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Volume 25, Issue 2
December 2018
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All Issues
ISSN 1055-5269
EISSN 1520-8575

X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES)

Surface characterization of clean SrTiO3(100) substrates by x-ray photoelectron spectroscopy
Arnaud P. Nono Tchiomo; Ganga Babu-Geetha; Emanuela Carleschi; Prosper Ngabonziza; Bryan P. Doyle
Surf. Sci. Spectra 25, 024001 (2018) https://doi.org/10.1116/1.5041734
View articletitled, Surface characterization of clean SrTiO<sub>3</sub>(100) substrates by x-ray photoelectron spectroscopy
Supplementary Material
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Composition analysis of Ta3N5/W18O49 nanocomposite through XPS
Daniel R. Jones; Michael E. A. Warwick; James D. McGettrick; Charles W. Dunnill
Surf. Sci. Spectra 25, 024002 (2018) https://doi.org/10.1116/1.5047860
View articletitled, Composition analysis of Ta<sub>3</sub>N<sub>5</sub>/W<sub>18</sub>O<sub>49</sub> nanocomposite through XPS
Supplementary Material
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Samarium thin films molecular plated from N,N-dimethylformamide characterized by XPS
Kristian G. Myhre; Jordan C. Delashmitt; Nathan J. Sims; Shelley M. Van Cleve; Rose A. Boll
Surf. Sci. Spectra 25, 024003 (2018) https://doi.org/10.1116/1.5052011
View articletitled, Samarium thin films molecular plated from <em>N</em>,<em>N</em>-dimethylformamide characterized by XPS
Supplementary Material
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CHORUS
XPS investigation of F-doped MnO2 nanosystems fabricated by plasma assisted-CVD
Filippo Gri; Lorenzo Bigiani; Alberto Gasparotto; Chiara Maccato; Davide Barreca
Surf. Sci. Spectra 25, 024004 (2018) https://doi.org/10.1116/1.5048908
View articletitled, XPS investigation of F-doped MnO<sub>2</sub> nanosystems fabricated by plasma assisted-CVD
Supplementary Material
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ZnO-based nanocomposites prepared by a vapor phase route, investigated by XPS
Lorenzo Bigiani; Alberto Gasparotto; Giorgio Carraro; Chiara Maccato; Davide Barreca
Surf. Sci. Spectra 25, 024005 (2018) https://doi.org/10.1116/1.5048909
View articletitled, ZnO-based nanocomposites prepared by a vapor phase route, investigated by XPS
Supplementary Material
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Secondary Ion Mass Spectrometry (SIMS)

Fatty acid and lipid reference spectra Editor’s Pick
Michael J. Taylor; Katherine Y. Zhang; Daniel J. Graham; Lara J. Gamble
Surf. Sci. Spectra 25, 025001 (2018) https://doi.org/10.1116/1.5063595
View articletitled, Fatty acid and lipid reference spectra
Supplementary Material
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CHORUS

Spectroscopic Ellipsometry (SE)

Polydimethylsiloxane: Optical properties from 191 to 1688 nm (0.735–6.491 eV) of the liquid material by spectroscopic ellipsometry
Tuhin Roychowdhury; Cody V. Cushman; R. A. Synowicki; Matthew R. Linford
Surf. Sci. Spectra 25, 026001 (2018) https://doi.org/10.1116/1.5046735
View articletitled, Polydimethylsiloxane: Optical properties from 191 to 1688 nm (0.735–6.491 eV) of the liquid material by spectroscopic ellipsometry
Supplementary Material
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Analysis of nickel sulfoselenide materials by XPS
Melissa L. Meyerson, Samantha G. Rosenberg, et al.
Mixed-cation, mixed-halide perovskite ToF-SIMS spectra
Margherita Taddei, Daniel J. Graham
HAXPES spectra of bulk WS2 with Cr Kα excitation
Alexandre Boyer, Olivier Renault, et al.
  • Online ISSN 1520-8575
  • Print ISSN 1055-5269

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