The number of publications reporting lipid and fatty acid time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis has increased as ToF-SIMS is increasingly applied toward the analysis of biological systems. Tissue and cell analysis through ToF-SIMS typically involves collecting mass spectrometry images that are used to characterize the local distribution of lipids and fatty acids throughout the analyzed area. Complete and reliable sets of reference spectra are required for fatty acids and lipids in order to aid in the interpretation of ToF-SIMS data from tissues and cells. Here, we present the reference spectra for eight fatty acids and one lipid. This database contains positive and negative polarity spectra using a Bi3+ primary ion species.
At the request of the authors, this article is being retracted effective 26 October 2021.
Accession #: 01488, 01489, 01490, 01491, 01492, 01493, 01494, 01495, 01496
Technique: SIMS
Host Material: Silicon (100) wafer
Instrument: IONTOF, TOF.SIMS 5
Major Species in Spectra: C, H, O, N
Minor Species in Spectra: Si, Cl
Published Spectra: 18
Spectra in Electronic Record: 54
Published Spectral Figures: 19
Spectral Category: Reference
INTRODUCTION
No current database of fatty acids and lipids exists for time-of-flight secondary ion mass spectrometry (ToF-SIMS). ToF-SIMS is a hard ionization technique and produces fragmentation patterns that are poorly understood, particularly in the case of tissue and cell analysis. Assignment of a chemical structure for a given peak is often vague for charged molecular ions, and/or their fragments (Ref. 1). Here, we provide ToF-SIMS data from standards of one lipid and eight fatty acids, as well as the corresponding peak lists of their fragmentation products.
All fatty acids with purities ≥99% were purchased through Sigma Aldrich. Fatty acids in solid form were dissolved in ethanol (Sigma Aldrich) at a concentration of 5 mg/ml. Fatty acids in liquid form were used without alterations. Host silicon wafers of 1 × 1 cm size were cleaned by soaking in ultrapure (18.2 MΩ) water overnight, rinsed, and then sonicated for two 5 min cycles in dichloromethane, acetone, and methanol. 20 μl of each fatty acid, either in solution or in liquid form, was then deposited onto separate silicon wafers using a digital pipette making sure that each deposited droplet was spread over the entire wafer surface. Samples were then vacuum dried at 226 mbar at room temperature in a clean vacuum oven.
The spectra were obtained on IONTOF TOF.SIMS 5 equipped with a 25 keV bismuth metal ion gun. The instrument was operated in high current bunched mode. The primary ion dose was kept below the static limit (1012 ions/cm2). The raster size was 500 × 500 μm2 with a raster resolution of 128 × 128 pixels, a cycle time of 100 μs, and a primary ion current of 0.30 pA. Fifty scans were acquired per single mass spectrum. Note that variations in mass resolution among the reference spectra are due to crystallization differences between the fatty acids resulting in changes in topography.
Figures and tables presented contain the most prominent peaks. The major negative and positive secondary ion fragmentation products are presented next to their respective spectra. A full combined peak list for the major peaks present in the database for negative and positive secondary ions is shown in the spectral features tables, and the corresponding M − H and/or any M + H peaks for each of the samples are shown in Fig. 1.
In the figures, the full molecule is referred to with “M.” In the label of the supplementary material files, Spectrum ID# uniquely identifies each fatty acid. Note that six spectra from each of the samples are included in the spectra database in a text file. Positive spectra are listed by #01488–#01496 (01–03), and negative spectra are listed by #01488–#01496 (04–06). It was noted that in the positive ion spectra of Eicosatrienoic and Oleic Acids, a peak matching M – H was seen. It is unclear how this ion forms.
SPECIMEN DESCRIPTION (ACCESSION # 01488, 01489, 01490, 01491, 01492, 01493, 01494, 01495, 01496)
Host Material: Silicon (100) wafer
CAS Registry #: 7440-21-3
Host Material Characteristics: Homogeneous; solid; single crystal; semiconductor
Chemical Name: Arachidic Acid (01488), Eicosatrienoic Acid (01489), Oleic Acid (01490), Linolenic Acid (01491), Palmitic Acid (01492), Palmitoleic Acid (01493), Sphingosine (01494), Stearic Acid (01495), Docosahexaenoic Acid (01496)
Source: Sigma-Aldrich Co, St. Louis, MO, USA
Host Composition: Si, SiO2
Form: Arachidic Acid, Palmitic Acid, Palmitoleic Acid, Sphingosine, and Stearic Acid were crystalline powders dissolved in ethanol; Eicosatrienoic Acid, Oleic Acid, Docosahexaenoic Acid, and Linolenic Acid were liquid.
Lot Number: Arachidic Acid: BGBC3745, Eicosatrienoic Acid: SLBL3067V, Oleic Acid: SLBW3550, Linolenic Acid: SLBQ5256V, Palmitic Acid: SLBQ8866V, Palmitoleic Acid: SLBQ4106V, Sphingosine: MKBX9562V, Stearic Acid: BCBP3246V, Docosahexaenoic Acid: 0000036595
Structure: Arachidic Acid: C20H40O2, Eicosatrienoic Acid: C20H34O2, Oleic Acid: C18H34O2, Linolenic Acid: C18H30O2, Palmitic Acid: C16H32O2, Palmitoleic Acid: C16H30O2, Sphingosine: C18H37NO2, Docosahexaenoic Acid: C22H32O2, Stearic Acid: C18H36O2
History and Significance: Fatty acids and lipids are metabolic intermediate products in tissue homeostasis. Many cellular functions are dependent on the availability of lipids and fatty acids, particularly in cancer metabolism where specific fatty acids and lipids may be indicators of a cancerous state (Ref. 2).
As Received Condition: Arachidic Acid, Palmitic Acid, Palmitoleic Acid, Sphingosine, and Stearic Acid were received in powder form; Eicosatrienoic Acid, Oleic Acid, Docosahexaenoic Acid, and Linolenic Acid were received in liquid form.
Analyzed Region: Areas of 500 μm × 500 μm with greatest coverage of specimen
Ex Situ Preparation/Mounting: For those in powder form, 20 mg of each fatty acid was dissolved in 4 ml of ethanol. 20 μl of these 5 mg/ml fatty acid solutions were then deposited using a digital pipette onto the polished side of 1 cm × 1 cm cleaned silicon wafer. For those in liquid form, 20 μl of each fatty acid was directly deposited using a digital pipette from its container onto the polished side of a 1 cm × 1 cm cleaned silicon wafer. All samples were then dried under vacuum at 226 mbar to facilitate crystallization.
In Situ Preparation: None
Charge Control: Low energy electrons
Temp. During Analysis: 291.15 K
Pressure During Analysis: 2 × 10−7 Pa
Preanalysis Beam Exposure: None
INSTRUMENT CONFIGURATION
Manufacturer and Model: IONTOF, TOF.SIMS 5
Analyzer Type: Time-of-flight
Experiment Type: Mass spectrum
Sample Rotation: No
Rotation Rate: Not rotated
Oxygen Flood Source: None
Oxygen Flood Pressure: N/A
Other Flood Source:
Other Flood Pressure: N/A
Unique Instrument Features Used: Time-of-flight detector with grid less reflectron unit
Energy Acceptance Window: 14.3 eV
Postacceleration Voltage: 25 kV
Sample Bias: 0 eV
Specimen Normal-to-Analyzer (Θe): 0°
Ion Sources
Ion Source 1 of 1
Purpose of This Ion Source: Analysis beam
Ion Source Manufacturer: IONTOF (Münster, Germany)
Ion Source Model: 25 keV Bi cluster
Beam Mass Filter: Yes
Describe Beam Mass Filter: Electrodynamic mass filter
Beam Species and Charge State: Bi3+
Beam Gating Used: None
Additional Beam Comments: N/A
Beam Voltage: 25 000 eV
Net Beam Voltage (Impact Voltage): 25 000 eV
Ion Pulse Width: 17 ns
Ion Pulse Rate: 10 kHz
DC Beam Current: Not specified
Pulsed Beam Current: 0.0004 nA
Current Measurement Method: Faraday cup
Beam Diameter: 1 μm
Beam Raster Size: 500 μm × 500 μm
Beam Incident Angle: 45°
Source-to-Analyzer Angle: 45°
SPECTRAL FEATURES TABLE
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01488-01 | 295.301 | C20H39O+ | [M – H2O + H] |
| 313.307 | C20H41O2+ | [M + H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01488-01 | 295.301 | C20H39O+ | [M – H2O + H] |
| 313.307 | C20H41O2+ | [M + H] |
| Accession # | 01488-01, 01488-02, 01488-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4106 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.1 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01488-01, 01488-02, 01488-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4106 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.1 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01488-01, 01488-02, 01488-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4106 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.1 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01488-01, 01488-02, 01488-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4106 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.1 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Arachidic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01488-04 | 239.201 | C15H27O2− | [M – H – C5H10] |
| 253.218 | C16H29O2− | [M – H – C4H8] | |
| 267.233 | C17H31O2− | [M – H – C3H6] | |
| 281.248 | C18H33O2− | [M – H – C2H4] | |
| 295.263 | C19H35O2− | [M – H – CH2] | |
| 311.295 | C20H39O2− | [M – H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01488-04 | 239.201 | C15H27O2− | [M – H – C5H10] |
| 253.218 | C16H29O2− | [M – H – C4H8] | |
| 267.233 | C17H31O2− | [M – H – C3H6] | |
| 281.248 | C18H33O2− | [M – H – C2H4] | |
| 295.263 | C19H35O2− | [M – H – CH2] | |
| 311.295 | C20H39O2− | [M – H] |
| Accession # | 01488-04, 01488-05, 01488-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6568 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Repeat CH2 loss in spectra from deprotonated parent ion |
| Accession # | 01488-04, 01488-05, 01488-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6568 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Repeat CH2 loss in spectra from deprotonated parent ion |
| Accession # | 01488-04, 01488-05, 01488-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6568 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Repeat CH2 loss in spectra from deprotonated parent ion |
| Accession # | 01488-04, 01488-05, 01488-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6568 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Repeat CH2 loss in spectra from deprotonated parent ion |
Eicosatrienoic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01489-01 | 305.248 | C20H33O2+ | … |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01489-01 | 305.248 | C20H33O2+ | … |
| Accession # | 01489-01, 01489-02, 01489-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 3981 m/Δm |
| Mass Resolution Determined at: | 93.067 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Possible formation of M – H in positive polarity |
| Accession # | 01489-01, 01489-02, 01489-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 3981 m/Δm |
| Mass Resolution Determined at: | 93.067 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Possible formation of M – H in positive polarity |
| Accession # | 01489-01, 01489-02, 01489-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 3981 m/Δm |
| Mass Resolution Determined at: | 93.067 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Possible formation of M – H in positive polarity |
| Accession # | 01489-01, 01489-02, 01489-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 3981 m/Δm |
| Mass Resolution Determined at: | 93.067 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Possible formation of M – H in positive polarity |
Eicosatrienoic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01489-04 | 305.248 | C20H33O2− | [M – H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01489-04 | 305.248 | C20H33O2− | [M – H] |
| Accession # | 01489-04, 01489-05, 01489-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6254 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | No loss of CH2 repeat from M – H |
| Accession # | 01489-04, 01489-05, 01489-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6254 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | No loss of CH2 repeat from M – H |
| Accession # | 01489-04, 01489-05, 01489-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6254 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | No loss of CH2 repeat from M – H |
| Accession # | 01489-04, 01489-05, 01489-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6254 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | No loss of CH2 repeat from M – H |
Oleic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01490-01 | 265.249 | C18H33O+ | [M – H2O + H] |
| 283.264 | C18H35O2+ | [M + H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01490-01 | 265.249 | C18H33O+ | [M – H2O + H] |
| 283.264 | C18H35O2+ | [M + H] |
| Accession # | 01490-01, 01490-02, 01490-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4028 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | Not specified |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01490-01, 01490-02, 01490-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4028 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | Not specified |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01490-01, 01490-02, 01490-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4028 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | Not specified |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01490-01, 01490-02, 01490-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4028 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | Not specified |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Oleic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01490-04 | 281.246 | C18H33O2− | [M – H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01490-04 | 281.246 | C18H33O2− | [M – H] |
| Accession # | 01490-04, 01490-05, 01490-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6982 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01490-04, 01490-05, 01490-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6982 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01490-04, 01490-05, 01490-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6982 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01490-04, 01490-05, 01490-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6982 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 49 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Linolenic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01491-01 | 277.214 | C18H29O2+ | … |
| 279.231 | C18H31O2+ | [M + H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01491-01 | 277.214 | C18H29O2+ | … |
| 279.231 | C18H31O2+ | [M + H] |
| Accession # | 01491-01, 01491-02, 01491-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C8H9+ |
| Analyzer Mass Resolution: | 4823 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01491-01, 01491-02, 01491-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C8H9+ |
| Analyzer Mass Resolution: | 4823 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01491-01, 01491-02, 01491-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C8H9+ |
| Analyzer Mass Resolution: | 4823 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01491-01, 01491-02, 01491-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C8H9+ |
| Analyzer Mass Resolution: | 4823 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Linolenic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01491-04 | 235.170 | C15H23O2− | … |
| 249.183 | C16H25O2− | … | |
| 263.201 | C17H27O2− | … | |
| 277.216 | C18H29O2− | [M – H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01491-04 | 235.170 | C15H23O2− | … |
| 249.183 | C16H25O2− | … | |
| 263.201 | C17H27O2− | … | |
| 277.216 | C18H29O2− | [M – H] |
| Accession # | 01491-04, 01491-05, 01491-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C2H−, C4H−, C5H− |
| Analyzer Mass Resolution: | 6192 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01491-04, 01491-05, 01491-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C2H−, C4H−, C5H− |
| Analyzer Mass Resolution: | 6192 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01491-04, 01491-05, 01491-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C2H−, C4H−, C5H− |
| Analyzer Mass Resolution: | 6192 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01491-04, 01491-05, 01491-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C2H−, C4H−, C5H− |
| Analyzer Mass Resolution: | 6192 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Palmitic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01492-01 | 237.222 | C16H29O+ | [M + H – H2O] |
| 253.217 | C16H29O2+ | … | |
| 257.248 | C16H33O2+ | … |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01492-01 | 237.222 | C16H29O+ | [M + H – H2O] |
| 253.217 | C16H29O2+ | … | |
| 257.248 | C16H33O2+ | … |
| Accession # | 01492-01, 01492-02, 01492-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 5621 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01492-01, 01492-02, 01492-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 5621 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01492-01, 01492-02, 01492-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 5621 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01492-01, 01492-02, 01492-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 5621 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Palmitic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01492-04 | 253.218 | C16H29O2− | … |
| 255.234 | C16H31O2− | M – H |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01492-04 | 253.218 | C16H29O2− | … |
| 255.234 | C16H31O2− | M – H |
| Accession # | 01492-04, 01492-05, 01492-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 5514 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01492-04, 01492-05, 01492-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 5514 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01492-04, 01492-05, 01492-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 5514 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01492-04, 01492-05, 01492-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 5514 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Palmitoleic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01493-01 | 237.220 | C16H29O+ | [M + H – H2O] |
| 251.198 | C16H27O2+ | … | |
| 253.215 | C16H29O2+ | … | |
| 254.225 | C16H30O2+ | M | |
| 255.245 | C16H31O2+ | M + H | |
| 277.206 | C16H30O2+ | M + Na |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01493-01 | 237.220 | C16H29O+ | [M + H – H2O] |
| 251.198 | C16H27O2+ | … | |
| 253.215 | C16H29O2+ | … | |
| 254.225 | C16H30O2+ | M | |
| 255.245 | C16H31O2+ | M + H | |
| 277.206 | C16H30O2+ | M + Na |
| Accession # | 01493-01, 01493-02, 01493-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4023 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01493-01, 01493-02, 01493-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4023 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01493-01, 01493-02, 01493-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4023 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01493-01, 01493-02, 01493-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 4023 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Palmitoleic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01493-04 | 237.185 | C15H25O2− | … |
| 251.198 | C16H27O2− | … | |
| 253.217 | C16H29O2− | M – H |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01493-04 | 237.185 | C15H25O2− | … |
| 251.198 | C16H27O2− | … | |
| 253.217 | C16H29O2− | M – H |
| Accession # | 01493-04, 01493-05, 01493-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6041 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01493-04, 01493-05, 01493-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6041 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01493-04, 01493-05, 01493-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6041 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01493-04, 01493-05, 01493-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C2H−, C4H− |
| Analyzer Mass Resolution: | 6041 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Sphingosine
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01494-01 | 196.143 | C12H20O2+ | … |
| 210.164 | C13H22O2+ | … | |
| 224.181 | C14H24O2+ | … | |
| 281.271 | C18H36NO+ | [M – OH + H] | |
| 299.282 | C18H37NO2+ | [M] | |
| 322.272 | C18H37NO2Na+ | [M] + Na |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01494-01 | 196.143 | C12H20O2+ | … |
| 210.164 | C13H22O2+ | … | |
| 224.181 | C14H24O2+ | … | |
| 281.271 | C18H36NO+ | [M – OH + H] | |
| 299.282 | C18H37NO2+ | [M] | |
| 322.272 | C18H37NO2Na+ | [M] + Na |
| Accession # | 01494-01, 01494-02, 01494-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 6128 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Na+ peak intensity has scaled by half in spectra |
| Accession # | 01494-01, 01494-02, 01494-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 6128 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Na+ peak intensity has scaled by half in spectra |
| Accession # | 01494-01, 01494-02, 01494-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 6128 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Na+ peak intensity has scaled by half in spectra |
| Accession # | 01494-01, 01494-02, 01494-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH3+, C2H3+, C7H9+ |
| Analyzer Mass Resolution: | 6128 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Comment: | Na+ peak intensity has scaled by half in spectra |
Sphingosine
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01494-04 | 253.253 | C17H33O− | … |
| 298.275 | C18H36NO2− | M – H |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01494-04 | 253.253 | C17H33O− | … |
| 298.275 | C18H36NO2− | M – H |
| Accession # | 01494-04, 01494-05, 01494-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C4H−, C5H− |
| Analyzer Mass Resolution: | 5805 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01494-04, 01494-05, 01494-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C4H−, C5H− |
| Analyzer Mass Resolution: | 5805 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01494-04, 01494-05, 01494-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C4H−, C5H− |
| Analyzer Mass Resolution: | 5805 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01494-04, 01494-05, 01494-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | OH−, C4H−, C5H− |
| Analyzer Mass Resolution: | 5805 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Stearic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01495-01 | 267.273 | C18H35O+ | [M – H2O + H] |
| 285.278 | C18H37O2+ | [M + H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01495-01 | 267.273 | C18H35O+ | [M – H2O + H] |
| 285.278 | C18H37O2+ | [M + H] |
| Accession # | 01495-01, 01495-02, 01495-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | C4H5+, C5H6+, C7H9+ |
| Analyzer Mass Resolution: | 3824 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01495-01, 01495-02, 01495-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | C4H5+, C5H6+, C7H9+ |
| Analyzer Mass Resolution: | 3824 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01495-01, 01495-02, 01495-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | C4H5+, C5H6+, C7H9+ |
| Analyzer Mass Resolution: | 3824 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01495-01, 01495-02, 01495-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | C4H5+, C5H6+, C7H9+ |
| Analyzer Mass Resolution: | 3824 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Stearic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01495-04 | 283.264 | C18H35O2− | [M – H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01495-04 | 283.264 | C18H35O2− | [M – H] |
| Accession # | 01495-04, 01495-05, 01495-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C5H− |
| Analyzer Mass Resolution: | 6028 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01495-04, 01495-05, 01495-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C5H− |
| Analyzer Mass Resolution: | 6028 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01495-04, 01495-05, 01495-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C5H− |
| Analyzer Mass Resolution: | 6028 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01495-04, 01495-05, 01495-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C5H− |
| Analyzer Mass Resolution: | 6028 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Docosahexaenoic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01496-01 | 327.232 | C22H31O2+ | … |
| 329.247 | C22H33O2+ | [M + H] |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01496-01 | 327.232 | C22H31O2+ | … |
| 329.247 | C22H33O2+ | [M + H] |
| Accession # | 01496-01, 01496-02, 01496-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | C4H5+, C5H6+, C7H9+ |
| Analyzer Mass Resolution: | 4358 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01496-01, 01496-02, 01496-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | C4H5+, C5H6+, C7H9+ |
| Analyzer Mass Resolution: | 4358 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01496-01, 01496-02, 01496-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | C4H5+, C5H6+, C7H9+ |
| Analyzer Mass Resolution: | 4358 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01496-01, 01496-02, 01496-03 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Positive |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | C4H5+, C5H6+, C7H9+ |
| Analyzer Mass Resolution: | 4358 m/Δm |
| Mass Resolution Determined at: | 93 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | nA |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
Docosahexaenoic Acid
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01496-04 | 327.231 | C22H31O2− | M – H |
| Spectrum ID # | Mass (Da) | Species | Peak Assignment |
|---|---|---|---|
| 01496-04 | 327.231 | C22H31O2− | M – H |
| Accession # | 01496-04, 01496-05, 01496-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C5H− |
| Analyzer Mass Resolution: | 6021 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01496-04, 01496-05, 01496-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C5H− |
| Analyzer Mass Resolution: | 6021 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01496-04, 01496-05, 01496-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C5H− |
| Analyzer Mass Resolution: | 6021 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
| Accession # | 01496-04, 01496-05, 01496-06 |
|---|---|
| ■Host Material: | Silicon wafer |
| ■Technique: | SIMS |
| Analyzer Type: | Time-of-flight |
| Secondary Source Polarity: | Negative |
| Instrument: | IONTOF, TOF.SIMS 5 |
| Mass Range Minimum: | 0 Da |
| Mass Range Maximum: | 800 Da |
| Species Used for Mass Calibration: | CH−, OH−, C5H− |
| Analyzer Mass Resolution: | 6021 m/Δm |
| Mass Resolution Determined at: | 61 Da |
| Spectrum Dead Time Corrected? | No |
| Total Spectral Acquisition Time: | 164 s |
| Abscissa Increment: | 128 ps |
| Primary Beam Ion Gun: | LMIG |
| Primary Species: | Bi3+ |
| Primary Ion Dose: | 6.14 × 1010 ion/cm2 |
| Primary Ion Pulse Width: | 17 ns |
| Primary Ion Pulse Rate: | 10 kHz |
| Net Beam Voltage: | 25 000 eV |
| Pulsed Beam Current: | 0.0004 nA |
| DC Beam Current: | Not specified |
| Beam Diameter: | 1 μm |
| Beam Raster Size: | 500 μm × 500 μm |
| Specimen Normal-to-Analyzer: | Not specified |
| Beam Incident Angle: | 45° |
| Source-to-Analyzer Angle: | 45° |
![EXPANDED [M + H]+ AND [M − H]− PEAKS FOR EACH FATTY ACID SPECTRUM Accession # 01488-01, 01488-04, 01489-04, 01489-01, 01495-01, 01490-04, 01491-01, 01491-04, 01492-04, 01492-01, 01493-04, 01493-01, 01494-01, 01494-04, 01490-01, 01495-04, 01496-04, 01496-01](/view-large/figure/87873553/025001_1_1.5063595.figures.online.f19.jpg)
SPECTRAL FEATURES TABLE
| Mass (Da) | Peak assignment | Positive polarity peaks present in following fatty acids | Peak most prominent in |
|---|---|---|---|
| 27.023 | C2H3+ | All fatty acids | … |
| 29.039 | C2H5+ | All fatty acids | … |
| 39.023 | C3H3+ | All fatty acids | … |
| 41.039 | C3H5+ | All fatty acids | … |
| 43.055 | C3H7+ | All fatty acids | … |
| 55.055 | C4H7+ | All fatty acids | … |
| 57.070 | C4H9+ | All fatty acids | … |
| 60.045 | C2H6NO+ | Sphingosine | Sphingosine |
| 67.055 | C5H7+ | All fatty acids | … |
| 69.070 | C5H9+ | All fatty acids | … |
| 79.055 | C6H7+ | All fatty acids | … |
| 81.070 | C6H9+ | All fatty acids | … |
| 82.066 | C5H8N+ | Sphingosine | Sphingosine |
| 83.086 | C6H11+ | All fatty acids | … |
| 91.055 | C7H7+ | All fatty acids | … |
| 93.070 | C7H9+ | All fatty acids | … |
| 95.086 | C7H11+ | All fatty acids | … |
| 97.102 | C7H13+ | All fatty acids | … |
| 105.070 | C8H9+ | All fatty acids | … |
| 107.086 | C8H11+ | All fatty acids | … |
| 109.102 | C8H13+ | All fatty acids | … |
| 111.081 | C7H11O+ | Multiple fatty acids | Stearic Acid |
| 112.089 | C7H12O+ | Multiple fatty acids | Arachidic Acid, Sphingosine, Stearic Acid |
| 115.055 | C9H7+ | Multiple fatty acids | Linolenic Acid |
| 125.097 | C8H13O+ | Multiple fatty acids | Stearic Acid |
| 129.092 | C7H13O2+ | Arachidic Acid, Palmitoleic Acid, Stearic Acid | Stearic Acid |
| 138.104 | C9H14O+ | Sphingosine | Sphingosine |
| 139.112 | C9H15O+ | Multiple fatty acids | Stearic Acid |
| 143.107 | C8H15O2+ | Multiple fatty acids | Stearic Acid |
| 147.081 | C10H11O+ | Multiple fatty acids | Eicosatrienoic Acid, Linolenic Acid, Palmitic Acid |
| 153.128 | C10H17O+ | Multiple fatty acids | Stearic Acid |
| 155.107 | C9H15O2+ | Multiple fatty acids | Palmitoleic Acid |
| 157.123 | C9H17O2+ | Arachidic Acid, Palmitoleic Acid, Stearic Acid | Stearic Acid |
| 165.128 | C11H17O+ | Palmitoleic Acid | Palmitoleic Acid |
| 167.144 | C11H19O+ | Stearic Acid | Stearic Acid |
| 171.081 | C12H11O+ | Eicosatrienoic Acid | … |
| 171.117 | C13H15+ | Linolenic Acid | Linolenic Acid |
| 171.138 | C10H19O2+ | Stearic Acid | Stearic Acid |
| 173.060 | C11H9O2+ | Sphingosine | Sphingosine |
| 178.042 | C13H6O+ | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid |
| 181.123 | C11H17O2+ | Multiple fatty acids | Linolenic Acid, Palmitoleic Acid |
| 185.154 | C11H21O2+ | Arachidic Acid, Stearic Acid | Stearic Acid |
| 195.138 | C12H19O2+ | Eicosatrienoic Acid, , Linolenic Acid | Linolenic Acid |
| 195.175 | C13H23O+ | Stearic Acid | Stearic Acid |
| 196.146 | C12H20O2+ | Multiple fatty acids | Linolenic Acid, Palmitoleic Acid, Sphingosine |
| 209.154 | C13H21O2+ | Linolenic Acid, Palmitoleic Acid | Linolenic Acid |
| 209.191 | C14H25O+ | Stearic Acid | Stearic Acid |
| 210.162 | C13H22O2+ | Sphingosine | Linolenic Acid, Palmitoleic Acid, Sphingosine |
| 221.154 | C14H21O2+ | Multiple fatty acids | Eicosatrienoic Acid |
| 221.191 | C15H25O+ | Linolenic Acid | Linolenic Acid |
| 222.162 | C14H22O2+ | Linolenic Acid | Linolenic Acid |
| 223.170 | C14H23O2+ | Linolenic Acid | Linolenic Acid |
| 223.206 | C15H27O+ | Arachidic Acid, Stearic Acid | Arachidic Acid |
| 224.178 | C14H24O2+ | Linolenic Acid, Sphingosine | Sphingosine |
| 237.185 | C15H25O2+ | Linolenic Acid | Linolenic Acid |
| 237.222 | C16H29O+ | Multiple fatty acids | Palmitic Acid, Palmitoleic Acid |
| 238.193 | C15H26O2+ | Sphingosine | Sphingosine |
| 239.237 | C16H31O+ | Stearic Acid | Stearic Acid |
| 251.201 | C16H27O2+ | Palmitoleic Acid | Palmitoleic Acid |
| 251.237 | C17H31O+ | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid |
| 252.209 | C16H28O2+ | Palmitic Acid, Palmitoleic Acid | Palmitic Acid, Palmitoleic Acid |
| 253.217 | C16H29O2+ | Palmitic Acid, Palmitoleic Acid, Stearic Acid | Palmitic Acid, Palmitoleic Acid |
| 254.225 | C16H30O2+ | Palmitic Acid, Palmitoleic Acid, Sphingosine | Palmitoleic Acid |
| 255.232 | C16H31O2+ | Palmitic Acid, Palmitoleic Acid | Palmitic Acid, Palmitoleic Acid |
| 256.240 | C16H32O2+ | Palmitic Acid, Palmitoleic Acid | Palmitic Acid |
| 257.248 | C16H33O2+ | Palmitic Acid, Stearic Acid | Stearic Acid |
| 261.222 | C18H29O+ | Linolenic Acid, Palmitoleic Acid | Linolenic Acid |
| 263.237 | C18H31O+ | Eicosatrienoic Acid | Eicosatrienoic Acid |
| 265.253 | C18H33O+ | Oleic Acid, Arachidic Acid | Oleic Acid, Arachidic Acid |
| 267.269 | C18H35O+ | Arachidic Acid | Arachidic Acid |
| 277.217 | C18H29O2+ | Multiple fatty acids | Linolenic Acid, Palmitic Acid, Palmitoleic Acid |
| 278.225 | C18H30O2+ | Multiple fatty acids | Linolenic Acid |
| 279.232 | C18H31O2+ | Eicosatrienoic Acid, Linolenic Acid | Eicosatrienoic Acid, Linolenic Acid |
| 280.240 | C18H32O2+ | Multiple fatty acids | Eicosatrienoic Acid |
| 281.191 | C20H25O+ | Oleic Acid, Arachidic Acid | Oleic Acid, Arachidic Acid |
| 282.256 | C18H34O2+ | Sphingosine | Sphingosine |
| 283.264 | C18H35O2 | Oleic Acid | Oleic Acid |
| 285.279 | C18H37O2+ | Stearic Acid | Stearic Acid |
| 293.284 | C20H37O+ | Arachidic Acid | Arachidic Acid |
| 295.300 | C20H39O+ | Arachidic Acid | Arachidic Acid |
| 296.308 | C20H40O+ | Arachidic Acid | Arachidic Acid |
| 300.290 | C18H38NO2+ | Sphingosine | Sphingosine |
| 311.295 | C20H39O2+ | Arachidic Acid | Arachidic Acid |
| 312.303 | C20H40O2+ | Arachidic Acid | Arachidic Acid |
| 313.311 | C20H41O2+ | Arachidic Acid | Arachidic Acid |
| 322.275 | C20H36NO2+ | Sphingosine | Sphingosine |
| 327.232 | C22H31O2+ | Docosahexaenoic Acid | Docosahexaenoic Acid |
| 329.247 | C22H33O2+ | Docosahexaenoic Acid | Docosahexaenoic Acid |
| 327.231 | C22H31O2+ | Docosahexaenoic Acid | Docosahexaenoic Acid |
| Mass (Da) | Peak assignment | Positive polarity peaks present in following fatty acids | Peak most prominent in |
|---|---|---|---|
| 27.023 | C2H3+ | All fatty acids | … |
| 29.039 | C2H5+ | All fatty acids | … |
| 39.023 | C3H3+ | All fatty acids | … |
| 41.039 | C3H5+ | All fatty acids | … |
| 43.055 | C3H7+ | All fatty acids | … |
| 55.055 | C4H7+ | All fatty acids | … |
| 57.070 | C4H9+ | All fatty acids | … |
| 60.045 | C2H6NO+ | Sphingosine | Sphingosine |
| 67.055 | C5H7+ | All fatty acids | … |
| 69.070 | C5H9+ | All fatty acids | … |
| 79.055 | C6H7+ | All fatty acids | … |
| 81.070 | C6H9+ | All fatty acids | … |
| 82.066 | C5H8N+ | Sphingosine | Sphingosine |
| 83.086 | C6H11+ | All fatty acids | … |
| 91.055 | C7H7+ | All fatty acids | … |
| 93.070 | C7H9+ | All fatty acids | … |
| 95.086 | C7H11+ | All fatty acids | … |
| 97.102 | C7H13+ | All fatty acids | … |
| 105.070 | C8H9+ | All fatty acids | … |
| 107.086 | C8H11+ | All fatty acids | … |
| 109.102 | C8H13+ | All fatty acids | … |
| 111.081 | C7H11O+ | Multiple fatty acids | Stearic Acid |
| 112.089 | C7H12O+ | Multiple fatty acids | Arachidic Acid, Sphingosine, Stearic Acid |
| 115.055 | C9H7+ | Multiple fatty acids | Linolenic Acid |
| 125.097 | C8H13O+ | Multiple fatty acids | Stearic Acid |
| 129.092 | C7H13O2+ | Arachidic Acid, Palmitoleic Acid, Stearic Acid | Stearic Acid |
| 138.104 | C9H14O+ | Sphingosine | Sphingosine |
| 139.112 | C9H15O+ | Multiple fatty acids | Stearic Acid |
| 143.107 | C8H15O2+ | Multiple fatty acids | Stearic Acid |
| 147.081 | C10H11O+ | Multiple fatty acids | Eicosatrienoic Acid, Linolenic Acid, Palmitic Acid |
| 153.128 | C10H17O+ | Multiple fatty acids | Stearic Acid |
| 155.107 | C9H15O2+ | Multiple fatty acids | Palmitoleic Acid |
| 157.123 | C9H17O2+ | Arachidic Acid, Palmitoleic Acid, Stearic Acid | Stearic Acid |
| 165.128 | C11H17O+ | Palmitoleic Acid | Palmitoleic Acid |
| 167.144 | C11H19O+ | Stearic Acid | Stearic Acid |
| 171.081 | C12H11O+ | Eicosatrienoic Acid | … |
| 171.117 | C13H15+ | Linolenic Acid | Linolenic Acid |
| 171.138 | C10H19O2+ | Stearic Acid | Stearic Acid |
| 173.060 | C11H9O2+ | Sphingosine | Sphingosine |
| 178.042 | C13H6O+ | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid |
| 181.123 | C11H17O2+ | Multiple fatty acids | Linolenic Acid, Palmitoleic Acid |
| 185.154 | C11H21O2+ | Arachidic Acid, Stearic Acid | Stearic Acid |
| 195.138 | C12H19O2+ | Eicosatrienoic Acid, , Linolenic Acid | Linolenic Acid |
| 195.175 | C13H23O+ | Stearic Acid | Stearic Acid |
| 196.146 | C12H20O2+ | Multiple fatty acids | Linolenic Acid, Palmitoleic Acid, Sphingosine |
| 209.154 | C13H21O2+ | Linolenic Acid, Palmitoleic Acid | Linolenic Acid |
| 209.191 | C14H25O+ | Stearic Acid | Stearic Acid |
| 210.162 | C13H22O2+ | Sphingosine | Linolenic Acid, Palmitoleic Acid, Sphingosine |
| 221.154 | C14H21O2+ | Multiple fatty acids | Eicosatrienoic Acid |
| 221.191 | C15H25O+ | Linolenic Acid | Linolenic Acid |
| 222.162 | C14H22O2+ | Linolenic Acid | Linolenic Acid |
| 223.170 | C14H23O2+ | Linolenic Acid | Linolenic Acid |
| 223.206 | C15H27O+ | Arachidic Acid, Stearic Acid | Arachidic Acid |
| 224.178 | C14H24O2+ | Linolenic Acid, Sphingosine | Sphingosine |
| 237.185 | C15H25O2+ | Linolenic Acid | Linolenic Acid |
| 237.222 | C16H29O+ | Multiple fatty acids | Palmitic Acid, Palmitoleic Acid |
| 238.193 | C15H26O2+ | Sphingosine | Sphingosine |
| 239.237 | C16H31O+ | Stearic Acid | Stearic Acid |
| 251.201 | C16H27O2+ | Palmitoleic Acid | Palmitoleic Acid |
| 251.237 | C17H31O+ | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid |
| 252.209 | C16H28O2+ | Palmitic Acid, Palmitoleic Acid | Palmitic Acid, Palmitoleic Acid |
| 253.217 | C16H29O2+ | Palmitic Acid, Palmitoleic Acid, Stearic Acid | Palmitic Acid, Palmitoleic Acid |
| 254.225 | C16H30O2+ | Palmitic Acid, Palmitoleic Acid, Sphingosine | Palmitoleic Acid |
| 255.232 | C16H31O2+ | Palmitic Acid, Palmitoleic Acid | Palmitic Acid, Palmitoleic Acid |
| 256.240 | C16H32O2+ | Palmitic Acid, Palmitoleic Acid | Palmitic Acid |
| 257.248 | C16H33O2+ | Palmitic Acid, Stearic Acid | Stearic Acid |
| 261.222 | C18H29O+ | Linolenic Acid, Palmitoleic Acid | Linolenic Acid |
| 263.237 | C18H31O+ | Eicosatrienoic Acid | Eicosatrienoic Acid |
| 265.253 | C18H33O+ | Oleic Acid, Arachidic Acid | Oleic Acid, Arachidic Acid |
| 267.269 | C18H35O+ | Arachidic Acid | Arachidic Acid |
| 277.217 | C18H29O2+ | Multiple fatty acids | Linolenic Acid, Palmitic Acid, Palmitoleic Acid |
| 278.225 | C18H30O2+ | Multiple fatty acids | Linolenic Acid |
| 279.232 | C18H31O2+ | Eicosatrienoic Acid, Linolenic Acid | Eicosatrienoic Acid, Linolenic Acid |
| 280.240 | C18H32O2+ | Multiple fatty acids | Eicosatrienoic Acid |
| 281.191 | C20H25O+ | Oleic Acid, Arachidic Acid | Oleic Acid, Arachidic Acid |
| 282.256 | C18H34O2+ | Sphingosine | Sphingosine |
| 283.264 | C18H35O2 | Oleic Acid | Oleic Acid |
| 285.279 | C18H37O2+ | Stearic Acid | Stearic Acid |
| 293.284 | C20H37O+ | Arachidic Acid | Arachidic Acid |
| 295.300 | C20H39O+ | Arachidic Acid | Arachidic Acid |
| 296.308 | C20H40O+ | Arachidic Acid | Arachidic Acid |
| 300.290 | C18H38NO2+ | Sphingosine | Sphingosine |
| 311.295 | C20H39O2+ | Arachidic Acid | Arachidic Acid |
| 312.303 | C20H40O2+ | Arachidic Acid | Arachidic Acid |
| 313.311 | C20H41O2+ | Arachidic Acid | Arachidic Acid |
| 322.275 | C20H36NO2+ | Sphingosine | Sphingosine |
| 327.232 | C22H31O2+ | Docosahexaenoic Acid | Docosahexaenoic Acid |
| 329.247 | C22H33O2+ | Docosahexaenoic Acid | Docosahexaenoic Acid |
| 327.231 | C22H31O2+ | Docosahexaenoic Acid | Docosahexaenoic Acid |
SPECTRAL FEATURES TABLE
| Mass (Da) | Peak assignment | Negative polarity peaks present in following fatty acids | Peak most prominent in |
|---|---|---|---|
| 25.010 | C2H− | All fatty acids | … |
| 26.003 | CN− | Sphingosine | Sphingosine |
| 41.003 | C2HO− | All fatty acids | … |
| 44.998 | CHO2− | Multiple fatty acids | Arachidic Acid, Eicosatrienoic Acid, Linolenic Acid, Sphingosine |
| 49.008 | C4H− | All fatty acids | … |
| 58.005 | C2H2O2− | All fatty acids | … |
| 58.029 | C2H4NO− | Sphingosine | Sphingosine |
| 71.013 | C3H3O2− | All fatty acids | … |
| 85.029 | C4H5O2− | All fatty acids | … |
| 93.034 | C6H5O− | Sphingosine | Sphingosine |
| 95.050 | C6H7O− | Sphingosine | Sphingosine |
| 99.045 | C5H7O2− | All fatty acids | … |
| 113.060 | C6H9O2− | All fatty acids | … |
| 127.076 | C7H11O2− | All fatty acids | … |
| 141.092 | C8H13O2− | All fatty acids | … |
| 155.107 | C9H15O2− | All fatty acids | … |
| 163.076 | C10H11O2− | Eicosatrienoic Acid, Linolenic Acid | Eicosatrienoic Acid, Linolenic Acid |
| 167.107 | C10H15O2− | All fatty acids | … |
| 169.123 | C10H17O2− | All fatty acids | … |
| 181.123 | C11H17O2− | All fatty acids | … |
| 183.138 | C11H19O2− | All fatty acids | … |
| 195.138 | C12H19O2− | All fatty acids | … |
| 197.154 | C12H21O2− | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid, Sphingosine, Stearic Acid |
| 209.154 | C13H21O2− | All fatty acids | … |
| 211.170 | C13H23O2− | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid, Sphingosine, Stearic Acid |
| 221.154 | C14H21O2− | Multiple fatty acids | Eicosatrienoic Acid, Linolenic Acid, Stearic Acid |
| 223.170 | C14H23O2− | All fatty acids | Eicosatrienoic Acid, Linolenic Acid, Sphingosine Acid, Stearic Acid |
| 225.185 | C14H25O2− | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid, Sphingosine, Stearic Acid |
| 227.201 | C14H27O2− | Sphingosine, Stearic Acid | Sphingosine |
| 235.170 | C15H23O2− | Eicosatrienoic Acid, Linolenic Acid | Eicosatrienoic Acid, Linolenic Acid |
| 237.185 | C15H25O2− | Multiple fatty acids | Eicosatrienoic Acid, Linolenic Acid |
| 237.222 | C16H29O− | Sphingosine | Sphingosine |
| 239.201 | C15H27O2− | Arachidic Acid, Stearic Acid | Arachidic Acid, Stearic Acid |
| 249.185 | C16H25O2− | Multiple fatty acids | Eicosatrienoic Acid, Linolenic Acid |
| 251.201 | C16H27O2− | Multiple fatty acids | Palmitic Acid, Palmitoleic Acid |
| 252.209 | C16H28O2− | Multiple fatty acids | Palmitic Acid, Palmitoleic Acid |
| 253.217 | C16H29O2− | Multiple fatty acids | Palmitic Acid, Palmitoleic Acid, Stearic Acid |
| 253.253 | C17H33O− | Sphingosine | Sphingosine |
| 254.225 | C16H30O2− | Arachidic Acid, Palmitic Acid, Palmitoleic Acid | Palmitic Acid, Palmitoleic Acid |
| 255.232 | C16H31O2− | Arachidic Acid, Linolenic Acid, Stearic Acid | Linolenic Acid, Stearic Acid |
| 263.201 | C17H27O2− | Eicosatrienoic Acid, Linolenic Acid | Linolenic Acid |
| 267.232 | C17H31O2− | Arachidic Acid, Stearic Acid | Arachidic Acid, Stearic Acid |
| 277.217 | C18H29O2− | Oleic Acid, Eicosatrienoic Acid, Linolenic Acid | Oleic Acid, Eicosatrienoic Acid, Linolenic Acid |
| 278.225 | C18H30O2− | Eicosatrienoic Acid, Linolenic Acid | Linolenic Acid |
| 279.232 | C18H31O2− | Multiple fatty acids | Oleic Acid, Eicosatrienoic Acid, Linolenic Acid |
| 280.240 | C18H32O2− | Stearic Acid | Stearic Acid |
| 281.248 | C18H33O2− | Multiple fatty acids | Arachidic Acid, Stearic Acid |
| 282.256 | C18H34O2− | Stearic Acid | Stearic Acid |
| 283.264 | C18H35O2− | Stearic Acid | Stearic Acid |
| 284.272 | C18H36O2− | Stearic Acid | Stearic Acid |
| 295.264 | C19H35O2− | Arachidic Acid | Arachidic Acid |
| 298.275 | C18H36NO2− | Sphingosine | Sphingosine |
| 305.248 | C20H33O2− | Eicosatrienoic Acid | Eicosatrienoic Acid |
| 311.295 | C20H39O2− | Arachidic Acid | Arachidic Acid |
| 327.231 | C22H31O2− | Docosahexaenoic Acid | Docosahexaenoic Acid |
| Mass (Da) | Peak assignment | Negative polarity peaks present in following fatty acids | Peak most prominent in |
|---|---|---|---|
| 25.010 | C2H− | All fatty acids | … |
| 26.003 | CN− | Sphingosine | Sphingosine |
| 41.003 | C2HO− | All fatty acids | … |
| 44.998 | CHO2− | Multiple fatty acids | Arachidic Acid, Eicosatrienoic Acid, Linolenic Acid, Sphingosine |
| 49.008 | C4H− | All fatty acids | … |
| 58.005 | C2H2O2− | All fatty acids | … |
| 58.029 | C2H4NO− | Sphingosine | Sphingosine |
| 71.013 | C3H3O2− | All fatty acids | … |
| 85.029 | C4H5O2− | All fatty acids | … |
| 93.034 | C6H5O− | Sphingosine | Sphingosine |
| 95.050 | C6H7O− | Sphingosine | Sphingosine |
| 99.045 | C5H7O2− | All fatty acids | … |
| 113.060 | C6H9O2− | All fatty acids | … |
| 127.076 | C7H11O2− | All fatty acids | … |
| 141.092 | C8H13O2− | All fatty acids | … |
| 155.107 | C9H15O2− | All fatty acids | … |
| 163.076 | C10H11O2− | Eicosatrienoic Acid, Linolenic Acid | Eicosatrienoic Acid, Linolenic Acid |
| 167.107 | C10H15O2− | All fatty acids | … |
| 169.123 | C10H17O2− | All fatty acids | … |
| 181.123 | C11H17O2− | All fatty acids | … |
| 183.138 | C11H19O2− | All fatty acids | … |
| 195.138 | C12H19O2− | All fatty acids | … |
| 197.154 | C12H21O2− | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid, Sphingosine, Stearic Acid |
| 209.154 | C13H21O2− | All fatty acids | … |
| 211.170 | C13H23O2− | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid, Sphingosine, Stearic Acid |
| 221.154 | C14H21O2− | Multiple fatty acids | Eicosatrienoic Acid, Linolenic Acid, Stearic Acid |
| 223.170 | C14H23O2− | All fatty acids | Eicosatrienoic Acid, Linolenic Acid, Sphingosine Acid, Stearic Acid |
| 225.185 | C14H25O2− | Arachidic Acid, Sphingosine, Stearic Acid | Arachidic Acid, Sphingosine, Stearic Acid |
| 227.201 | C14H27O2− | Sphingosine, Stearic Acid | Sphingosine |
| 235.170 | C15H23O2− | Eicosatrienoic Acid, Linolenic Acid | Eicosatrienoic Acid, Linolenic Acid |
| 237.185 | C15H25O2− | Multiple fatty acids | Eicosatrienoic Acid, Linolenic Acid |
| 237.222 | C16H29O− | Sphingosine | Sphingosine |
| 239.201 | C15H27O2− | Arachidic Acid, Stearic Acid | Arachidic Acid, Stearic Acid |
| 249.185 | C16H25O2− | Multiple fatty acids | Eicosatrienoic Acid, Linolenic Acid |
| 251.201 | C16H27O2− | Multiple fatty acids | Palmitic Acid, Palmitoleic Acid |
| 252.209 | C16H28O2− | Multiple fatty acids | Palmitic Acid, Palmitoleic Acid |
| 253.217 | C16H29O2− | Multiple fatty acids | Palmitic Acid, Palmitoleic Acid, Stearic Acid |
| 253.253 | C17H33O− | Sphingosine | Sphingosine |
| 254.225 | C16H30O2− | Arachidic Acid, Palmitic Acid, Palmitoleic Acid | Palmitic Acid, Palmitoleic Acid |
| 255.232 | C16H31O2− | Arachidic Acid, Linolenic Acid, Stearic Acid | Linolenic Acid, Stearic Acid |
| 263.201 | C17H27O2− | Eicosatrienoic Acid, Linolenic Acid | Linolenic Acid |
| 267.232 | C17H31O2− | Arachidic Acid, Stearic Acid | Arachidic Acid, Stearic Acid |
| 277.217 | C18H29O2− | Oleic Acid, Eicosatrienoic Acid, Linolenic Acid | Oleic Acid, Eicosatrienoic Acid, Linolenic Acid |
| 278.225 | C18H30O2− | Eicosatrienoic Acid, Linolenic Acid | Linolenic Acid |
| 279.232 | C18H31O2− | Multiple fatty acids | Oleic Acid, Eicosatrienoic Acid, Linolenic Acid |
| 280.240 | C18H32O2− | Stearic Acid | Stearic Acid |
| 281.248 | C18H33O2− | Multiple fatty acids | Arachidic Acid, Stearic Acid |
| 282.256 | C18H34O2− | Stearic Acid | Stearic Acid |
| 283.264 | C18H35O2− | Stearic Acid | Stearic Acid |
| 284.272 | C18H36O2− | Stearic Acid | Stearic Acid |
| 295.264 | C19H35O2− | Arachidic Acid | Arachidic Acid |
| 298.275 | C18H36NO2− | Sphingosine | Sphingosine |
| 305.248 | C20H33O2− | Eicosatrienoic Acid | Eicosatrienoic Acid |
| 311.295 | C20H39O2− | Arachidic Acid | Arachidic Acid |
| 327.231 | C22H31O2− | Docosahexaenoic Acid | Docosahexaenoic Acid |
ACKNOWLEDGMENTS
The authors are thankful for the funding received from the National Institutes of Health (NIH) (No. NESACBIO NIH P41 EB002027). Part of this work was conducted at the Molecular Analysis Facility, a National Nanotechnology Coordinated Infrastructure site at the University of Washington which is supported in part by the National Science Foundation (Grant No. NNCI-1542101), the University of Washington, the Molecular Engineering and Sciences Institute, and the Clean Energy Institute.
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