The ionic liquid 1,3-dimethyl-imidazolium-dimethylphosphate ([MMIM]+[DMP]−) was analyzed using (hard) x-ray photoelectron spectroscopy. Here, XPS and HAXPES spectra are shown in comparison. For the acquisition of the XPS spectra, monochromatic Al Kα radiation at 1486.6 eV was used, while for the acquisition of the HAXPES spectra, monochromatic Cr Kα radiation at 5414.8 eV was applied. Here, survey scans and high-resolution spectra of P 2p, P 2s, C 1s, O 1s, and N 1s for both methods and P 1s, P KL2,3L2,3, and P KL1L2,3 for HAXPES are shown.
Accession#: 01809, 01810, 01811, and 01812
Technique: XPS and XAES
Host Material: C7H15N2O4P ionic liquid
Instrument: ULVAC-PHI Quantes
Major Elements in Spectra: C, O, N, and P
Minor Elements in Spectra: None
Published Spectra: 21
Spectral Category: Comparison
INTRODUCTION
Ionic liquids (ILs) are organic salts that are liquid below temperatures of 100 °C. Due to their unique properties, they attract a lot of attraction in different fields like catalysis (Ref. 1), electrochemistry (Ref. 2), solar cells (Ref. 3), pharmaceutics, and medicine (Ref. 4).
Furthermore, they exhibit a high degree of lateral and depth homogeneity and have a well-defined stoichiometry, an extremely low vapor pressure, and high surface tension, which make them optimally suited as reference materials for the XPS analysis (Ref. 5).
Recently, spectra of the ionic liquid [PMIM]+[NTf2]− were published (Refs. 6 and 7) showing the suitability as reference of this material. In this work, the ionic liquid 1,3-dimethyl-imidazolium dimethyl phosphate ([MMIM]+[DMP]−) was analyzed, which is a vacuum ionic liquid with high thermal and hydrolytic stabilities (Ref. 8) consisting of C, O, N, and P. A lab-based ULVAC-PHI Quantes system equipped with a monochromatic Al Kα (at 1486.6 eV) and a Cr Kα x-ray source (at 5414.8 eV) was used for the measurements. This instrument allows a comparison of XPS and HAXPES data. The use of XPS detects photoemission from about 10 nm depths of the sample, while the detection depth of HAXPES is about three times as deep. This leads to a minimization of surface contamination effects. It is also possible to detect peaks at higher binding energy with HAXPES, here, e.g., the P 1s and the Auger peaks, due to the higher energy of the Cr Kα source compared to Al Kα.
Survey and high-resolution spectra are shown in this work. The spectra were obtained using monochromatic Al Kα and Cr Kα x-ray sources at 1486.6 and 5414.8 eV. High-resolution spectra of C 1s, O 1s, N 1s, P 2p, P 1s, P 2s, P KL2,3L2,3, and P KL1L2,3 are shown.
XPS and HAXPES results agree broadly. The element composition measured in this study is in close agreement with the expected stoichiometric ratio of [MMIM]+[DMP]− with an average relative deviation of 3.6%, indicating that the sample is homogeneous in the information depth of HAXPES (Refs. 9 and 10).
SPECIMEN DESCRIPTION (ACCESSION # 01809)
Host Material: C7H15N2O4P ionic liquid
CAS Registry #: 654058-04-5
Host Material Characteristics: Homogeneous; liquid; unknown crystallinity; unknown conductivity; organic compound; other
Chemical Name: 1,3-Dimethyl-imidazolium dimethyl phosphate ([MMIM]+[DMP]−)
Source: Merck KGaA, Darmstadt, Germany
Host Composition: C7H15N2O4P
Form: Ionic liquid
Structure: Ionic liquid
History and Significance: [MMIM]+[DMP]− is commercially available from Merck.
As Received Condition: In a bottle
Analyzed Region: Same as the host material
Ex Situ Preparation/Mounting: In a sample holder, which was mounted on a platen using an insulating double-sided tape, a drop of approx. 5 μl of the ionic liquid was filled in. This sample was stored in the intro chamber of the spectrometer at ∼10−5 Pa for 7 days to remove vapors before the measurement started.
In Situ Preparation: None
Charge Control: Low-energy electrons (1 eV, filament 1.1 A) and low-energy ions (10 eV, 5 mA emission)
Temp. During Analysis: 300 K
Pressure During Analysis: <10−6 Pa
Pre-analysis Beam Exposure: 0 s
SPECIMEN DESCRIPTION (ACCESSION # 01810)
Host Material: Au
CAS Registry #: 7440-57-5
Host Material Characteristics: Homogeneous; solid; polycrystalline; conductor; metal; other
Chemical Name: Au
Source: Alfa Aesar
Host Composition: Au
Form: Solid foil
Structure: Face centered cubic
History and Significance: The calibration sample was mounted and provided by the manufacturer of the spectrometer (ULVAC PHI).
As Received Condition: Mounted foil
Analyzed Region: Same as the host material
Ex Situ Preparation/Mounting: The foil was mounted on a sample holder on a platen by the manufacturer. This platen did not leave the vacuum chamber of the spectrometer for several months.
In Situ Preparation: The Au foil was sputtered with 4 kV with an Argon ion gun over a 2 × 2 mm2 area for 5 min before the measurement to remove surface contamination.
Charge Control: Low-energy electrons (1 eV, filament 1.1 A) and low-energy ions (10 eV, 5 mA emission)
Temp. During Analysis: 300 K
Pressure During Analysis: <10−6 Pa
Pre-analysis Beam Exposure: 0 s
SPECIMEN DESCRIPTION (ACCESSION # 01811)
Host Material: Ag
CAS Registry #: 7440-22-4
Host Material Characteristics: Homogeneous; solid; polycrystalline; conductor; metal; other
Chemical Name: Ag
Source: Alfa Aesar
Host Composition: Ag
Form: Solid foil
Structure: Face centered cubic
History and Significance: The calibration sample was mounted and provided by the manufacturer of the spectrometer, ULVAC PHI.
As Received Condition: Mounted foil
Analyzed Region: Same as the host material
Ex Situ Preparation/Mounting: The foil was mounted on a sample holder on a platen by the manufacturer. This platen did not leave the vacuum chamber of the spectrometer for several months.
In Situ Preparation: The Ag foil was sputtered with 4 kV with an Argon ion gun over a 2 × 2 mm2 area for 5 min before the measurement to remove surface contamination.
Charge Control: Low-energy electrons (1 eV, filament 1.1 A) and low-energy ions (10 eV, 5 mA emission)
Temp. During Analysis: 300 K
Pressure During Analysis: <10−6 Pa
Pre-analysis Beam Exposure: 0 s
SPECIMEN DESCRIPTION (ACCESSION # 01812)
Host Material: Cu0
CAS Registry #: 7440-50-8
Host Material Characteristics: Homogeneous; solid; polycrystalline; conductor; metal; other
Chemical Name: Cu
Source: Alfa Aesar
Host Composition: Cu
Form: Solid foil
Structure: Face centered cubic
History and Significance: The calibration sample was mounted and provided by the manufacturer of the spectrometer, ULVAC PHI.
As Received Condition: Mounted foil
Analyzed Region: Same as the host material
Ex Situ Preparation/Mounting: The foil was mounted on a sample holder on a platen by the manufacturer. This platen did not leave the vacuum chamber of the spectrometer for several months.
In Situ Preparation: The Cu foil was sputtered with 4 kV with an Argon ion gun over a 2 × 2 mm2 area for 5 min before the measurement to remove surface contamination.
Charge Control: Low-energy electrons (1 eV, filament 1.1 A) and low-energy ions (10 eV, 5 mA emission)
Temp. During Analysis: 300 K
Pressure During Analysis: <10−6 Pa
Pre-analysis Beam Exposure: 0 s
INSTRUMENT DESCRIPTION
Manufacturer and Model: ULVAC-PHI Quantes
Analyzer Type: Spherical sector
Detector: Multichannel resistive plate
Number of Detector Elements: 32
INSTRUMENT PARAMETERS COMMON TO ALL SPECTRA
Spectrometer
Analyzer Mode: Constant pass energy
Throughput (T = EN): The energy dependence can be modeled using the following equation: , where a and b are constants, Ep is the pass energy, A is the peak area, and R is the retard ratio equal to E/Ep, where E is the kinetic energy. Three spectral regions are recorded on a sputter cleaned sample at different pass energies. The values of a and b are then determined by a linear least square fit of the data applying the equation described above.
Excitation Source Window: Al
Excitation Source: Al Kα and Cr Kα monochromatic
Source Energy: 1486.6 and 5414.8 eV
Source Strength: 24.0 and 51.4 W
Source Beam Size: 100 × 100 μm2
Signal Mode: Multichannel direct
Geometry
Incident Angle: Al: 0°, Cr: 22°
Source-to-Analyzer Angle: Al: 45°, Cr: 49°
Emission Angle: 45°
Specimen Azimuthal Angle: 0°
Acceptance Angle from Analyzer Axis: 0°
Analyzer Angular Acceptance Width: 20° × 20°
Ion Gun
Manufacturer and Model: ULVAC-PHI Quantes
Energy: 10 eV
Current: 5 mA
Current Measurement Method: Biased stage
Sputtering Species: Ar
Spot Size (unrastered): 100 μm
Raster Size: N/A
Incident Angle: 45°
Polar Angle: 45°
Azimuthal Angle: 45°
Comment: The E-Gun was used for charge neutralization.
DATA ANALYSIS METHOD
Energy Scale Correction: The energy scale shift was calculated by setting the C 1s binding energy to 284.80 eV. The XPS and HAXPES high-resolution spectra of the C 1s peak give a position of 283.97 and 284.22 eV; therefore, the correction shift is 0.83 eV for XPS and 0.58 eV for HAXPES.
Recommended Energy Scale Shift: XPS: 0.83 eV; HAXPES: 0.58 eV for binding energy (photoelectron spectra) and −0.58 eV for kinetic energy (Auger electron spectra)
Peak Shape and Background Method: The inbuilt Gaussian–Lorentzian peak shapes routine of MultiPak and a Shirley background method were used.
Quantitation Method: For Quantification, the PHI MultiPak software version 9.9.2 was used applying a nonlinear least square routine (Ref. 11) with relative empirical sensitivity factors that were provided by the manufacturer.
SPECTRAL FEATURES TABLE
Spectrum ID # . | Element/Transition . | Peak Energy (eV) . | Peak Width FWHM (eV) . | Peak Area (eV × cts/s) . | Sensitivity Factor . | Concentration (at. %) . | Peak Assignment . |
---|---|---|---|---|---|---|---|
01809-02 | C 1s | 284.80 | 1.47 | 7073 | 0.314 | 49.7 | C7H15N2O4P |
01809-03 | O 1s | 528.79 | 1.29 | 4381 | 0.733 | 29.3 | C7H15N2O4P |
01809-03 | O 1s | 531.03 | 1.29 | 4711 | 0.733 | … | C7H15N2O4P |
01809-04 | N 1s | 400.17 | 1.15 | 3144 | 0.499 | 14.0 | C7H15N2O4P |
01809-05 | P 2p | 131.76 | 1.41 | 1231 | 0.525 | 7.0 | C7H15N2O4P |
01809-06 | P 2s | 188.82 | 2.19 | 1299 | 0.380 | … | C7H15N2O4P |
01809-08 | C 1s | 284.80 | 1.47 | 148 | 0.199 | 48.6 | C7H15N2O4P |
01809-09 | O 1s | 528.75 | 1.45 | 139 | 0.589 | 28.8 | C7H15N2O4P |
01809-09 | O 1s | 530.98 | 1.45 | 148 | 0.589 | … | C7H15N2O4P |
01809-10 | N 1s | 400.15 | 1.36 | 85 | 0.331 | 15.4 | C7H15N2O4P |
01809-11 | P 2p | 131.15 | 1.34 | 20 | 0.156 | … | C7H15N2O4P |
01809-12 | P 2s | 188.67 | 2.15 | 55 | 0.450 | … | C7H15N2O4P |
01809-13 | P 1s | 2145.66 | 1.56 | 874 | 5.136 | 7.1 | C7H15N2O4P |
01809-14a | P KL2,3L2,3 | 1852.05 | 1.41 | 345 | … | … | C7H15N2O4P |
01809-15a | P KL1L2,3 | 1787.35 | 3.02 | 82 | … | … | C7H15N2O4P |
Spectrum ID # . | Element/Transition . | Peak Energy (eV) . | Peak Width FWHM (eV) . | Peak Area (eV × cts/s) . | Sensitivity Factor . | Concentration (at. %) . | Peak Assignment . |
---|---|---|---|---|---|---|---|
01809-02 | C 1s | 284.80 | 1.47 | 7073 | 0.314 | 49.7 | C7H15N2O4P |
01809-03 | O 1s | 528.79 | 1.29 | 4381 | 0.733 | 29.3 | C7H15N2O4P |
01809-03 | O 1s | 531.03 | 1.29 | 4711 | 0.733 | … | C7H15N2O4P |
01809-04 | N 1s | 400.17 | 1.15 | 3144 | 0.499 | 14.0 | C7H15N2O4P |
01809-05 | P 2p | 131.76 | 1.41 | 1231 | 0.525 | 7.0 | C7H15N2O4P |
01809-06 | P 2s | 188.82 | 2.19 | 1299 | 0.380 | … | C7H15N2O4P |
01809-08 | C 1s | 284.80 | 1.47 | 148 | 0.199 | 48.6 | C7H15N2O4P |
01809-09 | O 1s | 528.75 | 1.45 | 139 | 0.589 | 28.8 | C7H15N2O4P |
01809-09 | O 1s | 530.98 | 1.45 | 148 | 0.589 | … | C7H15N2O4P |
01809-10 | N 1s | 400.15 | 1.36 | 85 | 0.331 | 15.4 | C7H15N2O4P |
01809-11 | P 2p | 131.15 | 1.34 | 20 | 0.156 | … | C7H15N2O4P |
01809-12 | P 2s | 188.67 | 2.15 | 55 | 0.450 | … | C7H15N2O4P |
01809-13 | P 1s | 2145.66 | 1.56 | 874 | 5.136 | 7.1 | C7H15N2O4P |
01809-14a | P KL2,3L2,3 | 1852.05 | 1.41 | 345 | … | … | C7H15N2O4P |
01809-15a | P KL1L2,3 | 1787.35 | 3.02 | 82 | … | … | C7H15N2O4P |
The P KL2,3L2,3 and the P KL1L2,3 peak energies are listed as kinetic energy.
ANALYZER CALIBRATION TABLE
Spectrum ID # . | Element/ Transition . | Peak Energy (eV) . | Peak Width FWHM (eV) . | Peak Area (eV × cts/s) . | Sensitivity Factor . | Concentration (at. %) . | Peak Assignment . |
---|---|---|---|---|---|---|---|
01810-01 | Au 4f7/2 | 84.1 | 2.17 | 392 520 | 3.849 | … | XPS Au |
01811-01 | Ag 3d5/2 | 368.4 | 1.70 | 470 847 | 3.742 | … | XPS Ag |
01812-01 | Cu 2p3/2 | 932.7 | 2.00 | 396 795 | 2.626 | … | XPS Cu |
01810-02 | Au 4f7/2 | 83.9 | 2.17 | 7 293 | 1.103 | … | HAXPES Au |
01811-02 | Ag 3d5/2 | 368.0 | 1.97 | 10 340 | 1.996 | … | HAXPES Ag |
01812-02 | Cu 2p3/2 | 932.5 | 2.15 | 24 495 | 3.829 | … | HAXPES Cu |
Spectrum ID # . | Element/ Transition . | Peak Energy (eV) . | Peak Width FWHM (eV) . | Peak Area (eV × cts/s) . | Sensitivity Factor . | Concentration (at. %) . | Peak Assignment . |
---|---|---|---|---|---|---|---|
01810-01 | Au 4f7/2 | 84.1 | 2.17 | 392 520 | 3.849 | … | XPS Au |
01811-01 | Ag 3d5/2 | 368.4 | 1.70 | 470 847 | 3.742 | … | XPS Ag |
01812-01 | Cu 2p3/2 | 932.7 | 2.00 | 396 795 | 2.626 | … | XPS Cu |
01810-02 | Au 4f7/2 | 83.9 | 2.17 | 7 293 | 1.103 | … | HAXPES Au |
01811-02 | Ag 3d5/2 | 368.0 | 1.97 | 10 340 | 1.996 | … | HAXPES Ag |
01812-02 | Cu 2p3/2 | 932.5 | 2.15 | 24 495 | 3.829 | … | HAXPES Cu |
GUIDE TO FIGURES
Spectrum (Accession) # . | Spectral Region . | Voltage Shifta . | Multiplier . | Baseline . | Comment # . |
---|---|---|---|---|---|
01809-01 | Survey | −0.83 | 1 | 0 | 1 |
01809-02 | C 1s | −0.83 | 1 | 0 | 1 |
01809-03 | O 1s | −0.83 | 1 | 0 | 1 |
01809-04 | N 1s | −0.83 | 1 | 0 | 1 |
01809-05 | P 2p | −0.83 | 1 | 0 | 1 |
01809-06 | P 2s | −0.83 | 1 | 0 | 1 |
01809-07 | Survey | −0.58 | 1 | 0 | 2 |
01809-08 | C 1s | −0.58 | 1 | 0 | 2 |
01809-09 | O 1s | −0.58 | 1 | 0 | 2 |
01809-10 | N 1s | −0.58 | 1 | 0 | 2 |
01809-11 | P 2p | −0.58 | 1 | 0 | 2 |
01809-12 | P 2s | −0.58 | 1 | 0 | 2 |
01809-13 | P 1s | −0.58 | 1 | 0 | 2 |
01809-14 | P KL2,3L2,3 | +0.58 | 1 | 0 | 2 |
01809-15 | P KL1L2,3 | +0.58 | 1 | 0 | 2 |
01810-01 | Survey (Au) | … | 1 | 0 | 3 |
01811-01 | Survey (Ag) | … | 1 | 0 | 3 |
01812-01 | Survey (Cu) | … | 1 | 0 | 3 |
01810-02 | Survey (Au) | … | 1 | 0 | 4 |
01811-02 | Survey (Ag) | … | 1 | 0 | 4 |
01812-02 | Survey (Cu) | … | 1 | 0 | 4 |
Spectrum (Accession) # . | Spectral Region . | Voltage Shifta . | Multiplier . | Baseline . | Comment # . |
---|---|---|---|---|---|
01809-01 | Survey | −0.83 | 1 | 0 | 1 |
01809-02 | C 1s | −0.83 | 1 | 0 | 1 |
01809-03 | O 1s | −0.83 | 1 | 0 | 1 |
01809-04 | N 1s | −0.83 | 1 | 0 | 1 |
01809-05 | P 2p | −0.83 | 1 | 0 | 1 |
01809-06 | P 2s | −0.83 | 1 | 0 | 1 |
01809-07 | Survey | −0.58 | 1 | 0 | 2 |
01809-08 | C 1s | −0.58 | 1 | 0 | 2 |
01809-09 | O 1s | −0.58 | 1 | 0 | 2 |
01809-10 | N 1s | −0.58 | 1 | 0 | 2 |
01809-11 | P 2p | −0.58 | 1 | 0 | 2 |
01809-12 | P 2s | −0.58 | 1 | 0 | 2 |
01809-13 | P 1s | −0.58 | 1 | 0 | 2 |
01809-14 | P KL2,3L2,3 | +0.58 | 1 | 0 | 2 |
01809-15 | P KL1L2,3 | +0.58 | 1 | 0 | 2 |
01810-01 | Survey (Au) | … | 1 | 0 | 3 |
01811-01 | Survey (Ag) | … | 1 | 0 | 3 |
01812-01 | Survey (Cu) | … | 1 | 0 | 3 |
01810-02 | Survey (Au) | … | 1 | 0 | 4 |
01811-02 | Survey (Ag) | … | 1 | 0 | 4 |
01812-02 | Survey (Cu) | … | 1 | 0 | 4 |
Voltage shift of the archived (as-measured) spectrum relative to the printed figure. The figure reflects the recommended energy scale correction due to calibration correction, sample charging, flood gun, or other phenomenon.
1. C7H15N2O4C ionic liquid XPS
2. C7H15N2O4C ionic liquid HAXPES
3. Calibration XPS
4. Calibration HAXPES
Accession #: | 01809-01 |
Host Material: | C7H15N2O4P ionic liquid |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 3 |
Effective Detector Width: | 31 eV |
Accession #: | 01809-01 |
Host Material: | C7H15N2O4P ionic liquid |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 3 |
Effective Detector Width: | 31 eV |
Accession #: | 01809-01 |
Host Material: | C7H15N2O4P ionic liquid |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 3 |
Effective Detector Width: | 31 eV |
Accession #: | 01809-01 |
Host Material: | C7H15N2O4P ionic liquid |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 3 |
Effective Detector Width: | 31 eV |
Accession #: 01809-02
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: C 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 1182 s
Total Elapsed Time: 1302 s
Number of Scans: 15
Effective Detector Width: 6.2 eV
Accession #: 01809-02
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: C 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 1182 s
Total Elapsed Time: 1302 s
Number of Scans: 15
Effective Detector Width: 6.2 eV
Accession #: 01809-03
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: O 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 1182 s
Total Elapsed Time: 1302 s
Number of Scans: 15
Effective Detector Width: 6.2 eV
Accession #: 01809-03
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: O 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 1182 s
Total Elapsed Time: 1302 s
Number of Scans: 15
Effective Detector Width: 6.2 eV
Accession #: 01809-04
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: N 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 2358 s
Total Elapsed Time: 2604 s
Number of Scans: 30
Effective Detector Width: 6.2 eV
Accession #: 01809-04
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: N 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 2358 s
Total Elapsed Time: 2604 s
Number of Scans: 30
Effective Detector Width: 6.2 eV
Accession #: 01809-05
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: P 2p
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 4716 s
Total Elapsed Time: 5208 s
Number of Scans: 60
Effective Detector Width: 6.2 eV
Accession #: 01809-05
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: P 2p
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 4716 s
Total Elapsed Time: 5208 s
Number of Scans: 60
Effective Detector Width: 6.2 eV
Accession #: 01809-06
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: C 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 5898 s
Total Elapsed Time: 6510 s
Number of Scans: 75
Effective Detector Width: 6.2 eV
Accession #: 01809-06
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: C 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 24.0 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 0°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 5898 s
Total Elapsed Time: 6510 s
Number of Scans: 75
Effective Detector Width: 6.2 eV
Accession #: | 01809-07 |
Host Material: | C7H15N2O4P ionic liquid |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 25 158 s |
Total Elapsed Time: | 27 672 s |
Number of Scans: | 5 |
Effective Detector Width: | 31 eV |
Accession #: | 01809-07 |
Host Material: | C7H15N2O4P ionic liquid |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 25 158 s |
Total Elapsed Time: | 27 672 s |
Number of Scans: | 5 |
Effective Detector Width: | 31 eV |
Accession #: | 01809-07 |
Host Material: | C7H15N2O4P ionic liquid |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 25 158 s |
Total Elapsed Time: | 27 672 s |
Number of Scans: | 5 |
Effective Detector Width: | 31 eV |
Accession #: | 01809-07 |
Host Material: | C7H15N2O4P ionic liquid |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 25 158 s |
Total Elapsed Time: | 27 672 s |
Number of Scans: | 5 |
Effective Detector Width: | 31 eV |
Accession #: 01809-08
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: C 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 7074 s
Total Elapsed Time: 7806 s
Number of Scans: 90
Effective Detector Width: 6.2 eV
Accession #: 01809-08
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: C 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 7074 s
Total Elapsed Time: 7806 s
Number of Scans: 90
Effective Detector Width: 6.2 eV
Accession #: 01809-09
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: O 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 7074 s
Total Elapsed Time: 7806 s
Number of Scans: 90
Effective Detector Width: 6.2 eV
Accession #: 01809-09
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: O 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 7074 s
Total Elapsed Time: 7806 s
Number of Scans: 90
Effective Detector Width: 6.2 eV
Accession #: 01809-10
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: N 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 15 330 s
Total Elapsed Time: 16 920 s
Number of Scans: 195
Effective Detector Width: 6.2 eV
Accession #: 01809-10
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: N 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 15 330 s
Total Elapsed Time: 16 920 s
Number of Scans: 195
Effective Detector Width: 6.2 eV
Accession #: 01809-11
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: P 2p
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 35 370 s
Total Elapsed Time: 39 042 s
Number of Scans: 450
Effective Detector Width: 6.2 eV
Accession #: 01809-11
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: P 2p
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 35 370 s
Total Elapsed Time: 39 042 s
Number of Scans: 450
Effective Detector Width: 6.2 eV
Accession #: 01809-12
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: P 2s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 35 370 s
Total Elapsed Time: 39 042 s
Number of Scans: 450
Effective Detector Width: 6.2 eV
Accession #: 01809-12
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: P 2s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 35 370 s
Total Elapsed Time: 39 042 s
Number of Scans: 450
Effective Detector Width: 6.2 eV
Accession #: 01809-13
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: P 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 3258 s
Total Elapsed Time: 3594 s
Number of Scans: 30
Effective Detector Width: 6.2 eV
Accession #: 01809-13
Host Material: C7H15N2O4P ionic liquid
Technique: XPS
Spectral Region: P 1s
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 3258 s
Total Elapsed Time: 3594 s
Number of Scans: 30
Effective Detector Width: 6.2 eV
Accession #: 01809-14
Host Material: C7H15N2O4P ionic liquid
Technique: XAES
Spectral Region: P KL2,3L2,3
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 33 696 s
Total Elapsed Time: 37 176 s
Number of Scans: 360
Effective Detector Width: 6.2 eV
Accession #: 01809-14
Host Material: C7H15N2O4P ionic liquid
Technique: XAES
Spectral Region: P KL2,3L2,3
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 33 696 s
Total Elapsed Time: 37 176 s
Number of Scans: 360
Effective Detector Width: 6.2 eV
Accession #: 01809-15
Host Material: C7H15N2O4P ionic liquid
Technique: XAES
Spectral Region: P KL1L2,3
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 49 140 s
Total Elapsed Time: 54 210 s
Number of Scans: 525
Effective Detector Width: 6.2 eV
Accession #: 01809-15
Host Material: C7H15N2O4P ionic liquid
Technique: XAES
Spectral Region: P KL1L2,3
Instrument: ULVAC-PHI Quantes
Excitation Source: Cr Kα monochromatic
Source Energy: 5414.8 eV
Source Strength: 51.4 W
Source Size: 0.1 × 0.1 mm2
Analyzer Type: Spherical sector
Incident Angle: 22°
Emission Angle: 45°
Analyzer Pass Energy: 55 eV
Analyzer Resolution: 0.43 eV
Total Signal Accumulation Time: 49 140 s
Total Elapsed Time: 54 210 s
Number of Scans: 525
Effective Detector Width: 6.2 eV
Accession #: | 01810-01 |
Host Material: | Au |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01810-01 |
Host Material: | Au |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01810-01 |
Host Material: | Au |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01810-01 |
Host Material: | Au |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01811-01 |
Host Material: | Ag |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01811-01 |
Host Material: | Ag |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01811-01 |
Host Material: | Ag |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01811-01 |
Host Material: | Ag |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01812-01 |
Host Material: | Cu |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01812-01 |
Host Material: | Cu |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01812-01 |
Host Material: | Cu |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01812-01 |
Host Material: | Cu |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 24.0 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 0° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 1434 s |
Total Elapsed Time: | 1572 s |
Number of Scans: | 1 |
Effective Detector Width: | 31 eV |
Accession #: | 01810-02 |
Host Material: | Au |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01810-02 |
Host Material: | Au |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01810-02 |
Host Material: | Au |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01810-02 |
Host Material: | Au |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01811-02 |
Host Material: | Ag |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01811-02 |
Host Material: | Ag |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01811-02 |
Host Material: | Ag |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01811-02 |
Host Material: | Ag |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01812-02 |
Host Material: | Cu |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01812-02 |
Host Material: | Cu |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01812-02 |
Host Material: | Cu |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
Accession #: | 01812-02 |
Host Material: | Cu |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | ULVAC-PHI Quantes |
Excitation Source: | Cr Kα monochromatic |
Source Energy: | 5414.8 eV |
Source Strength: | 51.4 W |
Source Size: | 0.1 × 0.1 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 22° |
Emission Angle: | 45° |
Analyzer Pass Energy: | 280 eV |
Analyzer Resolution: | 1.9 eV |
Total Signal Accumulation Time: | 19 980 s |
Total Elapsed Time: | 22 140 s |
Number of Scans: | 4 |
Effective Detector Width: | 31 eV |
ACKNOWLEDGMENTS
The authors thank B. P. Reed and A. G. Shard for discussion. This research is part of the project “NanoSolveIT,” which has received funding from European Union Horizon 2020 Programme (H2020) under Grant Agreement No. 814572.
AUTHOR DECLARATIONS
Conflict of Interest
The authors have no conflicts to disclose.
Author Contributions
X. Knigge: Formal analysis (equal); Writing – original draft (equal). J. Radnik: Formal analysis (equal); Writing – original draft (equal).
DATA AVAILABILITY
The data that support the findings of this study are available within the article and its supplementary material.