Near ambient pressure-x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at greater than 2500 Pa. With NAP-XPS, XPS can probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this paper, we show the NAP-XPS survey; O 1s, Ca 2p, C 1s, K 2p, Al 2s, Al 2p, Si 2p, and Si 2s narrow scans; and the extended valence band spectrum of clinoptilolite, a natural zeolite that would be difficult to analyze by conventional XPS. A small N 1s signal from N2(g) is also observed in the survey spectrum. Signals in the narrow scans are fit to Gaussian–Lorentzian sum and Gaussian–Lorentzian product functions.

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