Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at greater than 2500 Pa. With NAP-XPS, XPS can probe moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission, we show survey, C 1s, and O 1s NAP-XPS spectra of polyethylene terephthalate, a common, widely used thermoplastic. The C 1s envelope was fit with different approaches, i.e., to three, four, and five Gaussian–Lorentzian sum (GLS) functions. Hartree–Fock orbital energy calculations of a model trimer served as a guide to an additional fit of the C 1s envelope. The best fit was obtained by adding an extra component to the four-component fit to compensate for adventitious carbon or additives in the polymer. The O 1s signal was well fit with two GLS peaks with a 1:1 area ratio representing the C—O and C=O moieties in PET.
Skip Nav Destination
,
,
,
,
,
,
,
,
Article navigation
June 2020
Research Article|
April 27 2020
Polyethylene terephthalate by near-ambient pressure XPS
Tahereh G. Avval;
Tahereh G. Avval
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
Search for other works by this author on:
Grant T. Hodges;
Grant T. Hodges
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
Search for other works by this author on:
Joshua Wheeler;
Joshua Wheeler
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
Search for other works by this author on:
Daniel H. Ess;
Daniel H. Ess
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
Search for other works by this author on:
Stephan Bahr;
Stephan Bahr
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
Search for other works by this author on:
Paul Dietrich
;
Paul Dietrich
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
Search for other works by this author on:
Michael Meyer;
Michael Meyer
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
Search for other works by this author on:
Andreas Thißen;
Andreas Thißen
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
Search for other works by this author on:
Matthew R. Linford
Matthew R. Linford
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
Search for other works by this author on:
Tahereh G. Avval
1
Grant T. Hodges
1
Joshua Wheeler
1
Daniel H. Ess
1
Stephan Bahr
2
Paul Dietrich
2
Michael Meyer
2
Andreas Thißen
2
Matthew R. Linford
1
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
Surf. Sci. Spectra 27, 014006 (2020)
Article history
Received:
September 30 2019
Accepted:
March 31 2020
Citation
Tahereh G. Avval, Grant T. Hodges, Joshua Wheeler, Daniel H. Ess, Stephan Bahr, Paul Dietrich, Michael Meyer, Andreas Thißen, Matthew R. Linford; Polyethylene terephthalate by near-ambient pressure XPS. Surf. Sci. Spectra 1 June 2020; 27 (1): 014006. https://doi.org/10.1116/1.5129466
Download citation file:
Pay-Per-View Access
$40.00
Sign In
You could not be signed in. Please check your credentials and make sure you have an active account and try again.
Citing articles via
Analysis of nickel sulfoselenide materials by XPS
Melissa L. Meyerson, Samantha G. Rosenberg, et al.
XPS study of NiO thin films obtained by chemical vapor deposition
Gioele Pagot, Mattia Benedet, et al.
Magnesium sulfide powder analyzed by XPS
Noah Jäggi, Catherine A. Dukes