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Journal Articles
Journal Articles
Matthew P. West, Georges Pavlidis, Robert H. Montgomery, Fabia Farlin Athena, Muhammad S. Jamil, Andrea Centrone, Samuel Graham, Eric M. Vogel
Journal:
Journal of Applied Physics
J. Appl. Phys. 133, 185101 (2023)
Published: May 2023
Includes: Supplementary data
Journal Articles
The effect of the contact point asymmetry on the accuracy of thin films thermal conductivity measurement by scanning thermal microscopy using Wollaston probes
Available to Purchase
Journal:
Journal of Applied Physics
J. Appl. Phys. 131, 094902 (2022)
Published: March 2022
Journal Articles
Nanoscale thermal conductivity of Kapton-derived carbonaceous materials
Available to Purchase
Journal:
Journal of Applied Physics
J. Appl. Phys. 131, 065102 (2022)
Published: February 2022
Includes: Supplementary data
Journal Articles
Force microscopy cantilevers locally heated in a fluid: Temperature fields and effects on the dynamics
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Journal:
Journal of Applied Physics
J. Appl. Phys. 130, 124502 (2021)
Published: September 2021
Journal Articles
Journal:
Journal of Applied Physics
J. Appl. Phys. 129, 164502 (2021)
Published: April 2021
Includes: Supplementary data
Journal Articles
Frequency domain analysis of 3ω-scanning thermal microscope probe—Application to tip/surface thermal interface measurements in vacuum environment
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Journal:
Journal of Applied Physics
J. Appl. Phys. 129, 055105 (2021)
Published: February 2021
Includes: Supplementary data
Journal Articles
Scanning thermal microscopy on samples of varying effective thermal conductivities and identical flat surfaces
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Journal:
Journal of Applied Physics
J. Appl. Phys. 128, 235301 (2020)
Published: December 2020
Journal Articles
Thermal conductivity of irradiated porous silicon down to the oxide limit investigated by Raman thermometry and scanning thermal microscopy
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Journal:
Journal of Applied Physics
J. Appl. Phys. 128, 175109 (2020)
Published: November 2020
Journal Articles
Journal Articles
Improving accuracy of nanothermal measurements via spatially distributed scanning thermal microscope probes
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Journal:
Journal of Applied Physics
J. Appl. Phys. 124, 015101 (2018)
Published: July 2018
Includes: Supplementary data
Journal Articles
Influence of probe-sample temperature difference on thermal mapping contrast in scanning thermal microscopy imaging
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Journal:
Journal of Applied Physics
J. Appl. Phys. 121, 114502 (2017)
Published: March 2017
Journal Articles
Thermal properties measurements of a silica/pyrocarbon composite at the microscale
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Journal:
Journal of Applied Physics
J. Appl. Phys. 120, 245101 (2016)
Published: December 2016
Journal Articles
Journal Articles
Improvement of reliability and power consumption for SnSb4 phase change film composited with Ga3Sb7 by superlattice-like method
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Journal:
Journal of Applied Physics
J. Appl. Phys. 117, 175704 (2015)
Published: May 2015
Journal Articles
Journal:
Journal of Applied Physics
J. Appl. Phys. 116, 134904 (2014)
Published: October 2014
Includes: Supplementary data
Journal Articles
Structural, electrical, and thermoelectric properties of bismuth telluride: Silicon/carbon nanocomposites thin films
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Journal:
Journal of Applied Physics
J. Appl. Phys. 116, 083518 (2014)
Published: August 2014
Journal Articles
Reduced thermal quadrupole heat transport modeling in harmonic and transient regime scanning thermal microscopy using nanofabricated thermal probes
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Journal:
Journal of Applied Physics
J. Appl. Phys. 116, 054501 (2014)
Published: August 2014
Journal Articles
Thermal conductivity profile determination in proton-irradiated ZrC by spatial and frequency scanning thermal wave methods
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Journal:
Journal of Applied Physics
J. Appl. Phys. 114, 133509 (2013)
Published: October 2013
Journal Articles
Amorphization and reduction of thermal conductivity in porous silicon by irradiation with swift heavy ions
Available to PurchasePascal J. Newby, Bruno Canut, Jean-Marie Bluet, Séverine Gomès, Mykola Isaiev, Roman Burbelo, Konstantinos Termentzidis, Patrice Chantrenne, Luc G. Fréchette, Vladimir Lysenko
Journal:
Journal of Applied Physics
J. Appl. Phys. 114, 014903 (2013)
Published: July 2013
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