FIG. 6.13 Micrographs of symmetric lancet (a) before and (b) after release to measure inbuilt stress ( Bansal et al., 2015 ). More about this image found in Micrographs of symmetric lancet (a) before and (b) after release to measure...

FIG. 16.2 Brandon's matrix category of non-manipulative parameter measurement and examination questions about the electromagnetic spectrum. More about this image found in Brandon's matrix category of non-manipulative parameter measurement and exa...

FIG. 6.12 LabVIEW programming panel for temperature measurements. More about this image found in LabVIEW programming panel for temperature measurements.

FIG. 6.15 Thermal load measurements city path plan. More about this image found in Thermal load measurements city path plan.

FIG. 6.8 (a) Measured power and normal operation limits, (b) fault detection based on the operation limit approach. More about this image found in (a) Measured power and normal operation limits, (b) fault detection based o...

FIG. 3.9 The energy gaps measured at Γ and L valley (a) as a function of Sn content in Ge_(1−x)Sn_x alloy (b) as a function of in-plane biaxial compressive strain for in Ge_0.92Sn_0.08. As seen ∼6.5% Sn in Ge bring the Γ valley down to L valley, thus converting it to direct bandgap (a). Larger compressive strain (>0.32%) change the nature of the bandgap (direct to indirect) (b) ( Gupta et al., 2013a ). More about this image found in The energy gaps measured at Γ and L valley (a) as a functi...

FIG. 5.14 (a) Multi-frame averaged STEM image of silicon measured with [110] zone axis and histogram of inter-atomic distance along the (b) x and (c) y direction ( Yankovich et al., 2014 ). The scale bar in (a) is 400 pm. The error bars in (b) and (c) are the square root of the frequency, the curves are the best-fit normal distributions, and σ represents the standard deviations. Reproduced with permission from Yankovich et al., Nat. Commun. 5 , 4155 (2014). Copyright 2014 Springer Nature. More about this image found in (a) Multi-frame averaged STEM image of silicon measured with [110] zone axi...

FIG. 5.19 Selected-area diffraction pattern measured from PMN–PT ( Sato et al., 2014 ). Magnified (a) 3 ¯ 33 and (b) 005 spot measured from a region including nanodomains a and b. Magnified (c) 3 ¯ 3 3 ¯ and (d) 00 4 ¯ spot measured from a region including nanodomains c and d. (e) Magnified 2 2 ¯ 0 spot and (f) its splitting pattern measured from a region including nanodomains a–d. The triangles in (a)–(d) highlight the split of the spots. More about this image found in Selected-area diffraction pattern measured from PMN–PT ( Sato et al...

FIG. 6.4 Experimentally measured local piezoelectric displacement curves using pFM tip for (a) tetragonal, (b) mixed phase (tetragonal + rhombohedral), and (c) pure rhombohedral BFO films and (d)–(f) corresponding strain hysteresis loops obtained from the simulations. Effective d₃₃ for each condition is calculated from the slope of the linear part of the butterfly loop. More about this image found in Experimentally measured local piezoelectric displacement curves using pFM t...

FIG. 6.12 Micrographs of asymmetric lancet (a) before and (b) after release to measure inbuilt stress ( Bansal et al., 2016a , 2016b ). More about this image found in Micrographs of asymmetric lancet (a) before and (b) after release to measur...

FIG. 6.17 Simulated and measured RF performance of the RF MEMS Ohmic switch ( Bansal et al., 2019 ). More about this image found in Simulated and measured RF performance of the RF MEMS Ohmic switch ( Bansal ...

FIG. 6.45 Comparison of measured RF response of the SPDT switch with FEM simulation and lumped model ( Bansal et al., 2016a , 2016b). More about this image found in Comparison of measured RF response of the SPDT switch with FEM simulation a...

FIG. 13.2 (a) Equipment is prepared as a set that can easily be moved from one student to another. For the task under discussion, it consists of two containers with hot and cold water, a stopwatch, a measuring cylinder, two thermometers packed in their cases, and two empty containers. (b) The hot ... More about this image found in (a) Equipment is prepared as a set that can easily be moved from one studen...

FIG. 10.3 Model predictive control using the proposed OASIS algorithm. x_e represents the estimated concentration values and x_m represents the measured temperature values. More about this image found in Model predictive control using the proposed OASIS algorithm. x...

FIG. 8.15 Closed-loop system under proportional control for a linear process. The set-point and its comparison with the measurement are not represented in this diagram, but the set-point for x is 0. More about this image found in Closed-loop system under proportional control for a linear process. The set...

FIG. 10.8 (a) Schematic representing magnetic field-assisted PFM (b) topography image (cross mark shows the point where the measurement was taken). (c) shows d₃₃ measurements on the ME multilayer with periodicity n = 40 nm in the presence of both with and without a magnetic field (500 Oe). (d) Percentage increase in d₃₃ in the presence of a magnetic field. More about this image found in (a) Schematic representing magnetic field-assisted PFM (b) topography image...

FIG. 7.2 The context for the explosion question. The diagram illustrates how the array of porthole observers can be used to measure the distance between the locations at which the explosions occur. During the interviews, students were not shown this diagram—instead, the interviews were used to exp... More about this image found in The context for the explosion question. The diagram illustrates how the arr...

FIG. 5.18 DF-TEM images of (a) microdomain band and (b) lamellar-like nanodomain in PMN–PT. (c) In the schematic illustration of nanodomains in (b), a–d denote the domains of four different crystallographic orientations. (d) Selected-area diffraction pattern measured with the zone axis of [1 1 ¯ 0] ( Sato et al., 2014 ). More about this image found in DF-TEM images of (a) microdomain band and (b) lamellar-like nanodomain in P...

FIG. 5.2 HRTEM image of PZT/SRO interface ( Jia et al., 2007 ) showing the measured lattice parameters in the film and substrate. The thick arrow denotes the interface. d_IL and d_IS are the shift parameters as defined in Fig. 5.3(c) . Reproduced with permission from Jia et al., Nat. Mater.  6 , 64–69 (2007). Copyright 2007 Springer Nature. More about this image found in HRTEM image of PZT/SRO interface ( Jia et al., 2007 ) show...