X-ray photoelectron spectroscopy was used to analyze nano-Si/C/perfluorooctene powder obtained from Paraclete Energy Inc. The spectra were obtained using incident monochromatic Al Kα radiation at 1486.6 eV (0.834 01 nm). An initial survey spectrum together with F 1s, O 1s, C 1s, and Si 2p are presented. A final survey spectrum was collected to ascertain the amount of beam-induced damage, which appears to be minimal. The spectra indicate the principal core level photoelectron and Auger electron signals with only minor nitrogen signal and show the expected silicon-carbon, carbon-fluorine, and silicon-fluorine species related to the surface modification process in addition to oxidized carbon and silicon due to atmospheric exposure.
Accession#: 01621
Technique: XPS
Host Material: Si/C/perfluorooctene powder
Instrument: Kratos Axis Ultra
Major Elements in Spectra: F, O, C, and Si
Minor Elements in Spectra: Na and N
Published Spectra: 6
Spectra in Electronic Record: 6
Spectral Category: Comparison
INTRODUCTION
Commercial lithium-ion batteries (LIBs) typically contain graphite as the electrochemically active material in the negative electrode (anode). Silicon is being considered as the intercalation material to partially or fully replace graphite in next-generation, high energy density, LIBs because the theoretical lithium storage capacity of silicon is about ten times greater than that of graphite (Ref. 1). However, the commercialization of silicon-based electrodes has been hindered by the large volume changes (320% increase) that result from the insertion/extraction of lithium-ions into the silicon particles; graphite, in comparison, displays an ∼10% volume change. Additionally, the electrochemical alloying/dealloying with lithium fractures the silicon particles and increases their surface area, which, in turn, increases parasitic side-reactions that trap lithium-ions and degrades battery performance.
Various strategies are being pursued to improve the performance and longevity of silicon-containing lithium-ion batteries. Modifying the silicon particle surfaces to increase electronic conductivity and minimize reactivity with the electrolyte ranks high among these approaches. In this study, we report x-ray photoelectron spectroscopy data from surface-modified silicon powders obtained from a commercial vendor (Paraclete Energy, Inc.). All silicon particles have an oxide surface layer that forms during material synthesis. Coating these particles with carbon can prevent H2 evolution reactions that occur during water-based electrode fabrication processes. Additional coatings can alter particle interactions with the electrolyte (such as wetting) and insertion/extraction of Li during charge/discharge cycling. Here, data are presented from Si particles coated with a thin carbonaceous layer (Si/C) and an additional coating based on perfluorooctene (PFO). The spectra indicate the expected silicon-carbon, carbon-fluorine, and silicon-fluorine species related to the surface modification process in addition to oxidized carbon and silicon due to atmospheric exposure.
XPS measurements of the powder and anode samples were made using a Kratos Axis Ultra x-ray photoelectron spectrometer (Kratos Analytical, Inc., Manchester, UK) using monochromatic Al Kα radiation (1486.6 eV). High-resolution spectra were collected from a single spot at an emission angle of 0° at a pass energy of 40 eV from a 0.7 × 0.3 mm2 area using the hybrid (electrostatic and magnetic immersion) lens mode.
SPECIMEN DESCRIPTION (ACCESSION # 01621)
Host Material: Si/C/perfluorooctene powder
CAS Registry #: Unknown
Host Material Characteristics: Homogeneous; solid; polycrystalline; dielectric; inorganic compound; powder
Chemical Name: Silicon/carbon/perfluorooctene
Source: Paraclete Energy Inc.
Host Composition: Silicon + 2.5 wt. % carbon + 4 wt. % perfluorooctene
Form: Powder
Structure: Silicon has a diamond cubic structure
History and Significance: The surface-modified Si/C/PFO powder was obtained from Paraclete Energy, Inc. The particles were produced by milling and have a mean diameter of ∼150 nm. This material is used in the fabrication of anodes for high-energy silicon-based lithium-ion cells.
As Received Condition: Untreated material as-received from the supplier.
Analyzed Region: Same as the host material
Ex Situ Preparation/Mounting: Specimen was mounted onto a sample holder with an insulating double-sided office tape (3M 665) (Ref. 2). The sample holder was then loaded onto a grounded sample stage.
In Situ Preparation: None
Charge Control: Low energy flood gun/magnetic immersion lens combination, with filament current = 1.8 A, charge balance = 3.5 V, and filament bias = 1 V (Ref. 3).
Temp. During Analysis: 300 K
Pressure During Analysis: <3 × 10−7 Pa
Preanalysis Beam Exposure: 0 s.
INSTRUMENT DESCRIPTION
Manufacturer and Model: Kratos Axis Ultra
Analyzer Type: Spherical sector
Detector: Channeltron
Number of Detector Elements: 8
INSTRUMENT PARAMETERS COMMON TO ALL SPECTRA
Spectrometer
Analyzer Mode: Constant pass energy
Throughput (T = EN): N = 0
Excitation Source Window: None
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Beam Size: 2000 × 2000 μm2
Signal Mode: Multichannel direct
Geometry
Incident Angle: 60°
Source-to-Analyzer Angle: 60°
Emission Angle: 0°
Specimen Azimuthal Angle: N/A
Acceptance Angle from Analyzer Axis: 0°
Analyzer Angular Acceptance Width: 40° × 40°
Ion Gun
Manufacturer and Model: Kratos Minibeam I
Energy: 4000 eV
Current: 0.001 mA
Current Measurement Method: Biased stage
Sputtering Species: Ar+
Spot Size (unrastered): 1000 μm
Raster Size: 2000 × 2000 μm2
Incident Angle: 90°
Polar Angle: 45°
Azimuthal Angle: 90°
Comment: Sputtering was performed with a differentially pumped ion gun for calibration spectra only.
DATA ANALYSIS METHOD
Energy Scale Correction: The binding energy scale of the instrument was calibrated using the Cu 2p (932.6 eV) and Au 4f (84.0 eV) photoelectron lines (Ref. 4). The data for the two survey spectra were referenced to Si 2p = 99 eV (Ref. 3). The data for the high-resolution spectra were referenced to Si 2p = 99.3 eV, as determined by peak fitting [GL(10)].
Recommended Energy Scale Shift: First survey 2 eV, high-resolution spectra 2.3 eV, and second survey 2 eV
Peak Shape and Background Method: Peak shape: See supplementary material (Ref. 2). Background: A noniterative Shirley background was used for all remaining regions (Ref. 5).
Quantitation Method: Quantification was done using region definitions for the survey and peak fitting component definitions for the high-resolution spectra (Refs. 6 and 7) with CasaXPS version 2.3.18. Sensitivity factors were supplied by Kratos Analytical.
SPECTRAL FEATURES TABLE
Spectrum ID # . | Element/Transition . | Peak Energy (eV) . | Peak Width FWHM (eV) . | Peak Area (eV × counts/s)a . | Sensitivity Factorb . | Concentration (at. %) . | Peak Assignment . |
---|---|---|---|---|---|---|---|
01621-01c | Na 1s | 1071 | 3.09 | 12 385.9 | 18.616 | 0.7 | Na |
01621-01c | F 1s | 688 | 3.60 | 158 530.0 | 10.363 | 16.2 | F |
01621-01c | O 1s | 532 | 3.34 | 105 999.0 | 7.496 | 15.0 | O |
01621-01c | N 1s | 400 | 3.45 | 656.9 | 4.264 | 0.2 | N |
01621-01c | C 1s | 285 | 3.32 | 95 749.2 | 2.334 | 43.4 | C |
01621-01c | Si 2p | 99 | 3.15 | 57 971.7 | 2.492 | 24.6 | Si |
01621-02d | F 1s | 685.2 | 2.00 | 747.1 | 1.054 | 0.8 | NaF |
01621-02d | F 1s | 686.9 | 2.00 | 3 070.4 | 1.056 | 3.1 | SiFze |
01621-02d | F 1s | 688.9 | 2.00 | 11 463.3 | 1.057 | 11.5 | —(CF2CF3) |
01621-03d | O 1s | 532.3 | 2.00 | 9 040.0 | 0.745 | 12.9 | —C=O, O—C=O, SiOy |
01621-03d | O 1s | 533.6 | 1.50 | 933.5 | 0.745 | 1.3 | —C—O |
01621-04d | C 1s | 283.2 | 1.53 | 443.5 | 0.237 | 2.0 | SiCx |
01621-04d | C 1s | 285.1 | 1.59 | 7 470.8 | 0.237 | 33.4 | —CC—, —CH |
01621-04d | C 1s | 286.9 | 1.40 | 1 000.4 | 0.238 | 4.5 | —C—O |
01621-04d | C 1s | 289.2 | 1.30 | 342.9 | 0.238 | 1.5 | O—C=O |
01621-04d | C 1s | 291.6 | 1.33 | 545.7 | 0.238 | 2.4 | —(CF2CF3) |
01621-04d | C 1s | 294.0 | 0.90 | 131.8 | 0.238 | 0.6 | —(CF2CF3) |
01621-05d | Si 2p | 99.3 | 1.25 | 4 886.5 | 0.260 | 19.9 | Si |
01621-05d | Si 2p | 100.5 | 1.65 | 675.0 | 0.260 | 2.8 | SiCx, SiOy |
01621-05d | Si 2p | 102.8 | 1.95 | 854.8 | 0.261 | 3.5 | SiCxOy, SiFz″e |
01621-05d | Na 1s | 1071 | 3.29 | 16 578.5 | 18.616 2 | 1.0 | Na |
01621-06c | F 1s | 688 | 3.75 | 142 233 | 10.362 8 | 15.2 | F |
01621-06c | O 1s | 532 | 3.34 | 99 568.5 | 7.495 64 | 14.7 | O |
01621-06c | N 1s | 403 | 2.09 | 2 839.33 | 4.270 4 | 0.7 | N |
01621-06c | C 1s | 285 | 3.36 | 94 248.8 | 2.334 09 | 44.6 | C |
01621-06c | Si 2p | 99 | 3.00 | 53 950.9 | 2.491 6 | 23.9 | Si |
Spectrum ID # . | Element/Transition . | Peak Energy (eV) . | Peak Width FWHM (eV) . | Peak Area (eV × counts/s)a . | Sensitivity Factorb . | Concentration (at. %) . | Peak Assignment . |
---|---|---|---|---|---|---|---|
01621-01c | Na 1s | 1071 | 3.09 | 12 385.9 | 18.616 | 0.7 | Na |
01621-01c | F 1s | 688 | 3.60 | 158 530.0 | 10.363 | 16.2 | F |
01621-01c | O 1s | 532 | 3.34 | 105 999.0 | 7.496 | 15.0 | O |
01621-01c | N 1s | 400 | 3.45 | 656.9 | 4.264 | 0.2 | N |
01621-01c | C 1s | 285 | 3.32 | 95 749.2 | 2.334 | 43.4 | C |
01621-01c | Si 2p | 99 | 3.15 | 57 971.7 | 2.492 | 24.6 | Si |
01621-02d | F 1s | 685.2 | 2.00 | 747.1 | 1.054 | 0.8 | NaF |
01621-02d | F 1s | 686.9 | 2.00 | 3 070.4 | 1.056 | 3.1 | SiFze |
01621-02d | F 1s | 688.9 | 2.00 | 11 463.3 | 1.057 | 11.5 | —(CF2CF3) |
01621-03d | O 1s | 532.3 | 2.00 | 9 040.0 | 0.745 | 12.9 | —C=O, O—C=O, SiOy |
01621-03d | O 1s | 533.6 | 1.50 | 933.5 | 0.745 | 1.3 | —C—O |
01621-04d | C 1s | 283.2 | 1.53 | 443.5 | 0.237 | 2.0 | SiCx |
01621-04d | C 1s | 285.1 | 1.59 | 7 470.8 | 0.237 | 33.4 | —CC—, —CH |
01621-04d | C 1s | 286.9 | 1.40 | 1 000.4 | 0.238 | 4.5 | —C—O |
01621-04d | C 1s | 289.2 | 1.30 | 342.9 | 0.238 | 1.5 | O—C=O |
01621-04d | C 1s | 291.6 | 1.33 | 545.7 | 0.238 | 2.4 | —(CF2CF3) |
01621-04d | C 1s | 294.0 | 0.90 | 131.8 | 0.238 | 0.6 | —(CF2CF3) |
01621-05d | Si 2p | 99.3 | 1.25 | 4 886.5 | 0.260 | 19.9 | Si |
01621-05d | Si 2p | 100.5 | 1.65 | 675.0 | 0.260 | 2.8 | SiCx, SiOy |
01621-05d | Si 2p | 102.8 | 1.95 | 854.8 | 0.261 | 3.5 | SiCxOy, SiFz″e |
01621-05d | Na 1s | 1071 | 3.29 | 16 578.5 | 18.616 2 | 1.0 | Na |
01621-06c | F 1s | 688 | 3.75 | 142 233 | 10.362 8 | 15.2 | F |
01621-06c | O 1s | 532 | 3.34 | 99 568.5 | 7.495 64 | 14.7 | O |
01621-06c | N 1s | 403 | 2.09 | 2 839.33 | 4.270 4 | 0.7 | N |
01621-06c | C 1s | 285 | 3.36 | 94 248.8 | 2.334 09 | 44.6 | C |
01621-06c | Si 2p | 99 | 3.00 | 53 950.9 | 2.491 6 | 23.9 | Si |
Reported as raw area.
Reported as RSF × T × MFP. RSF = relative sensitivity factor, T = transmission, and MFP = mean-free path.
Quantification based on region definition.
Quantification based on component definition.
ANALYZER CALIBRATION TABLE
Spectrum ID # . | Element/Transition . | Peak Energy (eV) . | Peak Width FWHM (eV) . | Peak Area (eV × counts/s) . | Sensitivity Factor . | Concentration (at. %) . | Peak Assignment . |
---|---|---|---|---|---|---|---|
… | Au 4f7/2 | 84.0 | 0.95 | 63 959.3 | … | … | … |
… | Cu 2p3/2 | 932.6 | 1.25 | 94 273.9 | … | … | … |
Spectrum ID # . | Element/Transition . | Peak Energy (eV) . | Peak Width FWHM (eV) . | Peak Area (eV × counts/s) . | Sensitivity Factor . | Concentration (at. %) . | Peak Assignment . |
---|---|---|---|---|---|---|---|
… | Au 4f7/2 | 84.0 | 0.95 | 63 959.3 | … | … | … |
… | Cu 2p3/2 | 932.6 | 1.25 | 94 273.9 | … | … | … |
GUIDE TO FIGURES
Spectrum (Accession) # . | Spectral Region . | Voltage Shifta . | Multiplier . | Baseline . | Comment # . |
---|---|---|---|---|---|
01621-01 | survey | −2 | 1 | 0 | b |
01621-02 | F 1s | −2.3 | 1 | 0 | c |
01621-03 | O 1s | −2.3 | 1 | 0 | c |
01621-04 | C 1s | −2.3 | 1 | 0 | c |
01621-05 | Si 2p | −2.3 | 1 | 0 | c |
01621-06 | Survey | −2 | 1 | 0 | d |
Spectrum (Accession) # . | Spectral Region . | Voltage Shifta . | Multiplier . | Baseline . | Comment # . |
---|---|---|---|---|---|
01621-01 | survey | −2 | 1 | 0 | b |
01621-02 | F 1s | −2.3 | 1 | 0 | c |
01621-03 | O 1s | −2.3 | 1 | 0 | c |
01621-04 | C 1s | −2.3 | 1 | 0 | c |
01621-05 | Si 2p | −2.3 | 1 | 0 | c |
01621-06 | Survey | −2 | 1 | 0 | d |
Voltage shift of the archived (as-measured) spectrum relative to the printed figure. The figure reflects the recommended energy scale correction due to a calibration correction, sample charging, flood gun, or other phenomenon.
After 10 s of beam exposure.
After 1279 s of beam exposure.
After 10 664 s of beam exposure.
Accession # . | 01621-01 . |
---|---|
Host Material: | Si/C/perfluorooctene powder |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | Kratos Axis Ultra |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 210 W |
Source Size: | 2000 × 2000 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 60° |
Emission Angle: | 0° |
Analyzer Pass Energy: | 160 eV |
Analyzer Resolution: | 2.4 eV |
Total Signal Accumulation Time: | 600 s |
Total Elapsed Time: | 1200 s |
Number of Scans: | 5 |
Effective Detector Width: | 33.6 eV |
Accession # . | 01621-01 . |
---|---|
Host Material: | Si/C/perfluorooctene powder |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | Kratos Axis Ultra |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 210 W |
Source Size: | 2000 × 2000 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 60° |
Emission Angle: | 0° |
Analyzer Pass Energy: | 160 eV |
Analyzer Resolution: | 2.4 eV |
Total Signal Accumulation Time: | 600 s |
Total Elapsed Time: | 1200 s |
Number of Scans: | 5 |
Effective Detector Width: | 33.6 eV |
Accession # . | 01621-01 . |
---|---|
Host Material: | Si/C/perfluorooctene powder |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | Kratos Axis Ultra |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 210 W |
Source Size: | 2000 × 2000 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 60° |
Emission Angle: | 0° |
Analyzer Pass Energy: | 160 eV |
Analyzer Resolution: | 2.4 eV |
Total Signal Accumulation Time: | 600 s |
Total Elapsed Time: | 1200 s |
Number of Scans: | 5 |
Effective Detector Width: | 33.6 eV |
Accession # . | 01621-01 . |
---|---|
Host Material: | Si/C/perfluorooctene powder |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | Kratos Axis Ultra |
Excitation Source: | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 210 W |
Source Size: | 2000 × 2000 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 60° |
Emission Angle: | 0° |
Analyzer Pass Energy: | 160 eV |
Analyzer Resolution: | 2.4 eV |
Total Signal Accumulation Time: | 600 s |
Total Elapsed Time: | 1200 s |
Number of Scans: | 5 |
Effective Detector Width: | 33.6 eV |
Accession #: 01621-02
Host Material: Si/C/perfluorooctene powder
Technique: XPS
Spectral Region: F 1s
Instrument: Kratos Axis Ultra
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Size: 2000 × 2000 mm2
Analyzer Type: Spherical sector
Incident Angle: 60°
Emission Angle: 0°
Analyzer Pass Energy 40 eV
Analyzer Resolution: 0.6 eV
Total Signal Accumulation Time: 1206 s
Total Elapsed Time: 3317 s
Number of Scans: 20
Effective Detector Width: 8.4 eV
Accession #: 01621-02
Host Material: Si/C/perfluorooctene powder
Technique: XPS
Spectral Region: F 1s
Instrument: Kratos Axis Ultra
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Size: 2000 × 2000 mm2
Analyzer Type: Spherical sector
Incident Angle: 60°
Emission Angle: 0°
Analyzer Pass Energy 40 eV
Analyzer Resolution: 0.6 eV
Total Signal Accumulation Time: 1206 s
Total Elapsed Time: 3317 s
Number of Scans: 20
Effective Detector Width: 8.4 eV
Accession #: 01621-03
Host Material: Si/C/perfluorooctene powder
Technique: XPS
Spectral Region: O 1s
Instrument: Kratos Axis Ultra
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Size: 2000 × 2000 mm2
Analyzer Type: Spherical sector
Incident Angle: 60°
Emission Angle: 0°
Analyzer Pass Energy 40 eV
Analyzer Resolution: 0.6 eV
Total Signal Accumulation Time: 1206 s
Total Elapsed Time: 3317 s
Number of Scans: 20
Effective Detector Width: 8.4 eV
Accession #: 01621-03
Host Material: Si/C/perfluorooctene powder
Technique: XPS
Spectral Region: O 1s
Instrument: Kratos Axis Ultra
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Size: 2000 × 2000 mm2
Analyzer Type: Spherical sector
Incident Angle: 60°
Emission Angle: 0°
Analyzer Pass Energy 40 eV
Analyzer Resolution: 0.6 eV
Total Signal Accumulation Time: 1206 s
Total Elapsed Time: 3317 s
Number of Scans: 20
Effective Detector Width: 8.4 eV
Accession #: 01621-04
Host Material: Si/C/perfluorooctene powder
Technique: XPS
Spectral Region: C 1s
Instrument: Kratos Axis Ultra
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Size: 2000 × 2000 mm2
Analyzer Type: Spherical sector
Incident Angle: 60°
Emission Angle: 0°
Analyzer Pass Energy 40 eV
Analyzer Resolution: 0.6 eV
Total Signal Accumulation Time: 1206 s
Total Elapsed Time: 3317 s
Number of Scans: 20
Effective Detector Width: 8.4 eV
Accession #: 01621-04
Host Material: Si/C/perfluorooctene powder
Technique: XPS
Spectral Region: C 1s
Instrument: Kratos Axis Ultra
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Size: 2000 × 2000 mm2
Analyzer Type: Spherical sector
Incident Angle: 60°
Emission Angle: 0°
Analyzer Pass Energy 40 eV
Analyzer Resolution: 0.6 eV
Total Signal Accumulation Time: 1206 s
Total Elapsed Time: 3317 s
Number of Scans: 20
Effective Detector Width: 8.4 eV
Accession #: 01621-05
Host Material: Si/C/perfluorooctene powder
Technique: XPS
Spectral Region: Si 2p
Instrument: Kratos Axis Ultra
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Size: 2000 × 2000 mm2
Analyzer Type: Spherical sector
Incident Angle: 60°
Emission Angle: 0°
Analyzer Pass Energy 40 eV
Analyzer Resolution: 0.6 eV
Total Signal Accumulation Time: 1206 s
Total Elapsed Time: 3317 s
Number of Scans: 20
Effective Detector Width: 8.4 eV
Accession #: 01621-05
Host Material: Si/C/perfluorooctene powder
Technique: XPS
Spectral Region: Si 2p
Instrument: Kratos Axis Ultra
Excitation Source: Al Kα monochromatic
Source Energy: 1486.6 eV
Source Strength: 210 W
Source Size: 2000 × 2000 mm2
Analyzer Type: Spherical sector
Incident Angle: 60°
Emission Angle: 0°
Analyzer Pass Energy 40 eV
Analyzer Resolution: 0.6 eV
Total Signal Accumulation Time: 1206 s
Total Elapsed Time: 3317 s
Number of Scans: 20
Effective Detector Width: 8.4 eV
Accession # . | 01621-06 . |
---|---|
Host Material: | Si/C/perfluorooctene powder |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | Kratos Axis Ultra |
Excitation Source | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 210 W |
Source Size: | 2000 × 2000 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 60° |
Emission Angle: | 0° |
Analyzer Pass Energy: | 160 eV |
Analyzer Resolution: | 2.4 eV |
Total Signal Accumulation Time: | 600 s |
Total Elapsed Time: | 1200 s |
Number of Scans: | 5 |
Effective Detector Width: | 33.6 eV |
Accession # . | 01621-06 . |
---|---|
Host Material: | Si/C/perfluorooctene powder |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | Kratos Axis Ultra |
Excitation Source | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 210 W |
Source Size: | 2000 × 2000 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 60° |
Emission Angle: | 0° |
Analyzer Pass Energy: | 160 eV |
Analyzer Resolution: | 2.4 eV |
Total Signal Accumulation Time: | 600 s |
Total Elapsed Time: | 1200 s |
Number of Scans: | 5 |
Effective Detector Width: | 33.6 eV |
Accession # . | 01621-06 . |
---|---|
Host Material: | Si/C/perfluorooctene powder |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | Kratos Axis Ultra |
Excitation Source | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 210 W |
Source Size: | 2000 × 2000 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 60° |
Emission Angle: | 0° |
Analyzer Pass Energy: | 160 eV |
Analyzer Resolution: | 2.4 eV |
Total Signal Accumulation Time: | 600 s |
Total Elapsed Time: | 1200 s |
Number of Scans: | 5 |
Effective Detector Width: | 33.6 eV |
Accession # . | 01621-06 . |
---|---|
Host Material: | Si/C/perfluorooctene powder |
Technique: | XPS |
Spectral Region: | Survey |
Instrument: | Kratos Axis Ultra |
Excitation Source | Al Kα monochromatic |
Source Energy: | 1486.6 eV |
Source Strength: | 210 W |
Source Size: | 2000 × 2000 mm2 |
Analyzer Type: | Spherical sector analyzer |
Incident Angle: | 60° |
Emission Angle: | 0° |
Analyzer Pass Energy: | 160 eV |
Analyzer Resolution: | 2.4 eV |
Total Signal Accumulation Time: | 600 s |
Total Elapsed Time: | 1200 s |
Number of Scans: | 5 |
Effective Detector Width: | 33.6 eV |
ACKNOWLEDGMENTS
This work was carried out in part in the Frederick Seitz Materials Research Laboratory Central Research Facilities, University of Illinois. D.P.A. gratefully acknowledges support from the Office of Vehicle Technologies at the U.S. Department of Energy. This manuscript has been cocreated by UChicago Argonne, LLC, Operator of Argonne National Laboratory. The U.S. Government retains for itself, and others acting on its behalf, a paid-up nonexclusive, irrevocable worldwide license in said article to reproduce, prepare derivative works, distribute copies to the public, and perform publicly and display publicly, by or on behalf of the Government.