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Ru(0001) and SiO2/Ru(0001): XPS study
XPS characterization of Al2O3/ZnO ultrathin films grown by atomic layer deposition
Co(OH)2 powder characterized by x-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS)
Niobium ethoxide analyzed by XPS
Diphenylsiloxane–dimethylsiloxane copolymer: Optical functions from 191 to 1688 nm (0.735–6.491 eV) by spectroscopic ellipsometry
Issues
X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES)
XPS characterization of Mn2O3 nanomaterials functionalized with Ag and SnO2
Surf. Sci. Spectra 27, 024004 (2020)
https://doi.org/10.1116/6.0000331
MnO2 nanomaterials functionalized with Ag and SnO2: An XPS study
Surf. Sci. Spectra 27, 024005 (2020)
https://doi.org/10.1116/6.0000332
Molybdenum diselenide thin films grown by atomic layer deposition: An XPS analysis
Surf. Sci. Spectra 27, 024006 (2020)
https://doi.org/10.1116/6.0000354
1-Bromonaphthalene, by near-ambient pressure XPS
In Special Collection:
Focused Topic Collection: Near-ambient pressure x-ray photoelectron spectroscopy
Surf. Sci. Spectra 27, 024008 (2020)
https://doi.org/10.1116/6.0000422
Ru(0001) and SiO2/Ru(0001): XPS study
Surf. Sci. Spectra 27, 024009 (2020)
https://doi.org/10.1116/6.0000172
Surface Y2O3 layer formed on air exposed Y powder characterized by XPS
Surf. Sci. Spectra 27, 024010 (2020)
https://doi.org/10.1116/6.0000475
X-ray photoelectron spectroscopy data from lightly Pd doped TiO2 anatase nanoparticles
Surf. Sci. Spectra 27, 024011 (2020)
https://doi.org/10.1116/6.0000407
XPS characterization of Al2O3/ZnO ultrathin films grown by atomic layer deposition
Surf. Sci. Spectra 27, 024012 (2020)
https://doi.org/10.1116/6.0000585
Co(OH)2 powder characterized by x-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS)
Surf. Sci. Spectra 27, 024013 (2020)
https://doi.org/10.1116/6.0000318
Niobium ethoxide analyzed by XPS
Surf. Sci. Spectra 27, 024014 (2020)
https://doi.org/10.1116/6.0000472
Sildenafil tablet analyzed by XPS
Surf. Sci. Spectra 27, 024016 (2020)
https://doi.org/10.1116/6.0000609
Low-Energy Ion Scattering Spectroscopy (LEIS)
Secondary Ion Mass Spectrometry (SIMS)
Mass spectral database for TOF-SIMS of stable isotopes of Sr and Zr
Yue Zhao; Takeru Yoshida; Yuzuka Ohmori; Yuta Miyashita; Masato Morita; Tetsuo Sakamoto; Kotaro Kato; Ryohei Terabayashi; Volker Sonnenschein; Hideki Tomita; Toshihide Kawai; Takeo Okumura; Yukihiko Satou; Ikuo Wakaida; Masabumi Miyabe
Surf. Sci. Spectra 27, 025001 (2020)
https://doi.org/10.1116/6.0000367
Spectroscopic Ellipsometry (SE)
Diphenylsiloxane–dimethylsiloxane copolymer: Optical functions from 191 to 1688 nm (0.735–6.491 eV) by spectroscopic ellipsometry
Dhananjay I. Patel; Dhruv Shah; Tuhin Roychowdhury; Joshua I. Wheeler; Daniel H. Ess; James N. Hilfiker; Matthew R. Linford
Surf. Sci. Spectra 27, 026001 (2020)
https://doi.org/10.1116/6.0000249
Spectrophotometry (UV-Vis)
Tof-SIMS spectra of historical inorganic pigments
Caroline Bouvier, Sebastiaan Van Nuffel, et al.
XPS study of NiO thin films obtained by chemical vapor deposition
Gioele Pagot, Mattia Benedet, et al.
Magnesium sulfide powder analyzed by XPS
Noah Jäggi, Catherine A. Dukes