FIG. 6.9 Structure of a DCNN for IR image classification topic. More about this image found in Structure of a DCNN for IR image classification topic.

FIG. 6.10 (a) Thermal camera (FLIR One), (b) PV array, and (c) IR thermography image of the PV array. More about this image found in (a) Thermal camera (FLIR One), (b) PV array, and (c) IR thermography image ...

FIG. 10.2 Cross-sectional SEM image of a BCZT/CFO/BCZT ME composite. More about this image found in Cross-sectional SEM image of a BCZT/CFO/BCZT ME composite.

FIG. 10.3 (a) Low magnification TEM images on BT-CFO, (b) high magnification image of CFO/BCZT interface, (d) BCZT/CFO interface, and (c) and (d) magnified image of (b) and (e), respectively, showing lattice fringes across the interface. More about this image found in (a) Low magnification TEM images on BT-CFO, (b) high magnification image of...

FIG. 10.7 (a) Scanning electron image of multilayer with 40 nm periodicity showing continuous columnar structure. (b) Backscatter image showing insignificant interdiffusion between CFO and BCZT. More about this image found in (a) Scanning electron image of multilayer with 40 nm periodicity showing co...

FIG. 10.8 (a) Schematic representing magnetic field-assisted PFM (b) topography image (cross mark shows the point where the measurement was taken). (c) shows d₃₃ measurements on the ME multilayer with periodicity n = 40 nm in the presence of both with and without a magnetic field (500 Oe). (d) Percentage increase in d₃₃ in the presence of a magnetic field. More about this image found in (a) Schematic representing magnetic field-assisted PFM (b) topography image...

FIG. 4.7 (a) Optical image of VO₂ beam with one side clamped on quartz substrate ( Fan et al., 2009 ); (b) optical image of VO₂ beam on bending from the edge, shows initiation of phase transition (arrow marked) ( Fan et al., 2009 ); and (c) force v/s bending displacement plot, shows the nucleation of R phase at the kinks (arrow marked) with displacement ( Fan et al., 2009 ). More about this image found in (a) Optical image of VO₂ beam with one side clamped on quartz su...

FIG. 5.2 HRTEM image of PZT/SRO interface ( Jia et al., 2007 ) showing the measured lattice parameters in the film and substrate. The thick arrow denotes the interface. d_IL and d_IS are the shift parameters as defined in Fig. 5.3(c) . Reproduced with permission from Jia et al., Nat. Mater.  6 , 64–69 (2007). Copyright 2007 Springer Nature. More about this image found in HRTEM image of PZT/SRO interface ( Jia et al., 2007 ) show...

FIG. 5.5 (a) Schematic illustration of ZnO bicrystal specimen and (b) HRTEM image of the GB in a ZnO bicrystal ( Sato et al., 2007 ). More about this image found in (a) Schematic illustration of ZnO bicrystal specimen and (b) HRTEM image of...

FIG. 5.6 (a) ADF-STEM image of an undoped ZnO [0001] Σ49 GB, (b) stable atomic arrangement obtained by simulation, and (c) schematic illustration highlighting the arrangement of SUs. Inter-atomic distance map for the SU arrangement of (d) β-α-bulk, (e) α-β-bulk, (f) β-β-bulk, and (g) α-α-bulk ( Sato et al., 2007 ). More about this image found in (a) ADF-STEM image of an undoped ZnO [0001] Σ49 GB, (b) stable atomic arran...

FIG. 5.7 ADF-STEM image of Pr-doped ZnO [0001] Σ49 GB and (b) inter-atomic distance map obtained from a stable atomic arrangement for the undoped GB by first-principles calculation ( Sato et al., 2009 ). The yellow open circle in (b) indicates the location of Pr segregation, as observed in (a). More about this image found in ADF-STEM image of Pr-doped ZnO [0001] Σ49 GB and (b) inter-atomic distance ...

FIG. 5.9 Schematic image of REBCO coated conductor. More about this image found in Schematic image of REBCO coated conductor.

FIG. 5.14 (a) Multi-frame averaged STEM image of silicon measured with [110] zone axis and histogram of inter-atomic distance along the (b) x and (c) y direction ( Yankovich et al., 2014 ). The scale bar in (a) is 400 pm. The error bars in (b) and (c) are the square root of the frequency, the curves are the best-fit normal distributions, and σ represents the standard deviations. Reproduced with permission from Yankovich et al., Nat. Commun. 5 , 4155 (2014). Copyright 2014 Springer Nature. More about this image found in (a) Multi-frame averaged STEM image of silicon measured with [110] zone axi...

FIG. 5.15 Schematic illustrations showing the image distortion correction scheme ( Sang and LeBeau, 2014 ; Dycus et al., 2015 ; Fujinaka et al., 2020 ; and Sato et al., 2020 ). (a) Intended scanned region, distorted scanned region due to scanning system, distorted scanned region due to scanning system and sample drift, and a crystal lattice in the regions. Distorted image (b) due to scanning system and sample drift and (c) due to scanning system. (d) Distortion-corrected image. The filled and open circles represent cation positions in a cubic peroskite-type oxide unit cell. More about this image found in Schematic illustrations showing the image distortion correction scheme ( Sa...

FIG. 5.17 (a) ADF-STEM image and (b) Ti-ion displacement map of SrTiO₃. (c) ADF-STEM image and (d) Pb-ion displacement map of PMN–PT. (e) ADF-STEM image and (f) Pb-ion displacement map of PMN. In (b), (d), and (f), the color and direction of the arrow indicate the direction of the displacements, and the length of the arrow indicates the magnitude of the displacements; the length of the arrow at the left bottom corresponds to a magnitude of 30 pm ( Sato et al., 2021 ). More about this image found in (a) ADF-STEM image and (b) Ti-ion displacement map of SrTiO₃. (c...

FIG. 7.8 RSM image of LSMO layer of ∼20 nm and BFO layer of ∼20 nm in which both are expected to be relaxed from that of the substrate lattice constant and possess the strain relaxed lattice constant. More about this image found in RSM image of LSMO layer of ∼20 nm and BFO layer of ∼20 nm in which both are...

FIG. 7.10 (a) The out-of-plane, (b) in-plane phase contrast image obtained from BFO with tetragonal phase grown on LSMO∼2 nm, and (c) the corresponding out-of-plane domain contrast obtained from the phase field modeling indicating only 〈001〉 polarization dominating the domain pattern. More about this image found in (a) The out-of-plane, (b) in-plane phase contrast image obtained from BFO w...

FIG. 7.11 (a) The out-of-plane (b) in-plane phase contrast image obtained from BFO with mixed phase (rhombohedral + tetragonal) grown on LSMO∼10 nm and (c) the corresponding out-of-plane domain contrast obtained from phase field modeling, indicating the components apart from 〈001〉 polarization eme... More about this image found in (a) The out-of-plane (b) in-plane phase contrast image obtained from BFO wi...

FIG. 7.12 (a) The out-of-plane and (b) in-plane phase contrast image obtained from BFO with rhombohedral phase grown on LSMO∼20 nm and (c) the corresponding out-of-plane domain contrast obtained from phase field modeling, representing more of a fractal domain as present in the rhombohedral phase o... More about this image found in (a) The out-of-plane and (b) in-plane phase contrast image obtained from BF...

FIG. 3.6 SEM image of M-shaped cantilevers. PZT layers can be seen on the backside of the cantilever. Reprinted with permission from Vyas et al., Micromachines 9 (5), 252 (2018). Copyright 2018 MDPI. More about this image found in SEM image of M-shaped cantilevers. PZT layers can be seen on the backside o...