Skip to Main Content
Skip Nav Destination

Aluminum incorporation in Ti1xAlxN films studied by x-ray absorption near-edge structure

J. Appl. Phys. 105, 113521 (2009)
This article has been cited by the following articles in journals that are participating in CrossRef Cited-by Linking.
  • Ely Dannier V-Niño
  • Linda Bertel
  • David A. Miranda
Emergent Materials (2024)
  • I-Hung Ho
  • Ching-Wen Chang
  • Sheng-Kai Wen
  • Yu-Jung Lu
  • Shangjr Gwo
  • Hyeyoung Ahn
The Journal of Physical Chemistry C 127, 13731 (2023)
  • L. Rogström
  • M. Moreno
  • J.M. Andersson
  • M.P. Johansson-Jöesaar
  • M. Odén
  • K. Klementiev
  • L.-Å. Näslund
  • M. Magnuson
Applied Surface Science (2023) 612: 155907.
  • Abhijeet Das
  • Vipin Chawla
  • Robert Saraiva Matos
  • Henrique Duarte da Fonseca Filho
  • Ram Pratap Yadav
  • Ştefan Ţălu
  • Sanjeev Kumar
Surface and Coatings Technology (2021) 421: 127420.
  • Ishwer Shivakoti
  • Golam Kibria
  • Soham Das
  • Ashis Sharma
  • Bal Bahadur Pradhan
  • Somenath Chatterjee
Materials and Manufacturing Processes 36, 858 (2021)
  • Soham Das
  • Mukul Gupta
  • Ashis Sharma
  • Bibhu P. Swain
Materials Science-Poland 38, 122 (2020)
  • M.-J. Pac
  • Y. Pinot
  • S. Giljean
  • C. Rousselot
  • P. Delobelle
  • C. Ulhaq-Bouillet
  • M.-H. Tuilier
Thin Solid Films (2017) 634: 96.
  • M. Mahbubur Rahman
  • Zhong-Tao Jiang
  • Xiaofei Duan
  • Zonghan Xie
  • Anton Tadich
  • Zhi-feng Zhou
  • Nicholas Mondinos
  • Chun-Yang Yin
  • Mohammednoor Altarawneh
  • Bogdan Z. Dlugogorski
Journal of Alloys and Compounds (2016) 661: 268.
  • Y. Pinot
  • M.-H. Tuilier
  • M.-J. Pac
  • C. Rousselot
  • D. Thiaudière
Journal of Synchrotron Radiation 22, 1440 (2015)
  • Y. Pinot
  • M.-J. Pac
  • P. Henry
  • C. Rousselot
  • Ya.I. Odarchenko
  • D.A. Ivanov
  • C. Ulhaq-Bouillet
  • O. Ersen
  • M.-H. Tuilier
Thin Solid Films (2015) 577: 74.
  • G. Fox-Rabinovich
  • A. Kovalev
  • S. Veldhuis
  • K. Yamamoto
  • J. L. Endrino
  • I. S. Gershman
  • A. Rashkovskiy
  • M. H. Aguirre
  • D. L. Wainstein
Scientific Reports (2015) 5 (1)
  • M.A. Konyushenko
  • A.S. Konashuk
  • A.A. Sokolov
  • F. Schaefers
  • E.O. Filatova
Journal of Electron Spectroscopy and Related Phenomena (2014) 196: 117.
  • C. Århammar
  • J.L. Endrino
  • M. Ramzan
  • D. Horwat
  • Andreas Blomqvist
  • J.-E. Rubensson
  • J. Andersson
  • R. Ahuja
Surface and Coatings Technology (2014) 242: 207.
  • M. Mahbubur Rahman
  • Zhong-Tao Jiang
  • Zonghan Xie
  • Xiaofei Duan
  • Zhi-feng Zhou
  • Pui Ching Wo
  • Chun-Yang Yin
  • Nicholas Mondinos
  • Qinfen Gu
  • Hantarto Widjaja
  • Kevin Jack
  • Anya Yago
  • Amun Amri
The Journal of Physical Chemistry C 118, 18573 (2014)
  • R. Gago
  • F. Soldera
  • R. Hübner
  • J. Lehmann
  • F. Munnik
  • L. Vázquez
  • A. Redondo-Cubero
  • J.L. Endrino
Journal of Alloys and Compounds (2013) 561: 87.
  • M. Mahbubur Rahman
  • Alex Duan
  • Zhong-Tao Jiang
  • Zonghan Xie
  • Alex Wu
  • Amun Amri
  • Bruce Cowie
  • Chun-Yang Yin
Journal of Alloys and Compounds (2013) 578: 362.
  • M.-H. Tuilier
  • M.-J. Pac
  • D.V. Anokhin
  • D.A. Ivanov
  • C. Rousselot
  • D. Thiaudière
Thin Solid Films (2012) 526: 269.
  • M. Gîrleanu
  • M.-J. Pac
  • P. Louis
  • O. Ersen
  • J. Werckmann
  • C. Rousselot
  • M.-H. Tuilier
Thin Solid Films 519, 6190 (2011)
  • J.L. Endrino
  • C. Århammar
  • A. Gutiérrez
  • R. Gago
  • D. Horwat
  • L. Soriano
  • G. Fox-Rabinovich
  • D. Martín y Marero
  • J. Guo
  • J.-E. Rubensson
  • J. Andersson
Acta Materialia 59, 6287 (2011)
  • D. Holec
  • R. Rachbauer
  • D. Kiener
  • P. D. Cherns
  • P. M. F. J. Costa
  • C. McAleese
  • P. H. Mayrhofer
  • C. J. Humphreys
Physical Review B (2011) 83 (16)
  • Feby Jose
  • Ramaseshan R.
  • S. Dash
  • Tripura Sundari S.
  • Deepti Jain
  • Ganesan V.
  • Chandramohan P.
  • Srinivasan M.P.
  • A.K. Tyagi
  • Baldev Raj
Materials Chemistry and Physics 130, 1033 (2011)
Close Modal

or Create an Account

Close Modal
Close Modal