Chapter 8: Future Challenges: Defects in GaN Power Devices due to Fabrication Processes
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Published:2020
Tetsuo Narita, Tetsu Kachi, "Future Challenges: Defects in GaN Power Devices due to Fabrication Processes", Characterization of Defects and Deep Levels for GaN Power Devices, Tetsuo Narita, Tetsu Kachi
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