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Journal Articles

Electronic growth of Pd(111) nanostructures on MoS2

Timothy E. Kidd, Skylar Scott, Sophie Roberts, Ryan Carlile, Pavel V. Lukashev, Andrew J. Stollenwerk
Journal: Journal of Applied Physics
J. Appl. Phys. 129, 174303 (2021)
https://doi.org/10.1063/5.0044944
Published: May 2021
View articletitled, Electronic growth of Pd(111) nanostructures on MoS2
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Journal Articles

High level active n+ doping of strained germanium through co-implantation and nanosecond pulsed laser melting

David Pastor, Hemi H. Gandhi, Corentin P. Monmeyran, Austin J. Akey, Ruggero Milazzo, Yan Cai, Enrico Napolitani, Russell M. Gwilliam, Iain F. Crowe, Jurgen Michel, L. C. Kimerling, Anuradha Agarwal, Eric Mazur, Michael J. Aziz
Journal: Journal of Applied Physics
J. Appl. Phys. 123, 165101 (2018)
https://doi.org/10.1063/1.5012512
Published: April 2018
View articletitled, High level active n+ doping of strained germanium through co-implantation and nanosecond pulsed laser melting
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Journal Articles

Fabrication and anisotropic wettability of titanium-coated microgrooves

N. Gui, W. Xu, J. Tian, G. Rosengarten, M. Brandt, M. Qian
Journal: Journal of Applied Physics
J. Appl. Phys. 123, 095306 (2018)
https://doi.org/10.1063/1.5020517
Published: March 2018
View articletitled, Fabrication and anisotropic wettability of titanium-coated microgrooves
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Journal Articles

Monolithic integration of InGaAs/InP multiple quantum wells on SOI substrates for photonic devices

Zhibo Li, Mengqi Wang, Xin Fang, Yajie Li, Xuliang Zhou, Hongyan Yu, Pengfei Wang, Wei Wang, Jiaoqing Pan
Journal: Journal of Applied Physics
J. Appl. Phys. 123, 053102 (2018)
https://doi.org/10.1063/1.5009639
Published: February 2018
View articletitled, Monolithic integration of InGaAs/InP multiple quantum wells on SOI substrates for photonic devices
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Journal Articles

Determination of transport properties in optoelectronic devices by time-resolved fluorescence imaging

Adrien Bercegol, Gilbert El-Hajje, Daniel Ory, Laurent Lombez
Journal: Journal of Applied Physics
J. Appl. Phys. 122, 203102 (2017)
https://doi.org/10.1063/1.5005164
Published: November 2017
View articletitled, Determination of transport properties in optoelectronic devices by time-resolved fluorescence imaging
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Includes: Supplementary data
Journal Articles

Modeling micro-porous surfaces for secondary electron emission control to suppress multipactor

J. M. Sattler, R. A. Coutu, Jr., R. Lake, T. Laurvick, T. Back, S. Fairchild
Journal: Journal of Applied Physics
J. Appl. Phys. 122, 055304 (2017)
https://doi.org/10.1063/1.4997465
Published: August 2017
View articletitled, Modeling micro-porous surfaces for secondary electron emission control to suppress multipactor
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Journal Articles

Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy

Yi-Tao Cui, Sven Tougaard, Hiroshi Oji, Jin-Young Son, Yasuhiro Sakamoto, Takuya Matsumoto, Anli Yang, Osami Sakata, Huaping Song, Ichiro Hirosawa
Journal: Journal of Applied Physics
J. Appl. Phys. 121, 225307 (2017)
https://doi.org/10.1063/1.4985176
Published: June 2017
View articletitled, Thickness and structure of thin films determined by background analysis in hard X-ray photoelectron spectroscopy
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Journal Articles

Mechanism of total electron emission yield reduction using a micro-porous surface

Ming Ye (叶鸣,), Dan Wang (王丹,), Yongning He (贺永宁)
Journal: Journal of Applied Physics
J. Appl. Phys. 121, 124901 (2017)
https://doi.org/10.1063/1.4978760
Published: March 2017
View articletitled, Mechanism of total electron emission yield reduction using a micro-porous surface
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Journal Articles

Curvature effect on the surface topography evolution during oxidation at small scale

Xufei Fang, Yan Li, Xue Feng
Journal: Journal of Applied Physics
J. Appl. Phys. 121, 125301 (2017)
https://doi.org/10.1063/1.4978705
Published: March 2017
View articletitled, Curvature effect on the surface topography evolution during oxidation at small scale
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Journal Articles

Measurement of thin film interfacial surface roughness by coherence scanning interferometry

H. Yoshino, A. Abbas, P. M. Kaminski, R. Smith, J. M. Walls, D. Mansfield
Journal: Journal of Applied Physics
J. Appl. Phys. 121, 105303 (2017)
https://doi.org/10.1063/1.4978066
Published: March 2017
View articletitled, Measurement of thin film interfacial surface roughness by coherence scanning interferometry
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Journal Articles

Growth of HfO2/TiO2 nanolaminates by atomic layer deposition and HfO2-TiO2 by atomic partial layer deposition

H. Hernández-Arriaga, E. López-Luna, E. Martínez‐Guerra, M. M. Turrubiartes, A. G. Rodríguez, M. A. Vidal
Journal: Journal of Applied Physics
J. Appl. Phys. 121, 064302 (2017)
https://doi.org/10.1063/1.4975676
Published: February 2017
View articletitled, Growth of HfO2/TiO2 nanolaminates by atomic layer deposition and HfO2-TiO2 by atomic partial layer deposition
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Journal Articles

Fractal characterization and wettability of ion treated silicon surfaces

R. P. Yadav, Tanuj Kumar, V. Baranwal, Vandana, Manvendra Kumar, P. K. Priya, S. N. Pandey, A. K. Mittal
Journal: Journal of Applied Physics
J. Appl. Phys. 121, 055301 (2017)
https://doi.org/10.1063/1.4975115
Published: February 2017
View articletitled, Fractal characterization and wettability of ion treated silicon surfaces
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Journal Articles

Residual stress in nano-structured stainless steel (AISI 316L) prompted by Xe+ ion bombardment at different impinging angles

S. Cucatti, R. Droppa, Jr., C. A. Figueroa, M. Klaus, Ch. Genzel, F. Alvarez
Journal: Journal of Applied Physics
J. Appl. Phys. 120, 145306 (2016)
https://doi.org/10.1063/1.4964429
Published: October 2016
View articletitled, Residual stress in nano-structured stainless steel (AISI 316L) prompted by Xe+ ion bombardment at different impinging angles
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Journal Articles

Observation of anisotropic distribution of microstructure in GaP/GaAs epitaxial layers

Ravi Kumar, V. K. Dixit, Tapas Ganguli, C. Mukherjee, A. K. Srivastava, T. K. Sharma
Journal: Journal of Applied Physics
J. Appl. Phys. 120, 135307 (2016)
https://doi.org/10.1063/1.4964095
Published: October 2016
View articletitled, Observation of anisotropic distribution of microstructure in GaP/GaAs epitaxial layers
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Journal Articles

Effect of IrMn inserted layer on anomalous-Hall resistance and spin-Hall magnetoresistance in Pt/IrMn/YIG heterostructures

T. Shang, H. L. Yang, Q. F. Zhan, Z. H. Zuo, Y. L. Xie, L. P. Liu, S. L. Zhang, Y. Zhang, H. H. Li, B. M. Wang, Y. H. Wu, S. Zhang, Run-Wei Li
Journal: Journal of Applied Physics
J. Appl. Phys. 120, 133901 (2016)
https://doi.org/10.1063/1.4964114
Published: October 2016
View articletitled, Effect of IrMn inserted layer on anomalous-Hall resistance and spin-Hall magnetoresistance in Pt/IrMn/YIG heterostructures
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Journal Articles

Simulations of threshold displacement in beryllium

Matthew L. Jackson, Paul C. M. Fossati, Robin W. Grimes
Journal: Journal of Applied Physics
J. Appl. Phys. 120, 045903 (2016)
https://doi.org/10.1063/1.4958974
Published: July 2016
View articletitled, Simulations of threshold displacement in beryllium
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Journal Articles

Characterization of reclaimed GaAs substrates and investigation of reuse for thin film InGaAlP LED epitaxial growth

M. Englhard, C. Klemp, M. Behringer, A. Rudolph, O. Skibitzki, P. Zaumseil, T. Schroeder
Journal: Journal of Applied Physics
J. Appl. Phys. 120, 045301 (2016)
https://doi.org/10.1063/1.4955333
Published: July 2016
View articletitled, Characterization of reclaimed GaAs substrates and investigation of reuse for thin film InGaAlP LED epitaxial growth
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Journal Articles

Nanopatterning of swinging substrates by ion-beam sputtering

Sun Mi Yoon, J.-S. Kim
Journal: Journal of Applied Physics
J. Appl. Phys. 119, 205301 (2016)
https://doi.org/10.1063/1.4951005
Published: May 2016
View articletitled, Nanopatterning of swinging substrates by ion-beam sputtering
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Journal Articles

Surface evolution at nanoscale during oxidation: A competing mechanism between local curvature effect and stress effect

Xufei Fang, Yan Li, Dan Wang, Siyuan Lu, Xue Feng
Journal: Journal of Applied Physics
J. Appl. Phys. 119, 155302 (2016)
https://doi.org/10.1063/1.4947182
Published: April 2016
View articletitled, Surface evolution at nanoscale during oxidation: A competing mechanism between local curvature effect and stress effect
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Journal Articles

Morse potential-based model for contacting composite rough surfaces: Application to self-assembled monolayer junctions

Jonatan A. Sierra-Suarez, Shubhaditya Majumdar, Alan J. H. McGaughey, Jonathan A. Malen, C. Fred Higgs, III
Journal: Journal of Applied Physics
J. Appl. Phys. 119, 145306 (2016)
https://doi.org/10.1063/1.4945759
Published: April 2016
View articletitled, Morse potential-based model for contacting composite rough surfaces: Application to self-assembled monolayer junctions
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Includes: Supplementary data