An Al2O3 sapphire sample was analyzed using high-resolution high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Al2O3 obtained using monochromatic Cr Kα radiation at 5414.8 eV include two survey scans (Al Kα and Cr Kα) and high-resolution spectra of Al 2p, Al 2s, Al 1s, and O 1s.

Topics
Sample handling, Optical communications, Ion source, Oxides, Surface science, X-ray photoelectron spectroscopy
© 2022 Author(s). Published under an exclusive license by the AVS.
2022
Author(s)

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