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Ylva Knausgård Hommedal, Marianne Etzelmüller Bathen, Vilde Mari Reinertsen, Klaus Magnus Johansen, Lasse Vines, Ymir Kalmann Frodason
Journal:
Journal of Applied Physics
J. Appl. Phys. 135, 170902 (2024)
Published: May 2024
Journal Articles
Monolayer Ge2S: An auxetic semiconductor with high carrier mobility for metal (Na, K, Mg)-ion battery anodes
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Journal:
Journal of Applied Physics
J. Appl. Phys. 132, 075001 (2022)
Published: August 2022
Includes: Supplementary data
Journal Articles
A comparable study of defect diffusion and recombination in Si and GaN
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Journal:
Journal of Applied Physics
J. Appl. Phys. 132, 045701 (2022)
Published: July 2022
Journal Articles
Improvement in perpendicular magnetic anisotropy and its voltage control efficiency in CoFeB/MgO tunnel junctions with Ta/Mo layered adhesion structures
Available to PurchaseTomohiro Ichinose, Tatsuya Yamamoto, Jun Uzuhashi, Takayuki Nozaki, Tadakatsu Ohkubo, Kay Yakushiji, Shingo Tamaru, Kazuhiro Hono, Shinji Yuasa
Journal:
Journal of Applied Physics
J. Appl. Phys. 131, 213901 (2022)
Published: June 2022
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Energetics of boron near tungsten surfaces: A first-principles study
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Journal:
Journal of Applied Physics
J. Appl. Phys. 130, 015101 (2021)
Published: July 2021
Includes: Supplementary data
Journal Articles
Influence of oxygen on trap-limited diffusion of hydrogen in proton-irradiated n-type silicon for power devices
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Journal:
Journal of Applied Physics
J. Appl. Phys. 129, 025701 (2021)
Published: January 2021
Journal Articles
Claudia Cancellieri, Ethan A. Scott, Jeffrey Braun, Sean W. King, Ron Oviedo, Christopher Jezewski, John Richards, Fabio La Mattina, Lars P. H. Jeurgens, Patrick E. Hopkins
Journal:
Journal of Applied Physics
J. Appl. Phys. 128, 195302 (2020)
Published: November 2020
Includes: Supplementary data
Journal Articles
Role of the Ta buffer layer in Ta/MnN/CoFeB stacks for maximizing exchange bias
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Journal:
Journal of Applied Physics
J. Appl. Phys. 128, 153902 (2020)
Published: October 2020
Journal Articles
First-principles study of electronic and diffusion properties of intrinsic defects in 4H-SiC
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Journal:
Journal of Applied Physics
J. Appl. Phys. 127, 085702 (2020)
Published: February 2020
Includes: Supplementary data
Journal Articles
Modeling dislocation-related leakage currents in GaN p-n diodes
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Journal:
Journal of Applied Physics
J. Appl. Phys. 126, 245705 (2019)
Published: December 2019
Journal Articles
First-principles study of diffusion and interactions of hydrogen with silicon, phosphorus, and sulfur impurities in nickel
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Journal:
Journal of Applied Physics
J. Appl. Phys. 125, 125104 (2019)
Published: March 2019
Journal Articles
Kinetic Monte Carlo simulations of stress and morphology evolution in polycrystalline thin films
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Journal:
Journal of Applied Physics
J. Appl. Phys. 125, 115304 (2019)
Published: March 2019
Journal Articles
Investigation of in-situ co-doping by Sb and P of germanium films grown on Si(001) by molecular beam epitaxy
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Journal:
Journal of Applied Physics
J. Appl. Phys. 123, 133102 (2018)
Published: April 2018
Journal Articles
Journal Articles
Suppression of interfacial voids formation during silane (SiH4)-based silicon oxide bonding with a thin silicon nitride capping layer
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Journal:
Journal of Applied Physics
J. Appl. Phys. 123, 015302 (2018)
Published: January 2018
Journal Articles
Blocking germanium diffusion inside silicon dioxide using a co-implanted silicon barrier
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Journal:
Journal of Applied Physics
J. Appl. Phys. 123, 161540 (2018)
Published: December 2017
Journal Articles
J. A. Logan, T. L. Brown-Heft, S. D. Harrington, N. S. Wilson, A. P. McFadden, A. D. Rice, M. Pendharkar, C. J. Palmstrøm
Journal:
Journal of Applied Physics
J. Appl. Phys. 121, 213903 (2017)
Published: June 2017
Journal Articles
Interface matching and intermixing of thin MgO barriers and ferromagnetic layers deposited on GaAs (001)
Available to PurchaseR. Tholapi, I. A. Karateev, B. S. Roshchin, V. E. Asadchikov, T. Slobodskyy, W. Hansen, A. L. Vasiliev
Journal:
Journal of Applied Physics
J. Appl. Phys. 121, 205308 (2017)
Published: May 2017
Journal Articles
Electronic and structural analysis of ultra-small-diameter metal disilicide nanowires
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Journal:
Journal of Applied Physics
J. Appl. Phys. 121, 194301 (2017)
Published: May 2017
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