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annular dark-field scanning-TEM (ADF-STEM)

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Book Chapter
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425590_005
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
... ). Because of the parallel illumination nature, the distortion caused by sample drift is expected to be smaller in HRTEM than in ADF-STEM. FIG. 5.1 Schematic illustrations of the basic principles of (a) HRTEM and (b) STEM. Annular dark-field scanning transmission electron microscopy ADF-STEM has become...
Book
Book Cover Image
Series: AIPP Books, Principles
Published: March 2023
10.1063/9780735425590
EISBN: 978-0-7354-2559-0
ISBN: 978-0-7354-2556-9
Book Chapter
Series: AIPP Books, Methods
Published: December 2020
10.1063/9780735422698_004
EISBN: 978-0-7354-2269-8
ISBN: 978-0-7354-2270-4
... at elevated temperatures. Thus, atomic resolution TEM allows determining defect structures and locations of dopants in extended defects. Mg doping free-carrier reduction transmission electron microscopy (TEM) annular dark-field scanning-TEM (ADF-STEM) high-angle annular dark-field STEM (HAADF-STEM...
Book
Book Cover Image
Series: AIPP Books, Methods
Published: December 2020
10.1063/9780735422698
EISBN: 978-0-7354-2269-8
ISBN: 978-0-7354-2270-4