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Conference Collection: 8th International Conference on Spectroscopic Ellipsometry 2019, ICSE

This is a collection of papers originating from the 8th International Conference on Spectroscopic Ellipsometry 2019 (ICSE-8) held May 26–31, 2019 in Barcelona, Spain. The collection covers science and applications of spectroscopic ellipsometry and related techniques.

Image Credit: Nina Hong and James N. Hilfiker, JVST B 38, 014012 (2020); https://doi.org/10.1116/1.5129691

Electronic and Optoelectronic Materials, Devices and Processing

Thickness dependence of infrared lattice absorption and excitonic absorption in ZnO layers on Si and SiO₂ grown by atomic layer deposition

Nuwanjula S. Samarasingha; Stefan Zollner; Dipayan Pal; Rinki Singh; Sudeshna Chattopadhyay

https://doi.org/10.1116/6.0000184

Measurement and Characterization

Analytic solutions for calculating the surface inclination of isotropic media and bare substrates by using reflection-based generalized ellipsometry

Christian Negara; Thomas Längle; Jürgen Beyerer

https://doi.org/10.1116/1.5144506

Measurement and Characterization

Characterization of the high harmonics source for the VUV ellipsometer at ELI Beamlines

Shirly Espinoza; Fabio Samparisi; Fabio Frassetto; Steffen Richter; Mateusz Rebarz; Ondrej Finke; Martin Albrecht; Matej Jurkovic; Ondrej Hort; Nicola Fabris; Anna Zymaková; Dong Du Mai; Roman Antipenkov; Jaroslav Nejdl; Luca Poletto; Jakob Andreasson

https://doi.org/10.1116/1.5129674

Measurement and Characterization

Using electrochemistry-total internal reflection imaging ellipsometry to monitor biochemical oxygen demand with polyaniline modified electrode

Jia Shen; Wei Liu; Yu Niu; Meng Li; Gang Jin

https://doi.org/10.1116/1.5129606

Electronic and Optoelectronic Materials, Devices and Processing

Gaussian effective medium theory of dielectric properties of inhomogeneous systems

Agnieszka Chrzanowska; Sebastian Babiarz

https://doi.org/10.1116/1.5130010

Measurement and Characterization

Imaging ellipsometry biosensor: Basic theory, principles of operation, and applications

Haoyu Liu; Jia Shen; Wei Liu; Yu Niu; Gang Jin

https://doi.org/10.1116/1.5129596

Measurement and Characterization

Imaging ellipsometry for curved surfaces

Christian Negara; Thomas Längle; Jürgen Beyerer

https://doi.org/10.1116/1.5129654

Measurement and Characterization

Mid-IR and UV-Vis-NIR Mueller matrix ellipsometry characterization of tunable hyperbolic metamaterials based on self-assembled carbon nanotubes

Stefan Schöche; Po-Hsun Ho; John A. Roberts; Shangjie J. Yu; Jonathan A. Fan; Abram L. Falk

https://doi.org/10.1116/1.5130888

Plasmonics

Plasmonic coupling and how standard ellipsometry can feel surface plasmon

Eugene Bortchagovsky

https://doi.org/10.1116/1.5122267

Plasmonics

Gold nanoparticles growing in a polymer matrix: What can we learn from spectroscopic imaging ellipsometry?

Corentin Guyot; Philippe Leclère; Michel Voué

https://doi.org/10.1116/1.5129578

Measurement and Characterization

In situ real-time and ex situ spectroscopic analysis of Al₂O₃ films prepared by plasma enhanced atomic layer deposition

Franziska Naumann; Johanna Reck; Hassan Gargouri; Bernd Gruska; Adrian Blümich; Ali Mahmoodinezhad; Christoph Janowitz; Karsten Henkel; Jan Ingo Flege

https://doi.org/10.1116/1.5122797

Plasmonics