Hard X-ray Photoelectron Spectroscopy (HAXPES) using monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered potassium iodide (KI) sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.

Topics
Auger effect, X-ray photoelectron spectroscopy, Surface science
1.
J. F.
Moulder
,
W. F.
Stickle
,
P. E.
Sobol
, and
K. D.
Bomben
, in
Handbook of X-Ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data
, edited by
J.
Chastain
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Physical Electronics
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Eden Prairie
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Google Scholar
 
2.
See the supplementary material online for the figures.
2023 Published under an exclusive license by the AVS.
2023
Author(s)

Supplementary Material

Supplementary materials- zip file
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