Pt thin film was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.3 eV) excitation source. Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. The survey spectrum, Pt 3d, Pt 4f, Pt 4d, C 1s, and valence band core levels spectra were acquired.

Supplementary Material

You do not currently have access to this content.