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1-11 of 11 Search Results for
high-angle annular dark-field STEM (HAADF-STEM)
Book Chapter
Series: AIPP Books, Principles
Published: February 2023
10.1063/9780735425033_005
EISBN: 978-0-7354-2503-3
ISBN: 978-0-7354-2500-2
... column) at the position of the probe. Recent decades of STEM studies have demonstrated that the images formed with the electrons scattered at high angles (typically 100 mrad or larger), known as high-angle annular dark field (HAADF) images (which uses the annular detector shown in Fig. 5.7 ), can...
Book Chapter
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425590_005
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
... ). Because of the parallel illumination nature, the distortion caused by sample drift is expected to be smaller in HRTEM than in ADF-STEM. FIG. 5.1 Schematic illustrations of the basic principles of (a) HRTEM and (b) STEM. Annular dark-field scanning transmission electron microscopy ADF-STEM has become...
Images
in Combined APT and STEM Analyses
> Characterization of Defects and Deep Levels for GaN Power Devices
Published: December 2020
FIG. 5.11 (a) High-resolution high-angle annular dark-field (HAADF)-STEM image of InGaN/GaN MQWs with high-magnification image in (b). The In atomic maps showing three QWs and corresponding In compositions are shown in (c) and (d), respectively. The In compositional maps corresponding to plate-like regions are shown in (e)–(g). The color of the plate corresponds to the In composition. 60 Reprinted with permission from Y. Kanitani et al., Jpn. J. Appl. Phys. 55 (5S), 05FM04 (2016). Copyright 2016 The Japan Society of Applied Physics. More about this image found in (a) High-resolution high-angle annular dark-field (HAADF)-STEM image of InG...
Book
Series: AIPP Books, Principles
Published: February 2023
10.1063/9780735425033
EISBN: 978-0-7354-2503-3
ISBN: 978-0-7354-2500-2
Book
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425590
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
Images
in Carbon-based Nanocomposites for Advancements in Electrochemical Energy Storage
> Carbon NanostructuresFundamentals to Applications
Published: October 2021
FIG. 6.20 A: (a) Illustration of self-healing porous g-C3N4 /NiCo2S4 hybrid composite, (b) scanning electron micrograph of the hybrid composite, (c) transmission electron micrograph of CPCN-NSs, and (d) of hybrid structure. Reproduced with permission from Guo, W. et al., Electrochim. Acta 253 , 68–77 (2017). Copyright 2017 Elsevier. B: (a) TEM image of NiCo2S4 NSs/P-g-C3N4 with the SAED pattern shown in inset; (b) high-resolution TEM image; (c) high-angle annular dark field (HAADF)-STEM image; and (d–h) energy-dispersive X-ray spectroscopy (EDS) of C, N, Ni, Co, and S elements. Reproduced with permission from Li, Z. et al. Electrochim. Acta 231 , 617–625 (2017). Copyright 2017 Elsevier. C: (a) Schematic of synthesis of CN/CS composites; (b) CV plots of CN, CS, and CN/CS electrodes gained at a scan rate of 10 mV s−1; (c) galvanostatic discharge plots of CN, CS, and CN/CS recorded at 0.5 A g−1; and (d) cycling attributes and coulombic efficiency of the 50%-CN/CS electrode at 10 A g−1 (the charging–discharging traces of the first 10 cycles is shown in inset). Reproduced with permission from Jiang, D. et al., J. Alloys Compd. 706 , 41–47 (2017). Copyright 2017 Elsevier. More about this image found in A: (a) Illustration of self-healing porous g-C3N4 /Ni...
Book Chapter
Series: AIPP Books, Methods
Published: December 2020
10.1063/9780735422698_004
EISBN: 978-0-7354-2269-8
ISBN: 978-0-7354-2270-4
... at elevated temperatures. Thus, atomic resolution TEM allows determining defect structures and locations of dopants in extended defects. Mg doping free-carrier reduction transmission electron microscopy (TEM) annular dark-field scanning-TEM (ADF-STEM) high-angle annular dark-field STEM (HAADF-STEM...
Book Chapter
Series: AIPP Books, Principles
Published: October 2021
10.1063/9780735423114_006
EISBN: 978-0-7354-2311-4
ISBN: 978-0-7354-2308-4
... dark field (HAADF)-STEM image; and (d–h) energy-dispersive X-ray spectroscopy (EDS) of C, N, Ni, Co, and S elements. Reproduced with permission from Li, Z. et al. Electrochim. Acta 231 , 617–625 (2017). Copyright 2017 Elsevier. C: (a) Schematic of synthesis of CN/CS composites; (b) CV plots...
Book
Series: AIPP Books, Principles
Published: October 2021
10.1063/9780735423114
EISBN: 978-0-7354-2311-4
ISBN: 978-0-7354-2308-4
Book
Series: AIPP Books, Methods
Published: December 2020
10.1063/9780735422698
EISBN: 978-0-7354-2269-8
ISBN: 978-0-7354-2270-4
Book Chapter
Series: AIPP Books, Methods
Published: December 2020
10.1063/9780735422698_005
EISBN: 978-0-7354-2269-8
ISBN: 978-0-7354-2270-4
... grown along polar and semi-polar directions. FIG. 5.11 (a) High-resolution high-angle annular dark-field (HAADF)-STEM image of InGaN/GaN MQWs with high-magnification image in (b). The In atomic maps showing three QWs and corresponding In compositions are shown in (c) and (d), respectively...