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64th International Conference on Electron, Ion, And Photon Beam Technology and Nanofabrication, EIPBN 2021
This collection includes papers from the 64th International Conference on Electron, Ion, and Photon Beam Technology and Nanofabrication held virtually on June 1-4, 2021. The EIPBN Conference is dedicated to lithographic patterning science, nano-manufacturing process technology, and the applications these methods enable. The Conference Chair was Gerald Lopez (University of Pennsylvania, Singh Center for Nanotechnology), and the Program Chair was Martha I. Sanchez (LytEn Inc.).
Guest Editors: Program Chair: Martha I. Sanchez
Review Articles
Regina Luttge
MEMS and NEMS
Michael J. Elowson; Rohan Dhall; Adam Schwartzberg; Stephanie Y. Chang; Vittoria Tommasini; Sardar B. Alam; Emory M. Chan; Stefano Cabrini; Shaul Aloni
Lithography
Raphaël Dawant; Robyn Seils; Serge Ecoffey; Rainer. Schmid; Dominique Drouin
Nanoscale Science and Technology
Rahman Sabahi-Kaviani; Regina Luttge
MEMS and NEMS
Vittorino Lanzio; Vanessa Gutierrez; John Hermiz; Kristofer Bouchard; Stefano Cabrini
Lithography
Neda Hesam Mahmoudi Nezhad; Mohamad Ghaffarian Niasar; Ali Mohammadi Gheidari; Pieter Kruit; Cornelis Wouter Hagen
Lithography
Rajiv Sejpal; Bruce Smith
Electronic and Optoelectronic Materials, Devices and Processing
Daiki Sato; Haruka Shikano; Atsushi Koizumi; Tomohiro Nishitani; Yoshio Honda; Hiroshi Amano
Nanoscale Science and Technology
Mario Baum; Christoph Meinecke; Thomas Blaudeck; Christian Helke; Danny Reuter; Karla Hiller; Sascha Hermann; Stefan E. Schulz; Harald Kuhn
Nanoscale Science and Technology
Mohamed M. El-Gomati; Torquil Wells; Xiaoping Zha; Richard Sykes; Christopher J. Russo; Richard Henderson; Greg McMullan
Electronic and Optoelectronic Materials, Devices and Processing
Karan Prabhakar; Ryan J. Patton; Ronald M. Reano
Nanoscale Science and Technology
Yasuhiro Kimura; Yang Ju
Lithography
Nadine Gerges; Camille Petit-Etienne; Marie Panabière; Jumana Boussey; Yann Ferrec; Cécile Gourgon
Plasmonics
Aran Warren; Maan M. Alkaisi; Ciaran P. Moore
Electronic and Optoelectronic Materials, Devices and Processing
Kirill Misiiuk; Sam Lowrey; Richard Blaikie; Josselin Juras; Andrew Sommers; Jérôme Leveneur
Measurement and Characterization
Elizabeth M. Ashley; Peter J. Duda, III; Paul F. Nealey
Microelectronic and Nanoelectronic Devices
Hongbae Jeong; Jiangdong Deng; Giorgio Bonmassar
Measurement and Characterization
Yagmur Demircan Yalcin; Alex J. Bastiaens; Jean-Philippe Frimat; Regina Luttge
Nanoscale Science and Technology
Yutika Badhe; Pedro E. Rocha-Flores; Walter E. Voit; David Remer; Lauren Costella; Alexandra Joshi-Imre
Measurement and Characterization
Kun-Chieh Chien; Chih-Hao Chang; Dragan Djurdjanovic