Novel Applications of Focused Ion Beams — Beyond Milling

The focused ion beam (FIB) tool has enabled incredible applications over the past 45 years since its first invention. Most applications of FIB today rely on the use of FIB for material removal, this special issue will highlight novel FIB enabled applications beyond material removal and will give a perspective of where FIB applications will be moving to in the future.

Guest Editor: Michael Titze