extracting optical properties from absorptance of femtosecond-laser structured hyperdoped silicon

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Sören Schäfer, Patrick McKearney, Simon Paulus, Stefan Kontermann
Journal: Journal of Applied Physics
J. Appl. Phys. 131, 243102 (2022)
https://doi.org/10.1063/5.0094177
Published: June 2022
View articletitled, Analytical model for extracting optical properties from absorptance of femtosecond-laser structured hyperdoped silicon
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Includes: Supplementary data
Journal Articles

Imaging ellipsometry for structured and plasmonic materials

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Kurt Hingerl
Journal: Journal of Applied Physics
J. Appl. Phys. 129, 113101 (2021)
https://doi.org/10.1063/5.0039150
Published: March 2021
View articletitled, Imaging ellipsometry for structured and plasmonic materials
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Journal Articles

High-pressure melt curve of shock-compressed tin measured using pyrometry and reflectance techniques

Open Access
B. M. La Lone, P. D. Asimow, O. V. Fat’yanov, R. S. Hixson, G. D. Stevens, W. D. Turley, L. R. Veeser
Journal: Journal of Applied Physics
J. Appl. Phys. 126, 225103 (2019)
https://doi.org/10.1063/1.5132318
Published: December 2019
View articletitled, High-pressure melt curve of shock-compressed tin measured using pyrometry and reflectance techniques
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Journal Articles

A method for fast and robustly measuring the state of polarization of arbitrary light beams based on Pancharatnam-Berry phase

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Shuxia Qi, Sheng Liu, Peng Li, Lei Han, Jinzhan Zhong, Bingyan Wei, Huachao Cheng, Xuyue Guo, Jianlin Zhao
Journal: Journal of Applied Physics
J. Appl. Phys. 126, 133105 (2019)
https://doi.org/10.1063/1.5120123
Published: October 2019
View articletitled, A method for fast and robustly measuring the state of polarization of arbitrary light beams based on Pancharatnam-Berry phase
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Journal Articles

Subpicotesla scalar atomic magnetometer with a microfabricated cell

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Rui Zhang, Terry Dyer, Nathan Brockie, Roozbeh Parsa, Rahul Mhaskar
Journal: Journal of Applied Physics
J. Appl. Phys. 126, 124503 (2019)
https://doi.org/10.1063/1.5113520
Published: September 2019
View articletitled, Subpicotesla scalar atomic magnetometer with a microfabricated cell
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Journal Articles

Crystallographic orientation of orthorhombic aragonite using reflection generalized ellipsometry

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G. E. Jellison, Jr., D. N. Leonard, L. M. Anovitz, M. C. Cheshire, E. D. Specht, T. M. Rosseel
Journal: Journal of Applied Physics
J. Appl. Phys. 126, 043102 (2019)
https://doi.org/10.1063/1.5109093
Published: July 2019
View articletitled, Crystallographic orientation of orthorhombic aragonite using reflection generalized ellipsometry
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Journal Articles

Multilevel reflectance switching of ultrathin phase-change films

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P. A. Vermeulen, D. T. Yimam, M. A. Loi, B. J. Kooi
Journal: Journal of Applied Physics
J. Appl. Phys. 125, 193105 (2019)
https://doi.org/10.1063/1.5085715
Published: May 2019
View articletitled, Multilevel reflectance switching of ultrathin phase-change films
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Includes: Supplementary data
Journal Articles

Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system

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L. N. Dinh, J. A. Stanford, C. K. Saw, A. J. Nelson, R. Gollott, J. M. Haschke, P. G. Allen, C. Gardner, C. Hrousis, W. J. Siekhaus, W. McLean, II
Journal: Journal of Applied Physics
J. Appl. Phys. 125, 183102 (2019)
https://doi.org/10.1063/1.5092129
Published: May 2019
View articletitled, Spectroscopic ellipsometry extraction of optical constants for materials from oxide covered samples: Application to the plutonium/oxides system
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Journal Articles

Thickness dependence of the physical properties of atomic-layer deposited Al2O3

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Yael Etinger-Geller, Ekaterina Zoubenko, Maria Baskin, Lior Kornblum, Boaz Pokroy
Journal: Journal of Applied Physics
J. Appl. Phys. 125, 185302 (2019)
https://doi.org/10.1063/1.5079987
Published: May 2019
View articletitled, Thickness dependence of the physical properties of atomic-layer deposited Al2O3
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Journal Articles

Robust measurement of flexoelectro-optic switching with different surface alignments

Open Access
John J. Sandford O’Neill, Julian A. J. Fells, Chris Welch, Georg Mehl, Wing C. Yip, Timothy D. Wilkinson, Martin J. Booth, Steve J. Elston, Stephen M. Morris
Journal: Journal of Applied Physics
J. Appl. Phys. 125, 093104 (2019)
https://doi.org/10.1063/1.5086241
Published: March 2019
View articletitled, Robust measurement of flexoelectro-optic switching with different surface alignments
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Journal Articles

Enhanced material defect imaging with a radio-frequency atomic magnetometer

Editor’s PickAvailable to Purchase
P. Bevington, R. Gartman, W. Chalupczak
Journal: Journal of Applied Physics
J. Appl. Phys. 125, 094503 (2019)
https://doi.org/10.1063/1.5083039
Published: March 2019
View articletitled, Enhanced material defect imaging with a radio-frequency atomic magnetometer
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Journal Articles

Resolving power beyond the diffraction limit demonstrated with composed pupils at microwave and THz frequencies

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I. Cacciari, D. Mugnai, A. Ranfagni
Journal: Journal of Applied Physics
J. Appl. Phys. 125, 044901 (2019)
https://doi.org/10.1063/1.5067353
Published: January 2019
View articletitled, Resolving power beyond the diffraction limit demonstrated with composed pupils at microwave and THz frequencies
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Journal Articles

Crystallographic orientation of uniaxial calcite and dolomite determined using reflection generalized ellipsometry

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G. E. Jellison, Jr., D. N. Leonard, L. M. Anovitz, C. M. Parish, E. D. Specht, T. M. Rosseel
Journal: Journal of Applied Physics
J. Appl. Phys. 124, 223102 (2018)
https://doi.org/10.1063/1.5048724
Published: December 2018
View articletitled, Crystallographic orientation of uniaxial calcite and dolomite determined using reflection generalized ellipsometry
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Journal Articles

Dynamic reflectance changes in high-purity zirconium when it is shocked from the α to ω phase

Open Access
G. D. Stevens, R. J. Scharff, J. M. Lang, B. M. La Lone, W. D. Turley, L. R. Veeser
Journal: Journal of Applied Physics
J. Appl. Phys. 124, 185105 (2018)
https://doi.org/10.1063/1.5054893
Published: November 2018
View articletitled, Dynamic reflectance changes in high-purity zirconium when it is shocked from the α to ω phase
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Journal Articles

Reflectance determination of optical spectral emissivity of metal surfaces at ambient conditions

Free
T. M. Hartsfield, A. J. Iverson, J. K. Baldwin
Journal: Journal of Applied Physics
J. Appl. Phys. 124, 105107 (2018)
https://doi.org/10.1063/1.5042601
Published: September 2018
View articletitled, Reflectance determination of optical spectral emissivity of metal surfaces at ambient conditions
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Journal Articles

High quantum yield of the Egyptian blue family of infrared phosphors (MCuSi4O10, M = Ca, Sr, Ba)

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Paul Berdahl, Simon K. Boocock, George C.-Y. Chan, Sharon S. Chen, Ronnen M. Levinson, Michael A. Zalich
Journal: Journal of Applied Physics
J. Appl. Phys. 123, 193103 (2018)
https://doi.org/10.1063/1.5019808
Published: May 2018
View articletitled, High quantum yield of the Egyptian blue family of infrared phosphors (MCuSi4O10, M = Ca, Sr, Ba)
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