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1-20 of 64 Search Results for
transmission electron microscopy (TEM)
Book Chapter
Series: AIPP Books, Methods
Published: December 2022
10.1063/9780735425422_frontmatter
EISBN: 978-0-7354-2542-2
ISBN: 978-0-7354-2540-8
... microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS). Advanced Analytical Techniques for Characterization of 2D Materials: Compiles a range of modern material...
Book Chapter
Series: AIPP Books, Methods
Published: December 2022
10.1063/9780735425422_index
EISBN: 978-0-7354-2542-2
ISBN: 978-0-7354-2540-8
... (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, x-ray diffraction (XRD), and x-ray photoelectron spectroscopy (XPS). Advanced Analytical Techniques for Characterization of 2D Materials: Compiles a range of modern material...
Images
in High Breakdown Voltage β-Ga2O3 Schottky Diodes
> Ultrawide Bandgap β-Ga2O3 SemiconductorTheory and Applications
Published: February 2023
FIG. 8.7 (a) Schematic of a β-Ga2O3 SBD with an ultrahigh-permittivity field-plate dielectric, where S1 corresponds to a 15-period BaTiO3/SrTiO3 superlattice as the field-plate oxide [(BTO/STO)15 FP] and S2 corresponds to BaTiO3 as the field-plate oxide (BTO FP). The cross-sectional transmission electron microscopy (TEM) image depicts the field-plated region of the S1 structure. (b) Forward I–V characteristics and differential RON,sp of a β-Ga2O3 SBD with (BTO/STO)15 FP, a β-Ga2O3 SBD with BTO FP, and a reference SBD without a field plate. (c) Reverse breakdown characteristics of the three different SBD structures. Reprinted with permission from Roy et al., IEEE Electron Device Lett. 42 (8), 1140–1143 (2021). Copyright 2021 IEEE. More about this image found in (a) Schematic of a β-Ga2O3 SBD with an ultrahigh-perm...
Book Chapter
Series: AIPP Books, Methods
Published: December 2022
10.1063/9780735425422_006
EISBN: 978-0-7354-2542-2
ISBN: 978-0-7354-2540-8
.... Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), energy-dispersive x-ray analysis (EDAX), etc., are the primary characterization tools that follow the principle of electron diffraction. Earlier in 1967, Coates and co-workers collected electron channeling patterns (ECP—changes...
Book Chapter
Series: AIPP Books, Methods
Published: December 2022
0
EISBN: 978-0-7354-2542-2
ISBN: 978-0-7354-2540-8
... microscopy (TEM) of earth and planetary materials: A review ,” Mineral. Mag. 74 , 1 – 27 ( 2010 ). 10.1180/minmag.2010.074.1.1 Liu , Q. , Zhang , L. , Sun , H. , “ In situ observation of sodium dendrite growth and concurrent mechanical property measurements using...
Book Chapter
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425590_005
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
... Today, electron microscopy observation under electric field can also be achieved at an atomic scale. By combining in situ (S)TEM with the methodology explained in Sec. 5.4 even under electric fields, the lattice parameter can be measured with high accuracy. For example, it was reported...
Book Chapter
Series: AIPP Books, Principles
Published: March 2023
0
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
.... , Batson , P. E. , and Lupini , A. R. , “ Progress in aberration-corrected scanning transmission electron microscopy ,” J. Electron. Microscopy 50 , 177 – 185 ( 2001 ). 10.1093/jmicro/50.3.177 Dycus , J. H. , Harris , J. S. , Sang , X. , Fancher , C. M. , Findlay , S. D...
Book Chapter
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425590_003
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
... transmission electron microscopy (TEM), secondary electron microscopy (SEM), atomic force microscopy (AFM), or x-ray diffractometry (XRD) tool. During GaN growth on sapphire using MOVPE, it is common to initially deposit a GaN layer at relatively lower temperatures, known as the LT layer ( Amano et al...
Book Chapter
Series: AIPP Books, Methods
Published: December 2022
10.1063/9780735425422_010
EISBN: 978-0-7354-2542-2
ISBN: 978-0-7354-2540-8
... misorientation of two hexagons, as studied in Wang et al. (2013). Since the twist angles obtained in the CVD method are unknown, they must be identified using transmission electron microscopy (TEM) and scanning tunneling microscopy (STM). It is, however, possible to manipulate the twist angle...
Book
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425590
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
Book Chapter
Series: AIPP Books, Principles
Published: February 2023
10.1063/9780735425033_005
EISBN: 978-0-7354-2503-3
ISBN: 978-0-7354-2500-2
..., one is conventional TEM (CTEM) where incident electrons are mostly plane waves, and the other is scanning TEM (STEM) mode involving highly converged electron waves that provide a small probe that scans across the specimen. This difference leads to the difference in the contrast mechanism...
Book Chapter
Series: AIPP Books, Principles
Published: February 2023
10.1063/9780735425033_004
EISBN: 978-0-7354-2503-3
ISBN: 978-0-7354-2500-2
... exceeded 0.7 µm/h. Additionally, extremely smooth surface morphology was achieved on the (010) orientation, while ( 2 ¯ 01) showed a rough surface morphology in atomic force microscopy (AFM) and twin defects in transmission electron microscopy (TEM). Additionally (010) β...
Book Chapter
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425590_007
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
... planes (110) and (1 1 ¯ 0) are parallel to the substrate planes (100) and (010), respectively. It was observed that four domain variants resulted in two sets of twins and was corroborated with imaging and diffraction studies of transmission electron microscopy. The key point is that at low...
Book Chapter
Series: AIPP Books, Methods
Published: December 2022
10.1063/9780735425422_005
EISBN: 978-0-7354-2542-2
ISBN: 978-0-7354-2540-8
... and particular declaration of the sample need; for example, scanning electron microscopy (SEM) requires that the sample be conductive, and transmission electron microscopy (TEM) requires that the sample be as thin as feasible. When it comes to device characterization, it normally requires a lengthy manufacturing...
Book
Series: AIPP Books, Methods
Published: December 2022
10.1063/9780735425422
EISBN: 978-0-7354-2542-2
ISBN: 978-0-7354-2540-8
Book
Series: AIPP Books, Principles
Published: February 2023
10.1063/9780735425033
EISBN: 978-0-7354-2503-3
ISBN: 978-0-7354-2500-2
Book Chapter
Series: AIPP Books, Methods
Published: December 2022
10.1063/9780735425422_001
EISBN: 978-0-7354-2542-2
ISBN: 978-0-7354-2540-8
... microscopy (SEM), transmission electron microscopy (TEM), Raman spectroscopy, x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS), etc., have been widely used to characterize the 2D materials. Each technique has its own advantages and limitations. Therefore, combining different characterization...
Book Chapter
Series: AIPP Books, Principles
Published: February 2023
10.1063/9780735425033_008
EISBN: 978-0-7354-2503-3
ISBN: 978-0-7354-2500-2
...] and S2 corresponds to BaTiO3 as the field-plate oxide (BTO FP). The cross-sectional transmission electron microscopy (TEM) image depicts the field-plated region of the S1 structure. (b) Forward I–V characteristics and differential RON,sp of a β...
Book Chapter
Series: AIPP Books, Methods
Published: November 2022
10.1063/9780735424197_008
EISBN: 978-0-7354-2419-7
ISBN: 978-0-7354-2416-6
..., and some important techniques, such as atomic force microscopy (AFM), in situ transmission electron microscopy (TEM), and scanning electrochemical cell microscopy (SECCM), are offering invaluable insights into the processes occurring at and below the level of individual grains, but are regrettably...
Book Chapter
Series: AIPP Books, Principles
Published: February 2023
10.1063/9780735425033_012
EISBN: 978-0-7354-2503-3
ISBN: 978-0-7354-2500-2
... to EC–2.5 eV ( Varley et al., 2011 ; and Ingebrigtsen et al., 2019 ), close to what was measured by DLOS ( Johnson et al., 2019 ). In a later study using high-resolution transmission electron microscopy (HRTEM), Johnson et al. observed this same defect microstructure...
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