Skip Nav Destination
Conference Collection: 34th North American Molecular Beam Epitaxy Conference 2018
This is a collection of papers presented at the 34th North American Molecular Beam Epitaxy Conference 2018. The conference was held September 30-October 5, 2018 in Banff, Alberta, Canada. The 34th North American Conference on Molecular Beam Epitaxy (NAMBE 2018) is a prominent international forum for reporting scientific and technological developments in Molecular Beam Epitaxy research. The conference showcases important results from fundamental materials and device research, through technological applications, and into high-volume and low-cost production.
Image Credit: Stefan Schmult, Victor V. Solovyev, Steffen Wirth, Andreas Großer, Thomas Mikolajick, and Igor V. Kukushkin, JVST B 37(2), https://doi.org/10.1116/1.5088927, (2019).
Electronic & Optoelectronic Materials, Devices & Processing
Joel M. Fastenau; Dmitri Lubyshev; Scott A. Nelson; Matthew Fetters; Hubert Krysiak; Joe Zeng; Michael Kattner; P. Frey; Amy W. K. Liu; Aled O. Morgan; Stuart A. Edwards; Richard Dennis; Kim Beech; Doug Burrows; Kelly Patnaude; Ross Faska; Jason Bundas; Alex Reisinger; Mani Sundaram
Electronic & Optoelectronic Materials, Devices & Processing
Brelon J. May; Elline C. Hettiaratchy; Camelia Selcu; Binbin Wang; Bryan D. Esser; David W. McComb; Roberto C. Myers
Electronic & Optoelectronic Materials, Devices & Processing
D. Scott Katzer; Neeraj Nepal; Matthew T. Hardy; Brian P. Downey; David F. Storm; Eric N. Jin; David J. Meyer
Electronic & Optoelectronic Materials, Devices & Processing
HoSung Kim; Seung-Yeop Ahn; Zbigniew Wasilewski
Electronic & Optoelectronic Materials, Devices & Processing
Ida Sadeghi; Man Chun Tam; Zbigniew Roman Wasilewski
Electronic & Optoelectronic Materials, Devices & Processing
Thierno Mamoudou Diallo; Alex Brice Poungoué Mbeunmi; Mohamed El-Gahouchi; Mourad Jellite; Roxana Arvinte; Mohammad Reza Aziziyan; Richard Arès; Simon Fafard; Abderraouf Boucherif
Electronic & Optoelectronic Materials, Devices & Processing
Hiroto Sekiguchi; Yukimasa Higashi; Keisuke Yamane; Akihiro Wakahara; Hiroshi Okada; Katsumi Kishino
Measurement and Characterization
Yunong Hu; Man Chun Tam; Zbigniew R. Wasilewski
Electronic & Optoelectronic Materials, Devices & Processing
Frank C. Peiris; Ellen T. Holmgren; John W. Lyons; Xiang Li; Xinyu Liu; Margaret Dobrowolska; Jacek K. Furdyna
Electronic & Optoelectronic Materials, Devices & Processing
Brelon J. May; Elline C. Hettiaratchy; Roberto C. Myers
Electronic & Optoelectronic Materials, Devices & Processing
Stefan Schmult; Victor V. Solovyev; Steffen Wirth; Andreas Großer; Thomas Mikolajick; Igor V. Kukushkin