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Reproducibility Challenges and Solutions II with a Focus on Surface and Interface Analysis

Reliability and reproducibility of data and analysis issues impact most areas of modern science, including those of importance to the AVS. In 2020, JVST A published a special topic collection on Reproducibility Challenges and Solutions with a Focus on XPS. As a follow up to the first collection of papers, this collection expands into other areas of surface analysis.

This special topic collection includes issues related to AES, SIMS, LEIS, Ellipsometry and Scanning Probe methods, as well as XPS topics not fully covered in the first collection. The intent is to present papers that identify important challenges faced by analysts that often lead to incomplete or erroneous results and to identify useful protocols and other solutions.

Guest Editors

  • Don Baer, Pacific Northwest National Laboratory (emeritus) (USA)
  • Ian Gilmore, National Physical Laboratory (UK)

Guest Associate Editors

  • Satoka Aoyagi, Seikei University (Japan)
  • Kateryna Artyushkova, Physical Electronics-Phi (USA)
  • Chris Easton, Commonwealth Scientific and Industrial Research Organisation-CSIRO (Australia)
  • Alberto Herrera Gómez, Cinvestav (Mexico)
  • Matthew Linford, Brigham Young University (USA)
  • George Orji, National Institute of Standards Technology (USA)
  • Alexander Shard, National Physical Laboratory (UK)
  • Gustavo F. Trindade, National Physical Laboratory (UK)

Donald R. Baer; Merve Taner Camci; David J. H. Cant; Scott A. Chambers; Hagai Cohen; Pinar Aydogan Gokturk; David J. Morgan; Andrey Shchukarev; Peter M. A. Sherwood; Sefik Suzer; Sven Tougaard; John F. Watts
Alvaro J. Lizarbe; Kristopher S. Wright; Garrett Lewis; Gavin Murray; Daniel E. Austin; Jeff Terry; David E. Aspnes; Matthew R. Linford
Scott A. Chambers; Peter V. Sushko; Paul S. Bagus
B. Maxwell Clark; George H. Major; Joshua W. Pinder; Daniel E. Austin; Donald R. Baer; Mark C. Biesinger; Christopher D. Easton; Sarah L. Harmer; Alberto Herrera-Gomez; Anthony E. Hughes; William M. Skinner; Matthew R. Linford
Min-Ju Choi; Hyoju Park; Mark H. Engelhard; Dongsheng Li; Peter V. Sushko; Yingge Du
Yundong Zhou; Alexis Franquet; Valentina Spampinato; Alex Merkulov; Michael R. Keenan; Paul A. W. van der Heide; Gustavo F. Trindade; Wilfried Vandervorst; Ian S. Gilmore
A. E. Hughes; C. D. Easton; T. R. Gengenbach; M. C. Biesinger; M. Laleh
A. E. Hughes; C. D. Easton; T. R. Gengenbach; M. C. Biesinger; M. Laleh
Samira Jafari; Blaine Johs; Matthew R. Linford
Alaina Thompson; William Limestall; Art Nelson; Daniel T. Olive; Jeff Terry
Alexander G. Shard; Mark A. Baker
Kateryna Artyushkova; Stuart R. Leadley; Alexander G. Shard
Alan M. Spool; Lorie Finney
Kye J. Robinson; Helmut Thissen
B. Vincent Crist
Yadong Zhou; Peishi Jiang; Ping Chen; Endong Jia; Cole S. Welch; Qian Zhao; Jeffrey A. Dhas; Emily B. Graham; Xingyuan Chen; Xin Zhang; Zihua Zhu
Irit Rosenhek-Goldian; Sidney R. Cohen
Miu Lun Lau; Abraham Burleigh; Jeff Terry; Min Long
Paul S. Bagus; Connie J. Nelin; C. R. Brundle
Alberto Herrera-Gomez; Dulce Maria Guzman-Bucio; Marisol Mayorga-Garay; Orlando Cortazar-Martinez

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