We present high-resolution XPS spectra of elemental vanadium, niobium and tantalum sputter-cleaned by Ar+ ions. The energy scales are shown without applying any corrections, and the position of the Fermi level was verified to be at zero binding energy within better than 0.1 eV, as determined from the Fermi edge measurement.

Combinatorial science deals with complex materials with compositions containing many elements, often with overlapping features in their XPS spectra. At the Joint Center for Artificial Photosynthesis, we explore such material spaces in high-throughput, to find the most suitable catalysts and light absorbers for direct conversion of sunlight into fuels. In order to develop the tools for reliable determination of surface chemical compositions by XPS, we have acquired consistent and comparable reference spectra in high-resolution for all measurable core levels of a particular pure element, or their stable compounds. The data are acquired on the same machine, with the same pass energy and x-ray power; and they contain all measurable loss features. In this publication, we present the results for group five elements.

Host Material vanadium

CAS Registry # 7440-62-2

Host Material Characteristics homogeneous; solid; unknown crystallinity; conductor; metal

Chemical Name V

Source Sigma-Aldrich, Co.

Host Composition vanadium 99.7%

Form foil

Lot # MKBP7987V

Structure bcc

History & Significance 99.7% pure vanadium

As Received Condition as received from supplier (polished)

Analyzed Region not specified

Ex Situ Preparation/Mounting The foil was cleaned by wiping with isopropyl alcohol, and then mounted under the conductive contact of the sample platen.

In Situ Preparation Surface was ion-sputtered until no O 1s or C 1s were visible in a high pass energy, wide scan.

Pre-Analysis Beam Exposure no exposure prior to data acquisition

Charge Control no charge control applied

Temp. During Analysis 300 K

Pressure During Analysis <5 × 10−7 Pa

Host Material niobium

CAS Registry # 7440-03-1

Host Material Characteristics unknown homogeneity; solid; unknown crystallinity; conductor; metal

Chemical Name Nb

Source Alfa Aesar

Host Composition Nb 99.95% (metals basis excluding Ta)

Form not specified

Lot # C03Q25

As Received Condition as received from supplier

Analyzed Region not specified

Ex Situ Preparation/Mounting Mounted on conductive tape on the sample platen in electrical contact with the analyzer.

In Situ Preparation Surface was ion-sputtered until no O 1s or C 1s were visible in a high pass energy, wide scan.

Pre-Analysis Beam Exposure

Charge Control none

Temp. During Analysis 300 K

Pressure During Analysis <5 × 10−7 Pa

Host Material tantalum

CAS Registry # 7440-25-7

Host Material Characteristics homogeneous; solid; unknown crystallinity; conductor; metal

Chemical Name Ta

Source Sigma-Aldrich, Co.

Host Composition tantalum 99.9% trace metal basis

Form foil, thickness 0.25 mm

Lot # MKBW6466V

As Received Condition as received from supplier (polished)

Analyzed Region not specified

Ex Situ Preparation/Mounting sample was wiped with isopropanol

In Situ Preparation Surface was ion-sputtered until no O 1s or C 1s were visible in a high pass energy, wide scan.

Pre-Analysis Beam Exposure

Charge Control none

Temp. During Analysis 300 K

Pressure During Analysis <5 × 10−7 Pa

Manufacturer and Model Kratos Analytical Axis Nova

Analyzer Type Other

Number of Detector Elements 127

Analyzer Description Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

Analyzer Mode constant pass energy

Throughput (T=EN) N=See comment below

Throughput Comment The energy dependence is recorded in a file at the time of data acquisition.

Excitation Source Window Aluminum K-alpha monochromatic excitation at 1486.6 eV

Excitation Source Al Kα, monochromatic

Source Energy 1486.6 eV

Source Strength 150 W

Signal Mode

Incident Angle not specified

Source to Analyzer Angle not specified

Emission Angle not specified

Specimen Azimuthal Angle

Acceptance Angle from Analyzer Axis 35.5°

Manufacturer and Model Kratos Analytical Ltd. Minibeam IV

Energy 4000 eV

Current 0.120 mA/cm2

Current Measurement Method biased stage

Sputtering Species Ar+

Spot Size (unrastered) 500 μm

Raster Size 2000 μm × 2000 μm

Azimuthal Angle

Comment no rotation

Energy Scale Correction No energy shifting has been applied to any spectra.

Recommended Energy Scale Shift We do not recommend any energy scale shifts.

Peak Shape and Background Method

Quantitation Method

SPECTRAL FEATURES TABLE

Spectrum ID #Element/TransitionPeak Energy (eV)Peak Width FWHM (eV)Peak Area (eV × cts/s)Sensitivity FactorConcentration (at. %)Peak Assignment
01408-02 V 2p3/2 506.60 0.60 24570 1.41 ··· 
01408-02 V 2p1/2 514.15 0.63 11990 0.71 ··· 
01408-02 O 1s 525.49 1.91 1970 0.78 ··· 
01408-03 V 3p 31.43 0.917 3910 0.274 ··· 
01408-04 V 3s 60.30 1.99 2150 0.131 ··· 
01408-05 V 2s 620.58 6.11 8540 0.673 ··· 
01409-02 Nb 3d5/2 202.26 0.433 28130 1.75 ··· Nb 
01409-02 Nb 3d3/2 204.99 0.433 14070 1.17 ··· Nb 
01409-04 Nb 3p3/2 360.35 2.181 38020 1.75 ··· Nb 
01409-04 Nb 3p1/2 374.86 2.181 15410 0.88 ··· Nb 
01409-05 Nb 4s 56.00 4.7 1874 0.126 ··· Nb 
01409-05 Nb 4p3/2 30.60 1.13 3907 0.254 ··· Nb 
01409-05 Nb 4p1/2 32.45 1.16 1954 0.127 ··· Nb 
01409-06 Nb 3s 466.55 6.76 6250 0.393 ··· Nb 
01410-02 Ta 4f7/2 21.56 0.39 22000 1.761 ··· Ta 
01410-02 Ta 4f5/2 23.48 0.39 16500 1.321 ··· Ta 
01410-02 Ta 4f7/2 23.06 1.06 2865 1.761 ··· Ta-O 
01410-02 Ta 4f5/2 24.98 1.06 2150 1.321 ··· Ta-O 
01410-03 Ta 4d5/2 226.33 5.69 46830 2.17 ··· Ta 
01410-03 Ta 4d3/2 237.49 5.70 31380 1.08 ··· Ta 
01410-04 Ta 4p3/2 401.02 6.9 26110 2.170 ··· Ta 
01410-04 Ta 4p1/2 462.20 6.9 13055 1.085 ··· Ta 
01410-04 Ta 4p3/2 420.82 16.16 13690 2.170 ··· Ta-O 
01410-04 Ta 4p1/2 482.00 16.16 6820 1.085 ··· Ta-O 
01410-04 O 1s 530.80 1.55 1340 0.78 ··· 
01410-05 Ta 4s 563.02 8.135 5605 0.244 ··· Ta 
01410-06 Ta 5s 68.75 8.88 2840 0.227 ··· Ta 
01410-06 Ta 5p3/2 32.51 1.60 ··· 0.262 ··· Ta 
01410-06 Ta 5p1/2 43.71 7.51 10700 0.131 ··· Ta 
Spectrum ID #Element/TransitionPeak Energy (eV)Peak Width FWHM (eV)Peak Area (eV × cts/s)Sensitivity FactorConcentration (at. %)Peak Assignment
01408-02 V 2p3/2 506.60 0.60 24570 1.41 ··· 
01408-02 V 2p1/2 514.15 0.63 11990 0.71 ··· 
01408-02 O 1s 525.49 1.91 1970 0.78 ··· 
01408-03 V 3p 31.43 0.917 3910 0.274 ··· 
01408-04 V 3s 60.30 1.99 2150 0.131 ··· 
01408-05 V 2s 620.58 6.11 8540 0.673 ··· 
01409-02 Nb 3d5/2 202.26 0.433 28130 1.75 ··· Nb 
01409-02 Nb 3d3/2 204.99 0.433 14070 1.17 ··· Nb 
01409-04 Nb 3p3/2 360.35 2.181 38020 1.75 ··· Nb 
01409-04 Nb 3p1/2 374.86 2.181 15410 0.88 ··· Nb 
01409-05 Nb 4s 56.00 4.7 1874 0.126 ··· Nb 
01409-05 Nb 4p3/2 30.60 1.13 3907 0.254 ··· Nb 
01409-05 Nb 4p1/2 32.45 1.16 1954 0.127 ··· Nb 
01409-06 Nb 3s 466.55 6.76 6250 0.393 ··· Nb 
01410-02 Ta 4f7/2 21.56 0.39 22000 1.761 ··· Ta 
01410-02 Ta 4f5/2 23.48 0.39 16500 1.321 ··· Ta 
01410-02 Ta 4f7/2 23.06 1.06 2865 1.761 ··· Ta-O 
01410-02 Ta 4f5/2 24.98 1.06 2150 1.321 ··· Ta-O 
01410-03 Ta 4d5/2 226.33 5.69 46830 2.17 ··· Ta 
01410-03 Ta 4d3/2 237.49 5.70 31380 1.08 ··· Ta 
01410-04 Ta 4p3/2 401.02 6.9 26110 2.170 ··· Ta 
01410-04 Ta 4p1/2 462.20 6.9 13055 1.085 ··· Ta 
01410-04 Ta 4p3/2 420.82 16.16 13690 2.170 ··· Ta-O 
01410-04 Ta 4p1/2 482.00 16.16 6820 1.085 ··· Ta-O 
01410-04 O 1s 530.80 1.55 1340 0.78 ··· 
01410-05 Ta 4s 563.02 8.135 5605 0.244 ··· Ta 
01410-06 Ta 5s 68.75 8.88 2840 0.227 ··· Ta 
01410-06 Ta 5p3/2 32.51 1.60 ··· 0.262 ··· Ta 
01410-06 Ta 5p1/2 43.71 7.51 10700 0.131 ··· Ta 

ANALYZER CALIBRATION TABLE

Spectrum ID #Element/TransitionPeak Energy (eV)Peak Width FWHM (eV)Peak Area (eV × cts/s)Sensitivity FactorConcentration (at. %)Peak Assignment
1408-07 a V Fermi edge ··· ··· ··· ··· Fermi edge 
1409-08 b Nb Fermi edge ··· ··· ··· ··· ··· 
1410-08 c Ta Fermi edge ··· ··· ··· ··· ··· 
1411-01 d Ag 3d5/2 368.24 0.52 129360 ··· ··· 3d5/2 
1411-02 e Ag 3d5/2 367.69 2.00 10393 ··· ··· 3d5/2 
Spectrum ID #Element/TransitionPeak Energy (eV)Peak Width FWHM (eV)Peak Area (eV × cts/s)Sensitivity FactorConcentration (at. %)Peak Assignment
1408-07 a V Fermi edge ··· ··· ··· ··· Fermi edge 
1409-08 b Nb Fermi edge ··· ··· ··· ··· ··· 
1410-08 c Ta Fermi edge ··· ··· ··· ··· ··· 
1411-01 d Ag 3d5/2 368.24 0.52 129360 ··· ··· 3d5/2 
1411-02 e Ag 3d5/2 367.69 2.00 10393 ··· ··· 3d5/2 
a

Fermi function fit gives position of the Fermi level at E = 0.056 (0.005) eV, and broadening that includes thermal and instrumental broadening T = 0.094 (0.004) eV, which includes thermal broadening and instrument resolution.

b

Fermi function fit gives position of the Fermi level at E = 0.073 (0.004) eV, and broadening that includes thermal and instrumental broadening T = 0.093 (0.004) eV, which includes thermal broadening and instrument resolution.

c

Fermi function fit gives position of the Fermi level at E = 0.023 (0.003) eV, and broadening that includes thermal and instrumental broadening T = 0.094 (0.003) eV, which includes thermal broadening and instrument resolution.

d

Ag 3d5/2 calibration peak with passing energy of 10 eV.

e

Ag 3d5/2 calibration peak with passing energy of 160 eV.

GUIDE TO FIGURES

Spectrum (Accession) #Spectral RegionVoltage ShiftaMultiplierBaselineComment #
1408-01 survey 
1408-02 O 1s, V 2p 1/2, V 2p 3/2 
1408-03 V 3p 
1408-04 V 3s 
1408-05 V 2s 
1408-06 V LMM 
1408-07 V valence band 
1408-07 V valence band, fit 
1409-01 survey 
1409-02 Nb 3d3/2, Nb 3d5/2 
1409-03 Nb 3d5/2, Nb 3d3/2 
1409-04 Nb 3p1/2, Nb 3p3/2 
1409-05 Nb 4s, Nb 4p1/2, Nb 4p3/2 
1409-06 Nb 3s 
1409-07 Nb MNN 
1409-08 Nb valence band 
1409-08 Nb valence band, fit 
1410-01 survey 
1410-02 Ta 4f5/2, Ta 4f7/2 
1410-03 Ta 4d3/2, Ta 4d5/2 
1410-04 O 1s, Ta 4p1/2, Ta 4p3/2 
1410-05 Ta 4s 
1410-06 Ta 5s, Ta 5p1/2, Ta 5p3/2 
1410-07 Ta NNN 
1410-08 Ta valence band 
1410-08 Ta valence band, fit 
1411-01 [NP]b Ag 3d5/2, Ag 3d3/2 
1411-02 [NP] Ag 3d5/2, Ag 3d3/2 
Spectrum (Accession) #Spectral RegionVoltage ShiftaMultiplierBaselineComment #
1408-01 survey 
1408-02 O 1s, V 2p 1/2, V 2p 3/2 
1408-03 V 3p 
1408-04 V 3s 
1408-05 V 2s 
1408-06 V LMM 
1408-07 V valence band 
1408-07 V valence band, fit 
1409-01 survey 
1409-02 Nb 3d3/2, Nb 3d5/2 
1409-03 Nb 3d5/2, Nb 3d3/2 
1409-04 Nb 3p1/2, Nb 3p3/2 
1409-05 Nb 4s, Nb 4p1/2, Nb 4p3/2 
1409-06 Nb 3s 
1409-07 Nb MNN 
1409-08 Nb valence band 
1409-08 Nb valence band, fit 
1410-01 survey 
1410-02 Ta 4f5/2, Ta 4f7/2 
1410-03 Ta 4d3/2, Ta 4d5/2 
1410-04 O 1s, Ta 4p1/2, Ta 4p3/2 
1410-05 Ta 4s 
1410-06 Ta 5s, Ta 5p1/2, Ta 5p3/2 
1410-07 Ta NNN 
1410-08 Ta valence band 
1410-08 Ta valence band, fit 
1411-01 [NP]b Ag 3d5/2, Ag 3d3/2 
1411-02 [NP] Ag 3d5/2, Ag 3d3/2 
*

Voltage shift of the archived (as-measured) spectrum relative to the printed figure. The figure reflects the recommended energy scale correction due to a calibration correction, sample charging, flood gun, or other phenomenon.

**

[NP] signifies not published; digital spectra are archived in SSS database but not reproduced in the printed journal.

1. Vanadium foil

2. Niobium slug

3. Tantalum foil

4. Ag pellet

Accession #01408–01
Host Material vanadium 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 3616.5 s 
Total Elapsed Time not specified 
Number of Scans 
Accession #01408–01
Host Material vanadium 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 3616.5 s 
Total Elapsed Time not specified 
Number of Scans 

Accession #01408–01
Host Material vanadium 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 3616.5 s 
Total Elapsed Time not specified 
Number of Scans 
Accession #01408–01
Host Material vanadium 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 3616.5 s 
Total Elapsed Time not specified 
Number of Scans 

Close modal

  • Accession #:01408–02

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: O 1s; V 2p1/2; V 2p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 1746 s

  • Total Elapsed Time: not specified

  • Number of Scans: 4

  • Accession #:01408–02

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: O 1s; V 2p1/2; V 2p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 1746 s

  • Total Elapsed Time: not specified

  • Number of Scans: 4

Close modal

  • Accession #:01408–03

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V 3p

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2692.2 s

  • Total Elapsed Time: not specified

  • Number of Scans: 14

  • Accession #:01408–03

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V 3p

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2692.2 s

  • Total Elapsed Time: not specified

  • Number of Scans: 14

Close modal

  • Accession #:01408–04

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V 3s

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2766 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

  • Accession #:01408–04

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V 3s

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2766 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

Close modal

  • Accession #:01408–05

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V 2s

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 6404 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

  • Accession #:01408–05

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V 2s

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 6404 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

Close modal

  • Accession #:01408–06

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V LMM

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 14404 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

  • Accession #:01408–06

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V LMM

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 14404 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

Close modal

  • Accession #:01408–07

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V valence band

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 4815 s

  • Total Elapsed Time: not specified

  • Number of Scans: 50

  • Comment: Following figure shows Fermi function fit calibration reference. See Analyzer Calibration Table entry for V Fermi edge.

  • Accession #:01408–07

  • Host Material: vanadium

  • Technique: XPS

  • Spectral Region: V valence band

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 4815 s

  • Total Elapsed Time: not specified

  • Number of Scans: 50

  • Comment: Following figure shows Fermi function fit calibration reference. See Analyzer Calibration Table entry for V Fermi edge.

Close modal

Accession #01409–01
Host Material niobium 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 542 s 
Total Elapsed Time not specified 
Number of Scans 
Accession #01409–01
Host Material niobium 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 542 s 
Total Elapsed Time not specified 
Number of Scans 

Accession #01409–01
Host Material niobium 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 542 s 
Total Elapsed Time not specified 
Number of Scans 
Accession #01409–01
Host Material niobium 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 542 s 
Total Elapsed Time not specified 
Number of Scans 

Close modal

  • Accession #:01409–02

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 3d3/2; Nb 3d5/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 587 s

  • Total Elapsed Time: not specified

  • Number of Scans: 2

  • Accession #:01409–02

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 3d3/2; Nb 3d5/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 587 s

  • Total Elapsed Time: not specified

  • Number of Scans: 2

Close modal

  • Accession #:01409–03

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 3d5/2; Nb 3d3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 1467 s

  • Total Elapsed Time: not specified

  • Number of Scans: 4

  • Accession #:01409–03

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 3d5/2; Nb 3d3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 1467 s

  • Total Elapsed Time: not specified

  • Number of Scans: 4

Close modal

  • Accession #:01409–04

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 3p1/2; Nb 3p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 4690 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

  • Accession #:01409–04

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 3p1/2; Nb 3p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 4690 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

Close modal

  • Accession #:01409–05

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 4s; Nb 4p1/2; Nb 4p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 6004 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

  • Accession #:01409–05

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 4s; Nb 4p1/2; Nb 4p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 6004 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

Close modal

  • Accession #:01409–06

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 3s

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2408 s

  • Total Elapsed Time: not specified

  • Number of Scans: 80

  • Accession #:01409–06

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb 3s

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2408 s

  • Total Elapsed Time: not specified

  • Number of Scans: 80

Close modal

  • Accession #:01409–07

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb MNN

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 4004 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

  • Accession #:01409–07

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb MNN

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 4004 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

Close modal

  • Accession #:01409–08

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb valence band

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2046 s

  • Total Elapsed Time: not specified

  • Number of Scans: 30

  • Accession #:01409–08

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb valence band

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2046 s

  • Total Elapsed Time: not specified

  • Number of Scans: 30

Close modal

  • Accession #:01409–08

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb valence band

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2046 s

  • Total Elapsed Time: not specified

  • Number of Scans: 30

  • Comment: Following figure shows Fermi function fit calibration reference. See Analyzer Calibration Table entry for Nb Fermi edge.

  • Accession #:01409–08

  • Host Material: niobium

  • Technique: XPS

  • Spectral Region: Nb valence band

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2046 s

  • Total Elapsed Time: not specified

  • Number of Scans: 30

  • Comment: Following figure shows Fermi function fit calibration reference. See Analyzer Calibration Table entry for Nb Fermi edge.

Close modal

Accession #01410–01
Host Material tantalum 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 271 s 
Total Elapsed Time not specified 
Number of Scans 
Accession #01410–01
Host Material tantalum 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 271 s 
Total Elapsed Time not specified 
Number of Scans 

Accession #01410–01
Host Material tantalum 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 271 s 
Total Elapsed Time not specified 
Number of Scans 
Accession #01410–01
Host Material tantalum 
Technique XPS 
Spectral Region survey 
Instrument Kratos Analytical Axis Nova 
Excitation Source Al Kα monochromatic 
Source Energy 1486.6 eV 
Source Strength 150 W 
Source Size not specified 
Analyzer Type Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA) 
Incident Angle not specified 
Emission Angle not specified 
Analyzer Pass Energy: 160 eV 
Analyzer Resolution 2.0 eV 
Total Signal Accumulation Time 271 s 
Total Elapsed Time not specified 
Number of Scans 

Close modal

  • Accession #:01410–02

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta 4f5/2; Ta 4f7/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 551 s

  • Total Elapsed Time: not specified

  • Number of Scans: 2

  • Accession #:01410–02

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta 4f5/2; Ta 4f7/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 551 s

  • Total Elapsed Time: not specified

  • Number of Scans: 2

Close modal

  • Accession #:01410–03

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta 4d3/2; Ta 4d5/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2635 s

  • Total Elapsed Time: not specified

  • Number of Scans: 16

  • Accession #:01410–03

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta 4d3/2; Ta 4d5/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 2635 s

  • Total Elapsed Time: not specified

  • Number of Scans: 16

Close modal

  • Accession #:01410–04

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: O 1s; Ta 4p1/2; Ta 4p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 3226 s

  • Total Elapsed Time: not specified

  • Number of Scans: 26

  • Accession #:01410–04

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: O 1s; Ta 4p1/2; Ta 4p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 3226 s

  • Total Elapsed Time: not specified

  • Number of Scans: 26

Close modal

  • Accession #:01410–05

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta 4s

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 10217 s

  • Total Elapsed Time: not specified

  • Number of Scans: 64

  • Accession #:01410–05

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta 4s

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 10217 s

  • Total Elapsed Time: not specified

  • Number of Scans: 64

Close modal

  • Accession #:01410–06

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta 5s; Ta 5p1/2; Ta 5p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 17156 s

  • Total Elapsed Time: not specified

  • Number of Scans: 18

  • Accession #:01410–06

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta 5s; Ta 5p1/2; Ta 5p3/2

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 17156 s

  • Total Elapsed Time: not specified

  • Number of Scans: 18

Close modal

  • Accession #:01410–07

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta NNN

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 4142 s

  • Total Elapsed Time: not specified

  • Number of Scans: 18

  • Accession #:01410–07

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta NNN

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 4142 s

  • Total Elapsed Time: not specified

  • Number of Scans: 18

Close modal

  • Accession #:01410–08

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta valence band

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 1364 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

  • Comment: Following figure shows Fermi function fit calibration reference. See Analyzer Calibration Table entry for Ta Fermi edge.

  • Accession #:01410–08

  • Host Material: tantalum

  • Technique: XPS

  • Spectral Region: Ta valence band

  • Instrument: Kratos Analytical Axis Nova

  • Excitation Source: Al Kα monochromatic

  • Source Energy: 1486.6 eV

  • Source Strength: 150 W

  • Source Size: not specified

  • Analyzer Type: Combined hemispherical analyzer (HSA) and spherical mirror analyzer (SMA)

  • Incident Angle: not specified

  • Emission Angle: not specified

  • Analyzer Pass Energy: 10 eV

  • Analyzer Resolution: 0.53 eV

  • Total Signal Accumulation Time: 1364 s

  • Total Elapsed Time: not specified

  • Number of Scans: 20

  • Comment: Following figure shows Fermi function fit calibration reference. See Analyzer Calibration Table entry for Ta Fermi edge.

Close modal

This material is based upon work performed by the Joint Center for Artificial Photosynthesis, a DOE Energy Innova:on Hub, supported through the Office of Science of the U.S. Department of Energy under Award Number DE-SC0004993.

Supplementary Material