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<span class="search-highlight">Block</span> diagram of sensor system: sensor array, amplifiers, multiplexer, and ...
Published: March 2023
FIG. 4.1 Block diagram of sensor system: sensor array, amplifiers, multiplexer, and filters integrated on a single chip. Reproduced with permission from Zimmermann et al., Sens. Actuators B 131 (1), 254–264 (2008). Copyright 2008 Elsevier. More about this image found in Block diagram of sensor system: sensor array, amplifiers, multiplexer, and ...
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(a) Strictly non-<span class="search-highlight">blocking</span> 2D N × N switch requiring N<sup>2</sup> single ax...
Published: March 2023
FIG. 7.23 (a) Strictly non-blocking 2D N × N switch requiring N2 single axis mirrors ( Stepanovsky, 2019 ; and Horsley et al., 2005 ). (b) A 3-axis micromirror array capable of N × N routing using 2 N mirrors ( Stepanovsky, 2019 ). (c) An N × N planar switch implemented using tunable directional couplers ( Han et al., 2015 ; and Stepanovsky, 2019 ). More about this image found in (a) Strictly non-blocking 2D N × N switch requiring N2 single ax...
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Structure of typical III-nitride LEDs. Device operation depends on the late...
Published: March 2023
FIG. 3.14 Structure of typical III-nitride LEDs. Device operation depends on the lateral current injection. The buffer layer is grown on a substrate at low temperatures to accommodate high lattice mismatch. (a) InGaN MQW-based LEDs for blue/green/yellow LEDs. AlGaN-based electron blocking layer is used to prevent injected electrons from escaping the active region. (b) AlGaN MQW-based UV LEDs. p-GaN is grown on p-AlGaN to prevent oxidation of aluminum. More about this image found in Structure of typical III-nitride LEDs. Device operation depends on the late...
Book Chapter
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425613_005
EISBN: 978-0-7354-2561-3
ISBN: 978-0-7354-2560-6
... system reliability evaluation. Several methods have accordingly been proposed to evaluate the reliability of such systems, including the Markov process, Monte Carlo simulation, reliability block diagram, and fault tree analysis. Markov process The stochastic behavior of a PV system can be regarded...
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(a) β-Ga<sub>2</sub>O<sub>3</sub> CAVET devices with Mg-implanted current b...
Published: February 2023
FIG. 1.20 (a) β-Ga2O3 CAVET devices with Mg-implanted current blocking layer ( Wong et al., 2018 ) and (b) β-Ga2O3 FinFET ( Hu et al., 2018a ). More about this image found in (a) β-Ga2O3 CAVET devices with Mg-implanted current b...
Book Chapter
Series: AIPP Books, Principles
Published: March 2023
0
EISBN: 978-0-7354-2561-3
ISBN: 978-0-7354-2560-6
....2020.2986409 Ahmed , W. , Hasan , O. , and Tahar , S. , “ Formalization of reliability block diagrams in higher-order logic ,” J. Appl. Logic   18 , 19 – 41 ( 2016 ). 10.1016/j.jal.2016.05.007 Altamimi , A. and Jayaweera , D. , “ Reliability of power systems with climate...
Book Chapter
Series: AIPP Books, Professional
Published: March 2023
10.1063/9780735425477_010
EISBN: 978-0-7354-2547-7
ISBN: 978-0-7354-2544-6
... was blocked if kinematics concepts were cued during physics problem solving (Study 3). The broader implications of these studies are that surface similarities and differences impact whether problem solvers can see the applicability of a known solution in a new context. At the same time, the practice...
Book Chapter
Series: AIPP Books, Professional
Published: March 2023
10.1063/9780735425514_024
EISBN: 978-0-7354-2551-4
ISBN: 978-0-7354-2548-4
... was accounted for by item blocking and a small number of isomorphic items in the instrument. Less work has explored other RBIs. Ramlo (2008) performed EFA on a small FMCE data set finding 3-factors as optimal for the post-test. Yang et al. (2019) performed a factor analysis of the FMCE using MIRT...
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Conception of the pinch rectifier or JBSD structure. The schematics illustr...
Published: February 2023
FIG. 8.20 Conception of the pinch rectifier or JBSD structure. The schematics illustrate (a) the current flow pattern in the forward conduction mode and (b) the depletion region in the reverse blocking mode. Reprinted with permission from Baliga, IEEE Electron Device Lett. 5 (6), 194–196 (1984... More about this image found in Conception of the pinch rectifier or JBSD structure. The schematics illustr...
Book Chapter
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425613_001
EISBN: 978-0-7354-2561-3
ISBN: 978-0-7354-2560-6
... The 3 × 1 string under partial shading condition: (a) string pattern, (b) characteristic of each module, and (c) the characteristic of the string ( Yousri et al., 2021 ). FIG. 1.12 (a) PV array configuration under PSC (D1 = bypass diode, D2 = blocking diode). (b) P–V curves of each group. (c...
Book Chapter
Series: AIPP Books, Methods
Published: March 2023
10.1063/9780735425743_005
EISBN: 978-0-7354-2574-3
ISBN: 978-0-7354-2572-9
... − ε w ) / ε w 1 + 4 ∗ L c / D c + 1 ] − 1 . Lc represents the cavity depth. Dc represents the cavity aperture diameter. For the sake of simplicity, no shading or blocking is assumed...