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Journal Articles

Effect of a niobium-doped PZT interfacial layer thickness on the properties of epitaxial PMN-PT thin films

Open Access
M. Boota, E. P. Houwman, G. Lanzara, G. Rijnders
Journal: Journal of Applied Physics
J. Appl. Phys. 133, 145302 (2023)
https://doi.org/10.1063/5.0139426
Published: April 2023
View articletitled, Effect of a niobium-doped PZT interfacial layer thickness on the properties of epitaxial PMN-PT thin films
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Includes: Supplementary data
Journal Articles

Significantly enhanced energy storage density and efficiency in flexible Bi3.15Nd0.85Ti3O12 thin film via periodic dielectric layers

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Qianxin Chen, Yuan Zhang, Mingkai Tang, Lei Yang, Xiangli Zhong, Chuanlai Ren, Gaokuo Zhong
Journal: Journal of Applied Physics
J. Appl. Phys. 131, 114101 (2022)
https://doi.org/10.1063/5.0080321
Published: March 2022
View articletitled, Significantly enhanced energy storage density and efficiency in flexible Bi3.15Nd0.85Ti3O12 thin film via periodic dielectric layers
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Journal Articles

Tunability, dielectric, and piezoelectric properties of Ba(1−x)CaxTi(1−y)ZryO3 ferroelectric thin films

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C. J. M. Daumont, Q. Simon, E. Le Mouellic, S. Payan, P. Gardes, P. Poveda, B. Negulescu, M. Maglione, J. Wolfman
Journal: Journal of Applied Physics
J. Appl. Phys. 119, 094107 (2016)
https://doi.org/10.1063/1.4942924
Published: March 2016
View articletitled, Tunability, dielectric, and piezoelectric properties of Ba(1−x)CaxTi(1−y)ZryO3 ferroelectric thin films
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Journal Articles

Thermal-to-electric energy conversion using ferroelectric film capacitors

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A. B. Kozyrev, R. A. Platonov, O. I. Soldatenkov
Journal: Journal of Applied Physics
J. Appl. Phys. 116, 164111 (2014)
https://doi.org/10.1063/1.4900722
Published: October 2014
View articletitled, Thermal-to-electric energy conversion using ferroelectric film capacitors
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Journal Articles

Reliability study of tunable ferroelectric capacitors

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Vladimir O. Sherman, Piotr Czarnecki, Ingrid De Wolf, Tomoaki Yamada, Nava Setter, Barbara Malic, Miso Vukadinovic, Marija Kosec
Journal: Journal of Applied Physics
J. Appl. Phys. 104, 064104 (2008)
https://doi.org/10.1063/1.2978353
Published: September 2008
View articletitled, Reliability study of tunable ferroelectric capacitors
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Journal Articles

Simulation of polarization and butterfly hysteresis loops in bismuth layer-structured ferroelectric thin films

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Z. Ye, M. H. Tang, C. P. Cheng, Y. C. Zhou, X. J. Zheng, Z. S. Hu
Journal: Journal of Applied Physics
J. Appl. Phys. 100, 094101 (2006)
https://doi.org/10.1063/1.2363251
Published: November 2006
View articletitled, Simulation of polarization and butterfly hysteresis loops in bismuth layer-structured ferroelectric thin films
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Journal Articles

Polarization loop deformations of an oxygen deficient Pb ( Zr 0.25 , Ti 0.75 ) O 3 ferroelectric thin film

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G. Le Rhun, R. Bouregba, G. Poullain
Journal: Journal of Applied Physics
J. Appl. Phys. 96, 5712–5721 (2004)
https://doi.org/10.1063/1.1789635
Published: November 2004
View articletitled, Polarization loop deformations of an oxygen deficient Pb ( Zr 0.25 , Ti 0.75 ) O 3 ferroelectric thin film
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Journal Articles

Extended-pulse excimer laser annealing of Pb ( Zr 1 − x Ti x ) O 3 thin film on LaNiO 3 electrode

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S. C. Lai, Hang-Ting Lue, K. Y. Hsieh, S. L. Lung, Rich Liu, T. B. Wu, P. P. Donohue, P. Rumsby
Journal: Journal of Applied Physics
J. Appl. Phys. 96, 2779–2784 (2004)
https://doi.org/10.1063/1.1774241
Published: September 2004
View articletitled, Extended-pulse excimer laser annealing of Pb ( Zr 1 − x Ti x ) O 3 thin film on LaNiO 3 electrode
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Journal Articles

X-ray photoelectron spectroscopy and high resolution electron microscopy studies of Aurivillius compounds: Bi 4−x La x Ti 3 O 12 (x=0, 0.5, 0.75, 1.0, 1.5, and 2.0)

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Ming-Wen Chu, Marcel Ganne, Maria Teresa Caldes, Luc Brohan
Journal: Journal of Applied Physics
J. Appl. Phys. 91, 3178–3187 (2002)
https://doi.org/10.1063/1.1426251
Published: March 2002
View articletitled, X-ray photoelectron spectroscopy and high resolution electron microscopy studies of Aurivillius compounds: Bi 4−x La x Ti 3 O 12 (x=0, 0.5, 0.75, 1.0, 1.5, and 2.0)
Open the PDF for X-ray photoelectron spectroscopy and high resolution electron microscopy studies of Aurivillius compounds: Bi 4−x La x Ti 3 O 12 (x=0, 0.5, 0.75, 1.0, 1.5, and 2.0) in another window
Journal Articles

Simple Ru electrode scheme for ferroelectric ( Pb , La )( Zr , Ti ) O 3 capacitors directly on silicon

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Jordana Bandaru, Timothy Sands, Loucas Tsakalakos
Journal: Journal of Applied Physics
J. Appl. Phys. 84, 1121–1125 (1998)
https://doi.org/10.1063/1.368112
Published: July 1998
View articletitled, Simple Ru electrode scheme for ferroelectric ( Pb , La )( Zr , Ti ) O 3 capacitors directly on silicon
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Journal Articles

Evaluation of imprint in fully integrated (La,Sr)CoO 3 /Pb(Nb,Zr,Ti)O 3 / (La,Sr)CoO 3 ferroelectric capacitors

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S. Sadashivan, S. Aggarwal, T. K. Song, R. Ramesh, J. T. Evans, Jr., B. A. Tuttle, W. L. Warren, D. Dimos
Journal: Journal of Applied Physics
J. Appl. Phys. 83, 2165–2171 (1998)
https://doi.org/10.1063/1.366954
Published: February 1998
View articletitled, Evaluation of imprint in fully integrated (La,Sr)CoO 3 /Pb(Nb,Zr,Ti)O 3 / (La,Sr)CoO 3 ferroelectric capacitors
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