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Secondary Ion Mass Spectrometry (SIMS)
This Special Topic Collection features articles on the most recent developments and experimental studies in Secondary Ion Mass Spectrometry (SIMS). The collection includes papers presented at the SIMS 23 Conference held in Minneapolis, MN, USA from September 18–23, 2022, as well as other SIMS research articles that were not presented at the conference but were submitted to the collection.
View Biointerphases collection here: https://pubs.aip.org/bip/collection/1108/Secondary-Ion-Mass-Spectrometry-SIMS
Image Credit: Sviatoslav Hrabar, Michał Kański, Soukaina Louerdi, and Zbigniew Postawa, J. Vac. Sci. Technol. B 41, 032803 (2023); https://doi.org/10.1116/6.0002575

Measurement and Characterization
Philip Keller; Satoka Aoyagi; Michael Dürr
Measurement and Characterization
Determining the oxygen detection limit with magnetic sector dynamic secondary ion mass spectrometry (SIMS)
Available to Purchase
A. Merkulov
Measurement and Characterization
Surface and functional characterization of nanostructured thin films for environmental remediation
Available to Purchase
Enrica Maria Malannata; Alessandro Auditore; Antonino Licciardello
Vacuum Measurement and Technology
Surface modification of s235 steel, molybdenum, and tungsten using electron beam scanning and electric discharge machining
Available to Purchase
Piotr Konarski; Joachim Ażgin; Aleksander Zawada; Sung-Hui Feng; Ching-Hsiang Chien; Dong-Yea Sheu
Measurement and Characterization
Secondary ion mass spectrometry analysis of metal oxides using 70 keV argon, carbon dioxide, and water gas cluster ion beams
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A. H. Alsaedi; A. S. Walton; N. P. Lockyer
Nanoscale Science and Technology
Sputtering produced by vacuum electrospray droplet ions with different sizes and charges
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Satoshi Ninomiya; Lee Chuin Chen; Kenzo Hiraoka
Nanoscale Science and Technology
Effect of the kinetic energy on particle ejection process from carbon nanotubes bombarded by kilo-electron-volt C60
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Sviatoslav Hrabar; Michał Kański; Soukaina Louerdi; Zbigniew Postawa
Review Articles
Secondary ion mass spectrometry quantification: Do you remember when a factor of 2 was good enough?
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Charles W. Magee; Temel H. Buyuklimanli
Measurement and Characterization
Characterization of GaN structures for power electronics by secondary ion mass spectrometry and atomic force microscope approach
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Tarek Spelta; Marc Veillerot; Eugénie Martinez; Nicolas Chevalier; Denis Mariolle; Roselyne Templier; Bassem Salem; Pedro Fernandes Paes Pinto Rocha; Laura Vauche; Sarah Boubenia; Bérangère Hyot
Measurement and Characterization
Restoration of the original depth distribution from experimental SIMS profile using the depth resolution function in framework of RMR model
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Yu. Kudriavtsev; R. Asomoza; K. D. Moiseev