Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at 2500 Pa or higher. With NAP-XPS, XPS can analyze moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. Because of the relatively high working pressure of NAP-XPS, the components of ambient air may be present in the analytical chamber during data acquisition. In this submission, we show survey, O 1s, N 1s, valence band, oxygen Auger (KLL), and nitrogen Auger (KLL) NAP-XPS spectra from ambient air, a material that could not be analyzed at moderate pressures by conventional XPS.

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