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Volume 26, Issue 2

December 2019

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Cover Image

Cover Image

ISSN 1055-5269

EISSN 1520-8575

In this Issue

X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES)
Low-Energy Ion Scattering Spectroscopy (LEIS)
Secondary Ion Mass Spectrometry (SIMS)
Spectroscopic Ellipsometry (SE)

X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES)

Zirconium oxide particles, by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Dhruv Shah; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024001 (2019) https://doi.org/10.1116/1.5086178

Abstract

View articletitled, Zirconium oxide particles, by near-ambient pressure XPS

Supplementary Material

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Ambient air, by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Dhananjay I. Patel; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024002 (2019) https://doi.org/10.1116/1.5099497

Abstract

View articletitled, Ambient air, by near-ambient pressure XPS

Supplementary Material

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Liquid water, by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Dhruv Shah; Dhananjay I. Patel; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024003 (2019) https://doi.org/10.1116/1.5119259

Abstract

View articletitled, Liquid water, by near-ambient pressure XPS

Supplementary Material

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Poly(l-lactic acid), by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Dhananjay I. Patel; Sebastian Noack; Charlotte D. Vacogne; Helmut Schlaad; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024004 (2019) https://doi.org/10.1116/1.5110309

Abstract

View articletitled, Poly(l-lactic acid), by near-ambient pressure XPS

Supplementary Material

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Coca-Cola, by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Dhruv Shah; Cody V. Cushman; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024005 (2019) https://doi.org/10.1116/1.5111037

Abstract

View articletitled, Coca-Cola, by near-ambient pressure XPS

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Coffee bean, by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Dhruv Shah; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024006 (2019) https://doi.org/10.1116/1.5110902

Abstract

View articletitled, Coffee bean, by near-ambient pressure XPS

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Ethylene glycol, by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Dhananjay I. Patel; James O’Tani; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024007 (2019) https://doi.org/10.1116/1.5119256

Abstract

View articletitled, Ethylene glycol, by near-ambient pressure XPS

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Uranium tetrafluoride (UF₄) powder analyzed by XPS

Xu Feng; Brendan D’Souza; Jinsuo Zhang

Surf. Sci. Spectra 26, 024008 (2019) https://doi.org/10.1116/1.5119805

Abstract

View articletitled, Uranium tetrafluoride (UF4) powder analyzed by XPS

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CHORUS

Printed and unprinted office paper, by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Dhruv Shah; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024009 (2019) https://doi.org/10.1116/1.5087893

Abstract

View articletitled, Printed and unprinted office paper, by near-ambient pressure XPS

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Poly(γ-benzyl l-glutamate), by near-ambient pressure XPS

In Special Collection: Near-Ambient Pressure x-ray Photoelectron Spectroscopy Characterization of Various Materials

Varun Jain; Joshua J. Wheeler; Daniel H. Ess; Sebastian Noack; Charlotte D. Vacogne; Helmut Schlaad; Stephan Bahr; Paul Dietrich; Michael Meyer; Andreas Thißen; Matthew R. Linford

Surf. Sci. Spectra 26, 024010 (2019) https://doi.org/10.1116/1.5109121

Abstract

View articletitled, Poly(γ-benzyl l-glutamate), by near-ambient pressure XPS

Supplementary Material

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2D bismuth telluride analyzed by XPS

Jeffrey R. Shallenberger; Christopher M. Smyth; Rafik Addou; Robert M. Wallace

Surf. Sci. Spectra 26, 024011 (2019) https://doi.org/10.1116/1.5120015

Abstract

View articletitled, 2D bismuth telluride analyzed by XPS

Supplementary Material

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CHORUS

Ruthenium thin film under methanation atmosphere analyzed by x-ray photoelectron spectroscopy

Jhonatan Rodriguez-Pereira; Sergio A. Rincón-Ortiz; Jorge H. Quintero-Orozco; Andrés C. García-Castro; Rogelio Ospina

Surf. Sci. Spectra 26, 024012 (2019) https://doi.org/10.1116/1.5119246

Abstract

View articletitled, Ruthenium thin film under methanation atmosphere analyzed by x-ray photoelectron spectroscopy

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TiZrN thin films under CO₂ and thermal treatment characterized by x-ray photoelectron spectroscopy

Jhonatan Rodriguez-Pereira; Jorge H. Quintero-Orozco; Rogelio Ospina

Surf. Sci. Spectra 26, 024013 (2019) https://doi.org/10.1116/1.5127759

Abstract

View articletitled, TiZrN thin films under CO2 and thermal treatment characterized by x-ray photoelectron spectroscopy

Supplementary Material

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2D topological insulator bismuth selenide analyzed by in situ XPS

Xinglu Wang; Christopher M. Smyth; Ava Khosravi; Christopher R. Cormier; Jeffrey R. Shallenberger; Rafik Addou; Robert M. Wallace

Surf. Sci. Spectra 26, 024014 (2019) https://doi.org/10.1116/1.5130891

Abstract

View articletitled, 2D topological insulator bismuth selenide analyzed by in situ XPS

Supplementary Material

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CHORUS

Low-Energy Ion Scattering Spectroscopy (LEIS)

Calcium fluoride and gold reference by high sensitivity-low energy ion scattering

Tahereh G. Avval; Cody V. Cushman; Philipp Brüner; Thomas Grehl; Hidde H. Brongersma; Matthew R. Linford

Surf. Sci. Spectra 26, 024201 (2019) https://doi.org/10.1116/1.5115065

Abstract

View articletitled, Calcium fluoride and gold reference by high sensitivity-low energy ion scattering

Supplementary Material

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Secondary Ion Mass Spectrometry (SIMS)

Monosaccharides: A ToF-SIMS reference spectra database. I. Negative polarity

Laetitia Bernard; Rowena Crockett; Maciej Kawecki

Surf. Sci. Spectra 26, 025001 (2019) https://doi.org/10.1116/1.5125102

Abstract

View articletitled, Monosaccharides: A ToF-SIMS reference spectra database. I. Negative polarity

Supplementary Material

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Monosaccharides: A ToF-SIMS reference spectra database. II. Positive polarity

Laetitia Bernard; Rowena Crockett; Maciej Kawecki

Surf. Sci. Spectra 26, 025002 (2019) https://doi.org/10.1116/1.5125103

Abstract

View articletitled, Monosaccharides: A ToF-SIMS reference spectra database. II. Positive polarity

Supplementary Material

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Mass spectra database of polymers for bismuth-cluster ToF-SIMS

Stefanie Kern; Christine Kern; Marcus Rohnke

Surf. Sci. Spectra 26, 025003 (2019) https://doi.org/10.1116/1.5096485

Abstract

View articletitled, Mass spectra database of polymers for bismuth-cluster ToF-SIMS

Supplementary Material

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Spectroscopic Ellipsometry (SE)

Optical function of atomic layer deposited alumina (0.5–41.0 nm) from 191 to 1688 nm by spectroscopic ellipsometry with brief literature review

Dhruv Shah; Dhananjay I. Patel; Tuhin Roychowdhury; Dylan Jacobsen; Jacob Erickson; Matthew R. Linford

Surf. Sci. Spectra 26, 026001 (2019) https://doi.org/10.1116/1.5114827

Abstract

View articletitled, Optical function of atomic layer deposited alumina (0.5–41.0 nm) from 191 to 1688 nm by spectroscopic ellipsometry with brief literature review

Supplementary Material

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X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES)

Zirconium oxide particles, by near-ambient pressure XPS

Ambient air, by near-ambient pressure XPS

Liquid water, by near-ambient pressure XPS

Poly(l-lactic acid), by near-ambient pressure XPS

Coca-Cola, by near-ambient pressure XPS

Coffee bean, by near-ambient pressure XPS

Ethylene glycol, by near-ambient pressure XPS

Uranium tetrafluoride (UF₄) powder analyzed by XPS

Printed and unprinted office paper, by near-ambient pressure XPS

Poly(γ-benzyl l-glutamate), by near-ambient pressure XPS

2D bismuth telluride analyzed by XPS

Ruthenium thin film under methanation atmosphere analyzed by x-ray photoelectron spectroscopy

TiZrN thin films under CO₂ and thermal treatment characterized by x-ray photoelectron spectroscopy

2D topological insulator bismuth selenide analyzed by in situ XPS

Low-Energy Ion Scattering Spectroscopy (LEIS)

Calcium fluoride and gold reference by high sensitivity-low energy ion scattering

Secondary Ion Mass Spectrometry (SIMS)

Monosaccharides: A ToF-SIMS reference spectra database. I. Negative polarity

Monosaccharides: A ToF-SIMS reference spectra database. II. Positive polarity

Mass spectra database of polymers for bismuth-cluster ToF-SIMS

Spectroscopic Ellipsometry (SE)

Optical function of atomic layer deposited alumina (0.5–41.0 nm) from 191 to 1688 nm by spectroscopic ellipsometry with brief literature review

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Issues

Cover Image

X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES)

Low-Energy Ion Scattering Spectroscopy (LEIS)

Secondary Ion Mass Spectrometry (SIMS)

Spectroscopic Ellipsometry (SE)

RSS

Resources

Explore

pubs.aip.org

Connect with AIP Publishing

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