Hard X-ray Photoelectron Spectroscopy (HAXPES) with monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered Au and Pt samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of the observed Auger lines are presented herein.

Topics
Thin films, X-ray photoelectron spectroscopy, Surface science
2023 Published under an exclusive license by the AVS.
2023
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