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Electron, Ion, and Photon Beam Technology and Nanofabrication, EIPBN 2020
This collection includes papers that were planned to be presented at EIPBN 2020. The international EIPBN conference is the premier gathering of scientists and engineers who are dedicated to electron, ion and photon lithography, imaging and analysis; atomically precise fabrication; nanofabrication process technologies and related emerging technologies; and their applications in a broad spectrum of fields. The Conference Chair was James Spallas (KLA), and the Program Chair was B. Robert Ilic (National Institute of Standards and Technology).
Conference Chair: James Spallas, Program Chair: B. Robert Ilic

Lithography
Mandy Grube; Benjamin Schille; Matthias Schirmer; Maik Gerngroß; Uwe Hübner; Paul Voigt; Sascha Brose
10.1116/6.0000542
Nanometer Science and Technology
Ao Guo; Y. Carol Shieh; Ralu Divan; Rong R. Wang
10.1116/6.0000548
Electronic and Optoelectronic Materials, Devices and Processing
Yanxue Hong; A. N. Ramanayaka; Ryan Stein; M. D. Stewart; J. M. Pomeroy
10.1116/6.0000549
Electronic and Optoelectronic Materials, Devices and Processing
Luke Haponow; Jeff Kettle; John Allsop
10.1116/6.0000551
MEMS and NEMS
Miriam Schröer; Hella-Christin Scheer
10.1116/6.0000550
Nanometer Science and Technology
Joseph Favata; Valery Ray; Sina Shahbazmohamadi
10.1116/6.0000555
Lithography
Md Nabid Hasan; Soo-Young Lee; Byung-Sup Ahn; Jin Choi; Joon-Soo Park
10.1116/6.0000556
Energy Conversion and Storage Devices
Electrospun Mn2O3 web electrodes: Influence of fabrication parameters on electrochemical performance
Molly Brockway; Jack L. Skinner
10.1116/6.0000553
Nanometer Science and Technology
Katsumi Nagaoka; Shun-ichiro Ohmi
10.1116/6.0000436
MEMS and NEMS
Xiaocheng Liu; Peter Fecko; Zdenka Fohlerová; Tomáš Karásek; Jan Pekárek; Pavel Neužil
10.1116/6.0000558
Microelectronic and Nanoelectronic Devices
Yagmur Demircan Yalcin; Regina Luttge
10.1116/6.0000518
Lithography
Md Nabid Hasan; Soo-Young Lee; Byung-Sup Ahn; Jin Choi; Joon-Soo Park
10.1116/6.0000547
Nanometer Science and Technology
Jamie R. Gardner; William R. McGehee; Mark D. Stiles; Jabez J. McClelland
10.1116/6.0000394