FIG. 19.1 Conceptual test development steps. More about this image found in Conceptual test development steps.

FIG. 8.7 Line where the mesh independence test was performed. More about this image found in Line where the mesh independence test was performed.

FIG. 8.8 Point where the time independence test was performed. More about this image found in Point where the time independence test was performed.

FIG. 8.9 Mesh independence test. More about this image found in Mesh independence test.

FIG. 8.10 Time independence test. More about this image found in Time independence test.

FIG. 16.1 Brandon's matrix category of manipulative hypothesis testing and examination questions about the electromagnetic spectrum. More about this image found in Brandon's matrix category of manipulative hypothesis testing and examinatio...

FIG. 1.7 Flowchart of the training, validation, and testing phases of the ANN day-ahead PV power forecasting model ( Theocharides et al., 2020 ). More about this image found in Flowchart of the training, validation, and testing phases of the ANN day-ah...

FIG. 6.11 The procedure of training, validation, and testing of the DCNN model. More about this image found in The procedure of training, validation, and testing of the DCNN model.

FIG. 6.14 Experimental tests at the University of Jijel (Algeria): (a) Faulty PV modules, (b) the corresponding IR image, (c) embedded program into the Raspberry Pi 4, and (d) displayed results: a case of dust accumulated test. More about this image found in Experimental tests at the University of Jijel (Algeria): (a) Faulty PV modu...

FIG. 13.5 Double pulse test (DPT) switching circuit (a) used to characterize hard-switching operation. Time-domain waveforms across DUT during operation (b) depicting the drain to source voltage (V_DS), the drain current (I_D) and an instance of gate current (I_G) alongside the gate double pulse train (pulse). The switching losses are the I_D–V_DS waveforms overlapping regions. More about this image found in Double pulse test (DPT) switching circuit (a) used to characterize hard-swi...

FIG. 8.4 ECDF vs TCDF derived from the KS test. The black line indicates the ECDF directly evaluated from the simulations, while the blue line indicates the theoretical CDF fitted as a Poisson process. More about this image found in ECDF vs TCDF derived from the KS test. The black line indicates the ECDF di...

FIG. 10.4 (a) Mean Integration of Memory Kernel (MIK) against lag time. (b) CK test on macrostate residence probability. (c) Root mean square errors (RMSEs) between the qMSM-predicted dynamics and MD simulations. More about this image found in (a) Mean Integration of Memory Kernel (MIK) against lag time. (b) CK test o...

FIG. 8.2 Several studies conducted on student learning have been aimed at establishing how students acquire a quantum view of phenomena using phenomenographic methods (top left) or quantum-classic index (top right). In both types of research, different types of questions are used, sometimes also u... More about this image found in Several studies conducted on student learning have been aimed at establishi...