Hard X-ray Photoelectron Spectroscopy (HAXPES) with monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered Au and Pt samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of the observed Auger lines are presented herein.

Topics
Thin films, X-ray photoelectron spectroscopy, Surface science
1.
C.
Zborowski
,
T.
Conard
,
A.
Vanleenhove
,
I.
Hoflijk
, and
I.
Vaesen
,
Surf. Sci. Spectra
29
,
024004
(
2022
).
https://doi.org/10.1116/6.0001954
Google Scholar
Crossref
Search ADS
 
2.
J. F.
Moulder
,
W. F.
Stickle
,
P. E.
Sobol
, and
K. D.
Bomben
, in
Handbook of X-Ray Photoelectron Spectroscopy: A Reference Book of Standard Spectra for Identification and Interpretation of XPS Data
, edited by
Chastain
J.
 (
Physical Electronics
,
Eden Prairie
,
MN
,
1995
).
Google Scholar
 
2023 Published under an exclusive license by the AVS.
2023
Author(s)

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