Skip Nav Destination
A numerical analysis and experimental demonstration of a low degradation conductive bridge resistive memory device
J. Appl. Phys. 122, 164502 (2017)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
- Dan Berco
- Diing Shenp Ang
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena (2019) 37 (6)