Page 1 | Search Results | Journal of Applied Physics

1-20 of 59

Sort by

Sort Order Select

Journal Articles

Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface

Takahiro Nagata, Asahiko Matsuda, Takashi Teramoto, Dominic Gerlach, Peng Shen, Shigenori Ueda, Takako Kimura, Christian Dussarrat, Toyohiro Chikyow

J. Appl. Phys. 137, 095304 (2025)

https://doi.org/10.1063/5.0224068

Published: March 2025

View article titled, Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface

Journal Articles

Evolution of the Ni_0.9Pt_0.1/Si system under annealing via nano-crystalline textured phases

S. Guillemin, P. Gergaud, N. Bernier, M. Merlin, C. Delwail, S. Minoret, R. Famulok, M. Gregoire, F. Nemouchi, Ph. Rodriguez

J. Appl. Phys. 134, 035305 (2023)

https://doi.org/10.1063/5.0139249

Published: July 2023

View article titled, Evolution of the Ni0.9Pt0.1/Si system under annealing via nano-crystalline textured phases

Journal Articles

Comparison of contact metals evaporated onto monolayer molybdenum disulfide

A. Mazzoni, R. Burke, M. Chin, S. Najmaei, M. Dubey, N. Goldsman, K. Daniels

J. Appl. Phys. 132, 224305 (2022)

https://doi.org/10.1063/5.0124105

Published: December 2022

View article titled, Comparison of contact metals evaporated onto monolayer molybdenum disulfide

Includes: Supplementary data

Journal Articles

A review of thermoreflectance techniques for characterizing wide bandgap semiconductors’ thermal properties and devices’ temperatures

Chao Yuan, Riley Hanus, Samuel Graham

J. Appl. Phys. 132, 220701 (2022)

https://doi.org/10.1063/5.0122200

Published: December 2022

View article titled, A review of thermoreflectance techniques for characterizing wide bandgap semiconductors’ thermal properties and devices’ temperatures

Journal Articles

Multiphysics simulation of microscale copper printing by confined electrodeposition using a nozzle array

Scott Burlison, Majid Minary-Jolandan

J. Appl. Phys. 131, 055303 (2022)

https://doi.org/10.1063/5.0072183

Published: February 2022

View article titled, Multiphysics simulation of microscale copper printing by confined electrodeposition using a nozzle array

Includes: Supplementary data

Journal Articles

Focused ion beam fabrication of Janus bimetallic cylinders acting as drift tube Zernike phase plates for electron microscopy

Paolo Rosi, Gian Carlo Gazzadi, Stefano Frabboni, Vincenzo Grillo, Amir H. Tavabi, Rafal E. Dunin-Borkowski, Giulio Pozzi

J. Appl. Phys. 130, 024507 (2021)

https://doi.org/10.1063/5.0050055

Published: July 2021

View article titled, Focused ion beam fabrication of Janus bimetallic cylinders acting as drift tube Zernike phase plates for electron microscopy

Journal Articles

An effect of electrode material on pinning layer characteristics and depolarization field in polymer ferroelectrics

V. V. Kochervinskii, E. V. Chubunova, S. A. Bedin

J. Appl. Phys. 124, 064102 (2018)

https://doi.org/10.1063/1.5028563

Published: August 2018

View article titled, An effect of electrode material on pinning layer characteristics and depolarization field in polymer ferroelectrics

Journal Articles

Nanoscale metal-InGaAs contacts with ultra-low specific contact resistivity: Improved interfacial quality and extraction methodology

Saeid Masudy-Panah, Ying Wu, Dian Lei, Annie Kumar, Yee-Chia Yeo, Xiao Gong

J. Appl. Phys. 123, 024508 (2018)

https://doi.org/10.1063/1.4997686

Published: January 2018

View article titled, Nanoscale metal-InGaAs contacts with ultra-low specific contact resistivity: Improved interfacial quality and extraction methodology

Journal Articles

Effect of Cl₂ plasma treatment and annealing on vanadium based metal contacts to Si-doped Al_0.75Ga_0.25N

Mickael Lapeyrade, Sabine Alamé, Johannes Glaab, Anna Mogilatenko, Ralph-Stephan Unger, Christian Kuhn, Tim Wernicke, Patrick Vogt, Arne Knauer, Ute Zeimer, Sven Einfeldt, Markus Weyers, Michael Kneissl

J. Appl. Phys. 122, 125701 (2017)

https://doi.org/10.1063/1.4993447

Published: September 2017

View article titled, Effect of Cl2 plasma treatment and annealing on vanadium based metal contacts to Si-doped Al0.75Ga0.25N

Journal Articles

Modeling micro-porous surfaces for secondary electron emission control to suppress multipactor

J. M. Sattler, R. A. Coutu, Jr., R. Lake, T. Laurvick, T. Back, S. Fairchild

J. Appl. Phys. 122, 055304 (2017)

https://doi.org/10.1063/1.4997465

Published: August 2017

View article titled, Modeling micro-porous surfaces for secondary electron emission control to suppress multipactor

Journal Articles

Phase formation sequence in the Ti/InP system during thin film solid-state reactions

E. Ghegin, Ph. Rodriguez, J. L. Lábár, M. Menyhárd, S. Favier, I. Sagnes, F. Nemouchi

J. Appl. Phys. 121, 245311 (2017)

https://doi.org/10.1063/1.4990427

Published: June 2017

View article titled, Phase formation sequence in the Ti/InP system during thin film solid-state reactions

Journal Articles

DC voltage fields generated by RF plasmas and their influence on film growth morphology through static attraction to metal wetting layers: Beyond ion bombardment effects

K. S. A. Butcher, P. T. Terziyska, R. Gergova, V. Georgiev, D. Georgieva, P. W. Binsted, S. Skerget

J. Appl. Phys. 121, 013301 (2017)

https://doi.org/10.1063/1.4973483

Published: January 2017

View article titled, DC voltage fields generated by RF plasmas and their influence on film growth morphology through static attraction to metal wetting layers: Beyond ion bombardment effects

Journal Articles

Fermi level pinning in metal/Al₂O₃/InGaAs gate stack after post metallization annealing

R. Winter, I. Krylov, C. Cytermann, K. Tang, J. Ahn, P. C. McIntyre, M. Eizenberg

J. Appl. Phys. 118, 055302 (2015)

https://doi.org/10.1063/1.4928158

Published: August 2015

View article titled, Fermi level pinning in metal/Al2O3/InGaAs gate stack after post metallization annealing

Journal Articles

Time dependent changes in Schottky barrier mapping of the W/Si(001) interface utilizing ballistic electron emission microscopy

Chris A. Durcan, Robert Balsano, Vincent P. LaBella

J. Appl. Phys. 117, 245306 (2015)

https://doi.org/10.1063/1.4922972

Published: June 2015

View article titled, Time dependent changes in Schottky barrier mapping of the W/Si(001) interface utilizing ballistic electron emission microscopy

Journal Articles

Kelvin probe characterization of buried graphitic microchannels in single-crystal diamond

E. Bernardi, A. Battiato, P. Olivero, F. Picollo, E. Vittone

J. Appl. Phys. 117, 024103 (2015)

https://doi.org/10.1063/1.4905425

Published: January 2015

View article titled, Kelvin probe characterization of buried graphitic microchannels in single-crystal diamond

Journal Articles

Sulfuric acid and hydrogen peroxide surface passivation effects on AlGaN/GaN high electron mobility transistors

Z. H. Zaidi, K. B. Lee, I. Guiney, H. Qian, S. Jiang, D. J. Wallis, C. J. Humphreys, P. A. Houston

J. Appl. Phys. 116, 244501 (2014)

https://doi.org/10.1063/1.4904923

Published: December 2014

View article titled, Sulfuric acid and hydrogen peroxide surface passivation effects on AlGaN/GaN high electron mobility transistors

Journal Articles

Direct observation of both contact and remote oxygen scavenging of GeO₂ in a metal-oxide-semiconductor stack

S. Fadida, P. Shekhter, D. Cvetko, L. Floreano, A. Verdini, L. Nyns, S. Van Elshocht, I. Kymissis, M. Eizenberg

J. Appl. Phys. 116, 164101 (2014)

https://doi.org/10.1063/1.4898645

Published: October 2014

View article titled, Direct observation of both contact and remote oxygen scavenging of GeO2 in a metal-oxide-semiconductor stack

Journal Articles

A combined capacitance-voltage and hard x-ray photoelectron spectroscopy characterisation of metal/Al₂O₃/In_0.53Ga_0.47As capacitor structures

Jun Lin, Lee Walsh, Greg Hughes, Joseph C. Woicik, Ian M. Povey, Terrance P. O'Regan, Paul K. Hurley

J. Appl. Phys. 116, 024104 (2014)

https://doi.org/10.1063/1.4887517

Published: July 2014

View article titled, A combined capacitance-voltage and hard x-ray photoelectron spectroscopy characterisation of metal/Al2O3/In0.53Ga0.47As capacitor structures

Journal Articles

The Ir-n-GaAs Schottky barrier contacts made by electrochemical deposition

V. G. Bozhkov, A. V. Shmargunov, T. P. Bekezina, N. A. Torkhov, V. A. Novikov

J. Appl. Phys. 115, 224505 (2014)

https://doi.org/10.1063/1.4867778

Published: June 2014

View article titled, The Ir-n-GaAs Schottky barrier contacts made by electrochemical deposition

Journal Articles

Morphology and properties of a hybrid organic-inorganic system: Al nanoparticles embedded into CuPc thin film

O. V. Molodtsova, I. M. Aristova, S. V. Babenkov, O. V. Vilkov, V. Yu. Aristov

J. Appl. Phys. 115, 164310 (2014)

https://doi.org/10.1063/1.4874161

Published: April 2014

View article titled, Morphology and properties of a hybrid organic-inorganic system: Al nanoparticles embedded into CuPc thin film

NARROW

Topics

Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface

Evolution of the Ni_0.9Pt_0.1/Si system under annealing via nano-crystalline textured phases

Comparison of contact metals evaporated onto monolayer molybdenum disulfide

A review of thermoreflectance techniques for characterizing wide bandgap semiconductors’ thermal properties and devices’ temperatures

Multiphysics simulation of microscale copper printing by confined electrodeposition using a nozzle array

Focused ion beam fabrication of Janus bimetallic cylinders acting as drift tube Zernike phase plates for electron microscopy

An effect of electrode material on pinning layer characteristics and depolarization field in polymer ferroelectrics

Nanoscale metal-InGaAs contacts with ultra-low specific contact resistivity: Improved interfacial quality and extraction methodology

Effect of Cl₂ plasma treatment and annealing on vanadium based metal contacts to Si-doped Al_0.75Ga_0.25N

Modeling micro-porous surfaces for secondary electron emission control to suppress multipactor

Phase formation sequence in the Ti/InP system during thin film solid-state reactions

DC voltage fields generated by RF plasmas and their influence on film growth morphology through static attraction to metal wetting layers: Beyond ion bombardment effects

Fermi level pinning in metal/Al₂O₃/InGaAs gate stack after post metallization annealing

Time dependent changes in Schottky barrier mapping of the W/Si(001) interface utilizing ballistic electron emission microscopy

Kelvin probe characterization of buried graphitic microchannels in single-crystal diamond

Sulfuric acid and hydrogen peroxide surface passivation effects on AlGaN/GaN high electron mobility transistors

Direct observation of both contact and remote oxygen scavenging of GeO₂ in a metal-oxide-semiconductor stack

A combined capacitance-voltage and hard x-ray photoelectron spectroscopy characterisation of metal/Al₂O₃/In_0.53Ga_0.47As capacitor structures

The Ir-n-GaAs Schottky barrier contacts made by electrochemical deposition

Morphology and properties of a hybrid organic-inorganic system: Al nanoparticles embedded into CuPc thin film

Resources

Explore

pubs.aip.org

Connect with AIP Publishing

Resources

Explore

pubs.aip.org

Connect with AIP Publishing

This Feature Is Available To Subscribers Only