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Radiation Effects in Materials

The incorporation of new materials and advanced systems ranging from microelectronics to structural metals into radiation applications requires a detailed fundamental understanding of the chemical and microstructural evolutions. This special topic covers theoretical and experimental studies exploring radiation effects from the atomic to the system level. Both radiations induced materials modification and desired manipulation as well as degradation are of interest. Further, multiple stimuli in addition to radiation will be of interest to this special issue. Interesting and novel methods to examine materials changes due to radiation will be considered.

Guest Editors: Lorenzo Malerba, Takeshi Ohshima, Rudy Konings, and Khalid Hattar

Special Collection Image
Khalid Hattar; Rudy J. M. Konings; Lorenzo Malerba; Takeshi Ohshima
A. Y. Polyakov; А. I. Kochkova; A. Azarov; V. Venkatachalapathy; A. V. Miakonkikh; A. A. Vasilev; A. V. Chernykh; I. V. Shchemerov; A. A. Romanov; A. Kuznetsov; S. J. Pearton
Rajan Agrahari; Prashant Kumar Rajbhar; Manpuran Mahto; Pradip Kumar Jain
F. Mirkhosravi; A. Rashidi; A. T. Elshafiey; J. Gallagher; Z. Abedi; K. Ahn; A. Lintereur; E. K. Mace; M. A. Scarpulla; D. Feezell
Jian-Sian Li; Chao-Ching Chiang; Xinyi Xia; Sergei Stepanoff; Aman Haque; Douglas E. Wolfe; Fan Ren; S. J. Pearton
Tatsuo Fukuda; Masaaki Kobata; Takahisa Shobu; Kenji Yoshii; Junichiro Kamiya; Yosuke Iwamoto; Takahiro Makino; Yuichi Yamazaki; Takeshi Ohshima; Yasuhiro Shirai; Tsuyoshi Yaita
Qianran Yu; Giacomo Po; Jaime Marian
Chikara Shinei; Yuta Masuyama; Masashi Miyakawa; Hiroshi Abe; Shuya Ishii; Seiichi Saiki; Shinobu Onoda; Takashi Taniguchi; Takeshi Ohshima; Tokuyuki Teraji
Isabelle Zacharie-Aubrun; Rebecca Dowek; Jean Noirot; Thierry Blay; Martiane Cabié; Myriam Dumont
M. Prester; D. Drobac; Ž. Marohnić; M. Roldán; F. J. Sánchez; Z. Siketić; T. Tadić
Jean Noirot; Rébecca Dowek; Isabelle Zacharie-Aubrun; Thierry Blay; Martiane Cabié; Myriam Dumont
Jean-Christophe Griveau; Jean-François Vigier; Karin Popa; Sorin-Octavian Vălu; Eric Colineau; Rudy J. M. Konings
A. Barthel; L. Sayre; G. Kusch; R. A. Oliver; L. C. Hirst
C. Robertson; M. H. Mathon; B. K. Panigrahi; S. Amirthapandian; S. Sojak; S. Santra
Tetsuya Kimata; Sho Kato; Tomohiro Kobayashi; Shunya Yamamoto; Tetsuya Yamaki; Takayuki Terai
Didier Bathellier; Luca Messina; Michel Freyss; Marjorie Bertolus; Thomas Schuler; Maylise Nastar; Pär Olsson; Emeric Bourasseau
A. Iwase; K. Fukuda; Y. Saitoh; Y. Okamoto; S. Semboshi; H. Amekura; T. Matsui
Awen Liu; Hefei Huang; Zhenbo Zhu; Ruoyu Li; Weichi Ji; Yan Li
E. S. Srinadhu; D. D. Kulkarni; D. A. Field; J. E. Harriss; C. E. Sosolik
M. Yu. Lavrentiev; A. Hollingsworth; J. Hess; S. Davies; A. Wohlers; B. Thomas; H. Salter; A. Baron-Wiechec; I. Jepu; Y. Zayachuk; N. Peng
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