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Introduction to Surface Spectra of Oxides II
Surf. Sci. Spectra 5, 159–164 (1998)
https://doi.org/10.1116/1.1247835
UHV-Cleaved NiO (100), CoO (100), and MnO (100) by He II UPS
Surf. Sci. Spectra 5, 169–171 (1998)
https://doi.org/10.1116/1.1247847
UHV-Cleaved V2O3 (102) by He I and He II UPS and XPS
Surf. Sci. Spectra 5, 172–175 (1998)
https://doi.org/10.1116/1.1247848
Comparison of Ti 2p Core-Level Peaks from TiO2, Ti2O3, and Ti Metal, by XPS
Surf. Sci. Spectra 5, 179–181 (1998)
https://doi.org/10.1116/1.1247874
UHV-Cleaved Single Crystal Ti2O3 (102) by UPS and XPS
Surf. Sci. Spectra 5, 182–185 (1998)
https://doi.org/10.1116/1.1247849
UHV-Cleaved Single Crystal MgO(100) by Electron Energy Loss Spectroscopy
Surf. Sci. Spectra 5, 189–192 (1998)
https://doi.org/10.1116/1.1247838
Comparison of TiO2(110) Surfaces by XPS: Effects of UV Exposure, Electron Beam and Ion Beam Damage
Surf. Sci. Spectra 5, 193–202 (1998)
https://doi.org/10.1116/1.1247839
Core-level Binding Energies and Photoelectron Diffraction in Cleaved and Homoepitaxial MgO(100)
Surf. Sci. Spectra 5, 203–210 (1998)
https://doi.org/10.1116/1.1247840
Valence Band and Core-level Photoemission and Photoelectron Diffraction in Epitaxial Nb-Doped TiO2(110)
Surf. Sci. Spectra 5, 211–218 (1998)
https://doi.org/10.1116/1.1247841
Fe 2p Core-Level Spectra for Pure, Epitaxial α-Fe2O3(0001), γ-Fe2O3(001), and Fe3O4(001)
Surf. Sci. Spectra 5, 219–228 (1998)
https://doi.org/10.1116/1.1247873
Fuchs-Kliewer HREEL Phonon Spectrum of Single Crystal NiO(100) and of Ni(100)/NiO(111) and Ni(100)/NiO(100) Thin Films
Surf. Sci. Spectra 5, 229–234 (1998)
https://doi.org/10.1116/1.1247842
CoO(100) and CoO(100)/Co3O4 Fuchs-Kliewer Phonon Spectra
Surf. Sci. Spectra 5, 235–244 (1998)
https://doi.org/10.1116/1.1247843
Surface Phonon Spectra of V6O13(001) in the Metallic and Semiconducting Phase
Surf. Sci. Spectra 5, 248–251 (1998)
https://doi.org/10.1116/1.1247844
Surface Phonon Spectra of Mineral TiO2 Anatase (001) and (100)
Surf. Sci. Spectra 5, 252–256 (1998)
https://doi.org/10.1116/1.1247845
Analysis of nickel sulfoselenide materials by XPS
Melissa L. Meyerson, Samantha G. Rosenberg, et al.
XPS study of NiO thin films obtained by chemical vapor deposition
Gioele Pagot, Mattia Benedet, et al.
Magnesium sulfide powder analyzed by XPS
Noah Jäggi, Catherine A. Dukes