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(a) Ionized doping concentration in different semiconductors with respect to the background doping considering compensation effect of acceptor-like impurities (Zhang and Speck, 2020). (b) Modified BFOM contour plot estimated from the on-resistance and breakdown field accounting ionized dopants. β-Ga2O3 shows the highest BFOM when material purity and dopant ionization efficiency are considered to estimate BFOM.
Published: February 2023
FIG. 1.6 (a) Ionized doping concentration in different semiconductors with respect to the background doping considering compensation effect of acceptor-like impurities ( Zhang and Speck, 2020 ). (b) Modified BFOM contour plot estimated from the on-resistance and breakdown field accounting ionized More about this image found in (a) Ionized doping concentration in different semiconductors with respect t...
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Prediction of inter-cyclic and intra-cyclic battery dynamics using OASIS as a two-timescale modeling approach (k = 1, …, m and s = 1, …, n denote operating cycle number and sampling time, respectively).
Published: March 2023
FIG. 10.9 Prediction of inter-cyclic and intra-cyclic battery dynamics using OASIS as a two-timescale modeling approach (k = 1, …, m and s = 1, …, n denote operating cycle number and sampling time, respectively). More about this image found in Prediction of inter-cyclic and intra-cyclic battery dynamics using OASIS as...
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Closed-loop state trajectories under P control with K = −3 with a depolarizing error parameter of 0.05 in the simulations labeled “1 Shot, Noise” and “10 Shots, Noise.” These two simulations use 1 shot and 10 shots, respectively.
Published: March 2023
FIG. 8.19 Closed-loop state trajectories under P control with K = −3 with a depolarizing error parameter of 0.05 in the simulations labeled “1 Shot, Noise” and “10 Shots, Noise.” These two simulations use 1 shot and 10 shots, respectively. More about this image found in Closed-loop state trajectories under P control with K = −3...
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Variation of the Raman shift of B3g(3) mode of YCO with respect to temperature and as a function of Bi composition.
Published: March 2023
FIG. 1.9 Variation of the Raman shift of B3g(3) mode of YCO with respect to temperature and as a function of Bi composition. More about this image found in Variation of the Raman shift of B3g...
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The magnified regions of various locations of (a) experimentally observed domain pattern of tetragonal BFO and the respective (b) theoretical observation from tetragonal BFO.
Published: March 2023
FIG. 7.13 The magnified regions of various locations of (a) experimentally observed domain pattern of tetragonal BFO and the respective (b) theoretical observation from tetragonal BFO. More about this image found in The magnified regions of various locations of (a) experimentally observed d...
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Circuit symbols for MOS transistor (a) p-channel MOS (PMOS); Vgs is the gate-to-source voltage; (b) n-channel MOS (PMOS); (c) CMOS inverted circuit symbol; VDD is the DC voltage applied to the drain terminal. Vin and Vout, respectively, are the input and output voltages, respectively, and d, g, and s denote the drain, gate, and source terminals, respectively.
Published: March 2023
and Vout, respectively, are the input and output voltages, respectively, and d, g, and s denote the drain, gate, and source terminals, respectively. More about this image found in Circuit symbols for MOS transistor (a) p-channel MOS (PMOS); V...
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(a) Substrate and film with lattice parameters as and a0, respectively, where as<a0. (b) Pseudomorphic growth with compressive strain. (c) Misfit dislocation of thin-film growth beyond critical thickness.
Published: March 2023
FIG. 3.13 (a) Substrate and film with lattice parameters a s and a 0 , respectively, where a s < a 0 . (b) Pseudomorphic growth with compressive strain. (c) Misfit dislocation of thin-film growth beyond critical thickness. More about this image found in (a) Substrate and film with lattice parameters a s and a 0...
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Microstructural evolution in a thin film system with AZ = 1. From top left, in the clockwise direction, the microstructures correspond to (non-dimensional) time units: t = 2600, t = 3000, t = 4000, and t = 11 700, respectively.
Published: March 2023
FIG. 8.10 Microstructural evolution in a thin film system with AZ = 1. From top left, in the clockwise direction, the microstructures correspond to (non-dimensional) time units: t = 2600, t = 3000, t = 4000, and t = 11 700, respectively. More about this image found in Microstructural evolution in a thin film system with AZ...
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Microstructural evolution in a thin film system with AZ=13. From top left, the microstructures correspond to (non-dimensional) time units: t = 9600, t = 11 400, t = 23 600 and t = 489 400, respectively.
Published: March 2023
FIG. 8.9 Microstructural evolution in a thin film system with A Z = 1 3 . From top left, the microstructures correspond to (non-dimensional) time units: t = 9600, t = 11 400, t = 23 600 and t = 489 400, respectively. More about this image found in Microstructural evolution in a thin film system with A Z = 1 3 ...
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(a) Low magnification TEM images on BT-CFO, (b) high magnification image of CFO/BCZT interface, (d) BCZT/CFO interface, and (c) and (d) magnified image of (b) and (e), respectively, showing lattice fringes across the interface.
Published: March 2023
FIG. 10.3 (a) Low magnification TEM images on BT-CFO, (b) high magnification image of CFO/BCZT interface, (d) BCZT/CFO interface, and (c) and (d) magnified image of (b) and (e), respectively, showing lattice fringes across the interface. More about this image found in (a) Low magnification TEM images on BT-CFO, (b) high magnification image of...
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