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(a) Bulk periodic (tri-periodic) structure with 2D surface lattice (a1 × a2) that carries the same symmetry as bulk and (b) surface periodic (diperiodic) structure that has undergone transformation and results new 2D surface superstructure (b1 × b2) that carries the same symmetry as bulk.
Published: March 2023
FIG. 3.3 (a) Bulk periodic (tri-periodic) structure with 2D surface lattice (a1 × a2) that carries the same symmetry as bulk and (b) surface periodic (diperiodic) structure that has undergone transformation and results new 2D surface superstructure More about this image found in (a) Bulk periodic (tri-periodic) structure with 2D surface lattice (
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(a) Substrate and film with lattice parameters as and a0, respectively, where as<a0. (b) Pseudomorphic growth with compressive strain. (c) Misfit dislocation of thin-film growth beyond critical thickness.
Published: March 2023
FIG. 3.13 (a) Substrate and film with lattice parameters a s and a 0 , respectively, where a s < a 0 . (b) Pseudomorphic growth with compressive strain. (c) Misfit dislocation of thin-film growth beyond critical thickness. More about this image found in (a) Substrate and film with lattice parameters a s and a 0...
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(a) Lattice parameters, a and c, and (b) sublattice spacing, dIL and dIS, of PZT and SRO measured from HRTEM image (Jia et al., 2007). The dotted lines indicate the location of the PZT/SRO interface. The open and filled symbols denote the experimental and calculated values, respectively. (c) Schematic illustration of PZT and SRO unit cells with the definition of dIL and dIS. Panels (a) and (b) were reproduced with permission from Jia et al., Nat. Mater. 6, 64–69 (2007).
Published: March 2023
FIG. 5.3 (a) Lattice parameters, a and c, and (b) sublattice spacing, dIL and dIS, of PZT and SRO measured from HRTEM image ( Jia et al., 2007 ). The dotted lines indicate the location of the PZT/SRO interface. The open and filled More about this image found in (a) Lattice parameters, a and c, and (b) ...
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(a) ADF-STEM images and (b) lattice parameter (c) maps under 0 kV/cm and ±13.8 kV/cm. (c) Relationship between Δa and electric field and (d) relationship between Δc and electric field (Sato et al., 2020). Δa and Δc correspond to the difference in the lattice parameters a and c from their average at 0 kV/cm, respectively.
Published: March 2023
FIG. 5.21 (a) ADF-STEM images and (b) lattice parameter (c) maps under 0 kV/cm and ±13.8 kV/cm. (c) Relationship between Δa and electric field and (d) relationship between Δc and electric field ( Sato et al., 2020 ). Δa and Δc correspond More about this image found in (a) ADF-STEM images and (b) lattice parameter (c) maps und...
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RSM image of LSMO layer of ∼20 nm and BFO layer of ∼20 nm in which both are expected to be relaxed from that of the substrate lattice constant and possess the strain relaxed lattice constant.
Published: March 2023
FIG. 7.8 RSM image of LSMO layer of ∼20 nm and BFO layer of ∼20 nm in which both are expected to be relaxed from that of the substrate lattice constant and possess the strain relaxed lattice constant. More about this image found in RSM image of LSMO layer of ∼20 nm and BFO layer of ∼20 nm in which both are...
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Schematic of typical Ga-faced HEMT device structure. A nucleation layer is grown on the substrate for accommodating lattice mismatch. 2DEG is formed at the interface of the AlGaN/GaN interface on the GaN side. Thin GaN is formed at the top to make better contact.
Published: March 2023
FIG. 3.18 Schematic of typical Ga-faced HEMT device structure. A nucleation layer is grown on the substrate for accommodating lattice mismatch. 2DEG is formed at the interface of the AlGaN/GaN interface on the GaN side. Thin GaN is formed at the top to make better contact. More about this image found in Schematic of typical Ga-faced HEMT device structure. A nucleation layer is ...
Images
(a) Low magnification TEM images on BT-CFO, (b) high magnification image of CFO/BCZT interface, (d) BCZT/CFO interface, and (c) and (d) magnified image of (b) and (e), respectively, showing lattice fringes across the interface.
Published: March 2023
FIG. 10.3 (a) Low magnification TEM images on BT-CFO, (b) high magnification image of CFO/BCZT interface, (d) BCZT/CFO interface, and (c) and (d) magnified image of (b) and (e), respectively, showing lattice fringes across the interface. More about this image found in (a) Low magnification TEM images on BT-CFO, (b) high magnification image of...
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Diffraction peaks of (200) and (020) before and after strain annealing [(a)–(c)] the relationship between Tc and lattice constants at room temperature (d). The inset shows Tc vs orthorhombicity a/b; the solid line is the result of fitting by a function of (a/b)2 (Awaji et al., 2015).
Published: March 2023
FIG. 5.10 Diffraction peaks of (200) and (020) before and after strain annealing [(a)–(c)] the relationship between Tc and lattice constants at room temperature (d). The inset shows Tc vs orthorhombicity a/b; the solid More about this image found in Diffraction peaks of (200) and (020) before and after strain annealing [(a)...
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(a) RSM studies of tetragonal BFO of 20 nm grown on LSMO∼2 nm on LAO(001) substrates recorded in assymetric mode at 103¯ reflection and (b) RSM studies of LSMO ∼10 nm showing the smearing out of peak away from the planar lattice constant of LAO, indicating the beginning of strain relaxation.
Published: March 2023
FIG. 7.7 (a) RSM studies of tetragonal BFO of 20 nm grown on LSMO∼2 nm on LAO(001) substrates recorded in assymetric mode at 10 3 ¯ reflection and (b) RSM studies of LSMO ∼10 nm showing the smearing out of peak away from the planar lattice constant of LAO, indicating the beginning More about this image found in (a) RSM studies of tetragonal BFO of 20 nm grown on LSMO∼2 nm on LAO(001) s...
Images
HRTEM image of PZT/SRO interface (Jia et al., 2007) showing the measured lattice parameters in the film and substrate. The thick arrow denotes the interface. dIL and dIS are the shift parameters as defined in Fig. 5.3(c).
Published: March 2023
FIG. 5.2 HRTEM image of PZT/SRO interface ( Jia et al., 2007 ) showing the measured lattice parameters in the film and substrate. The thick arrow denotes the interface. dIL and dIS are the shift parameters as defined in Fig. 5.3(c) . Reproduced More about this image found in HRTEM image of PZT/SRO interface ( Jia et al., 2007 ) show...
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(a) Thermal expansion coefficient of monoatomic two-dimensional honeycomb lattices of graphene, silicene, germanene, and phosphorene and (b) strain-dependent phonon frequency of GaSe.
Published: March 2023
FIG. 2.8 (a) Thermal expansion coefficient of monoatomic two-dimensional honeycomb lattices of graphene, silicene, germanene, and phosphorene and (b) strain-dependent phonon frequency of GaSe. Reproduced with permission from Ge et al., Phys. Rev. B 94 , 165433 (2016). Copyright 2016 More about this image found in (a) Thermal expansion coefficient of monoatomic two-dimensional honeycomb l...
Book Chapter
Series: AIPP Books, Methods
Published: March 2023
10.1063/9780735425743_011
EISBN: 978-0-7354-2574-3
ISBN: 978-0-7354-2572-9
... can be beneficial in having an in-depth understanding of the delignification process ( Choi and Kwon, 2019b ). Specifically, an advanced combination of the kMC algorithm with the continuum models of heat and mass transfer allows us to capture multiscale events on a simulation lattice and predict...