Issues

Focused Topic Issue: SIMS of Dicarboxylic Acids

Introduction

Dicarboxylic acids analyzed by time-of-flight secondary ion mass spectrometry (Introduction to parts 0 to VI)

Gustavo F. Trindade; Jose M. Ferreira, Jr.; Marie-Laure Abel; Mark A. Baker; John F. Watts

Surf. Sci. Spectra 24, 021301 (2017) https://doi.org/10.1116/1.5002110

Extract

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ion mass spectrometry (Introduction to parts 0 to VI)

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Articles

Dicarboxylic acids analyzed by time-of-flight secondary ion mass spectrometry. Part 0: Ethanedioic acid

Gustavo F. Trindade; Jose M. Ferreira, Jr.; Marie-Laure Abel; Mark A. Baker; John F. Watts

Surf. Sci. Spectra 24, 021401 (2017) https://doi.org/10.1116/1.5004981

Abstract

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ion mass spectrometry. Part 0: Ethanedioic acid

Supplementary Material

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Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part I: Propanedioic acid

Gustavo F. Trindade; Jose M. Ferreira, Jr.; Marie-Laure Abel; Mark A. Baker; John F. Watts

Surf. Sci. Spectra 24, 021402 (2017) https://doi.org/10.1116/1.5009203

Abstract

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part I: Propanedioic acid

Supplementary Material

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Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part II: Butanedioic acid

Gustavo F. Trindade; Jose M. Ferreira, Jr.; Marie-Laure Abel; Mark A. Baker; John F. Watts

Surf. Sci. Spectra 24, 021403 (2017) https://doi.org/10.1116/1.5010296

Abstract

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part II: Butanedioic acid

Supplementary Material

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Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part III: Pentanedioic acid

Gustavo F. Trindade; Jose M. Ferreira, Jr.; Marie-Laure Abel; Mark A. Baker; John F. Watts

Surf. Sci. Spectra 24, 021404 (2017) https://doi.org/10.1116/1.5016173

Abstract

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part III: Pentanedioic acid

Supplementary Material

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Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part IV: Hexanedioic acid

Gustavo F. Trindade; Jose M. Ferreira, Jr.; Marie-Laure Abel; Mark A. Baker; John F. Watts

Surf. Sci. Spectra 24, 021405 (2017) https://doi.org/10.1116/1.5016318

Abstract

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part IV: Hexanedioic acid

Supplementary Material

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Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part V: Heptanedioic acid

Gustavo F. Trindade; Jose M. Ferreira, Jr.; Marie-Laure Abel; Mark A. Baker; John F. Watts

Surf. Sci. Spectra 24, 021406 (2017) https://doi.org/10.1116/1.5016325

Abstract

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part V: Heptanedioic acid

Supplementary Material

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Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part VI: Oxanedioic acid

Gustavo F. Trindade; Jose M. Ferreira, Jr.; Marie-Laure Abel; Mark A. Baker; John F. Watts

Surf. Sci. Spectra 24, 021407 (2017) https://doi.org/10.1116/1.5016327

Abstract

View articletitled, Dicarboxylic acids analyzed by time-of-flight secondary ions mass spectrometry. Part VI: Oxanedioic acid

Supplementary Material

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X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy (XPS/AES)

Vanadium, niobium and tantalum by XPS

Pakpoom Buabthong; Natalie Becerra Stasiewicz; Slobodan Mitrovic; Nathan S. Lewis

Surf. Sci. Spectra 24, 024001 (2017) https://doi.org/10.1116/1.4998018

Abstract

View articletitled, Vanadium, niobium and tantalum by XPS

Supplementary Material

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CHORUS

Epitaxial SrRuO₃/SrTiO₃(100) analyzed using x-ray photoelectron spectroscopy

D. Eitan Barlaz; Richard T. Haasch; Edmund G. Seebauer

Surf. Sci. Spectra 24, 024002 (2017) https://doi.org/10.1116/1.4999599

Abstract

View articletitled, Epitaxial SrRuO₃/SrTiO₃(100) analyzed using x-ray photoelectron spectroscopy

Supplementary Material

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CHORUS

Cluster cleaned HOPG by XPS

David J. Morgan

Surf. Sci. Spectra 24, 024003 (2017) https://doi.org/10.1116/1.4993771

Abstract

View articletitled, Cluster cleaned HOPG by XPS

Supplementary Material

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Metallic antimony (Sb) by XPS

David J. Morgan

Surf. Sci. Spectra 24, 024004 (2017) https://doi.org/10.1116/1.4994636

Abstract

View articletitled, Metallic antimony (Sb) by XPS

Supplementary Material

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Spectroscopic Ellipsometry (SE)

Eagle XG^® glass: Optical constants from 196 to 1688 nm (0.735–6.33 eV) by spectroscopic ellipsometry

Cody V. Cushman; Brian I. Johnson; Andrew Martin; Barry M. Lunt; Nicholas J. Smith; Matthew R. Linford

Surf. Sci. Spectra 24, 026001 (2017) https://doi.org/10.1116/1.4997439

Abstract

View articletitled, Eagle XG^® glass: Optical constants from 196 to 1688 nm (0.735–6.33 eV) by spectroscopic ellipsometry

Supplementary Material

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Optical constants of SiO₂ from 196 to 1688 nm (0.735–6.33 eV) from 20, 40, and 60 nm films of reactively sputtered SiO₂ on Eagle XG^® glass by spectroscopic ellipsometry

Brian I. Johnson; Cody V. Cushman; Joseph Rowley; Barry M. Lunt; Nicholas J. Smith; Andrew Martin; Matthew R. Linford

Surf. Sci. Spectra 24, 026002 (2017) https://doi.org/10.1116/1.5008513

Abstract

View articletitled, Optical constants of SiO₂ from 196 to 1688 nm (0.735–6.33 eV) from 20, 40, and 60 nm films of reactively sputtered SiO₂ on Eagle XG^® glass by spectroscopic ellipsometry

Supplementary Material

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Optical properties of borosilicate glass from 3.1 mm to 210 nm (0.4 meV to 5.89 eV) by spectroscopic ellipsometry

Prakash Uprety; Maxwell M. Junda; Nikolas J. Podraza

Surf. Sci. Spectra 24, 026003 (2017) https://doi.org/10.1116/1.4997898

Abstract

View articletitled, Optical properties of borosilicate glass from 3.1 mm to 210 nm (0.4 meV to 5.89 eV) by spectroscopic ellipsometry

Supplementary Material

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Erratum