Skip to Main Content
Skip Nav Destination

Advances in Multi-Scale Mechanical Characterization

As evident from the significant increase in the number of publications every year over the last two decades, the research community showed tremendous interest in advancing the small-scale mechanical testing instrumentation and employed them for probing the local mechanical properties of advanced materials and devices. An update on the new developments advancing instrumentation, theoretical models, and methods for improving the current understanding, and applications would require at this stage. This Special Topic welcomes such high-quality contributions that provide deep insights into the mechanisms responsible for the scale-dependent mechanical behavior of advanced materials and their applications in solving complex challenges.

Guest Editors: Kiran Mangalampalli, Pijush Ghosh, Fabien Volpi, Daniel Kiener, and Alexey Useinov

Special Collection Image
Kiran Mangalampalli; Pijush Ghosh; Fabien Volpi; Daniel Kiener; Alexey Useinov
Bernard R. Becker; Eric D. Hintsala; Benjamin Stadnick; Ude D. Hangen; Douglas D. Stauffer
V. S. Kathavate; K. Eswar Prasad; Mangalampalli S. R. N. Kiran; Yong Zhu
A. Useinov; V. Reshetov; A. Gusev; E. Gladkih
Larissa Q. Huston; Samantha C. Couper; Matthew Jacobsen; Eric K. Moss; Lowell Miyagi; Jesse S. Smith; Nenad Velisavljevic; Blake T. Sturtevant
Ayesha Asif; Saifur Rahman; Andreas A. Polycarpou
Vipul Jain; Sudipta Patra; Chandan Halder; Sk. Md. Hasan; Abhijit Ghosh
Yan Chen; Ke Tang; Boyuan Gou; Feng Jiang; Xiangdong Ding; Ekhard K. H. Salje
Wenshuai Hu; Yabin Wang; Kexin He; Xiaolong He; Yan Bai; Chenyang Liu; Nan Zhou; Haolin Wang; Peixian Li; Xiaohua Ma; Yong Xie
Wei Lu; Zhenze Yang; Markus J. Buehler
N. A. Richter; M. Gong; Y. F. Zhang; T. Niu; B. Yang; J. Wang; H. Wang; X. Zhang
N. G. Mathews; A. K. Saxena; N. Venkataramani; G. Dehm; B. N. Jaya
Theany To; Christian Gamst; Martin B. Østergaard; Lars R. Jensen; Morten M. Smedskjaer
Md. Shahid Jamal; Pooja Gupta; Rakhul Raj; Mukul Gupta; V. R. Reddy; Dileep Kumar
Yukari Ishikawa; Yoshihiro Sugawara; Yongzhao Yao; Hidetoshi Takeda; Hideo Aida; Kazuyuki Tadatomo
A. Ahmine; P. Djemia; M. Fivel; D. Faurie; N. Girodon-Boulandet; M. Velazquez; L. Xuan; T. Duffar
Payel Maiti; Dhrubajyoti Sadhukhan; Jiten Ghosh; Anoop Kumar Mukhopadhyay
Close Modal

or Create an Account

Close Modal
Close Modal