Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., greater than 2500 Pa. With NAP-XPS, a wide variety of unconventional materials can be analyzed, including moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. Charge compensation with NAP-XPS takes place simply through the residual/background gas in the chamber, which is ionized by the incident x-rays. High quality spectra—high resolution and good signal-to-noise ratios—are regularly obtained. This article is an introduction to a series of papers in Surface Science Spectra on the NAP-XPS characterization of a series of materials. The purpose of these articles is to introduce and demonstrate the versatility and usefulness of the technique.
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Introduction to near-ambient pressure x-ray photoelectron spectroscopy characterization of various materials
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June 2019
Editorial|
July 18 2019
Introduction to near-ambient pressure x-ray photoelectron spectroscopy characterization of various materials

Dhananjay I. Patel;
Dhananjay I. Patel
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
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Tuhin Roychowdhury;
Tuhin Roychowdhury
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
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Varun Jain;
Varun Jain
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
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Dhruv Shah;
Dhruv Shah
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
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Tahereh G. Avval;
Tahereh G. Avval
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
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Shiladitya Chatterjee;
Shiladitya Chatterjee
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
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Stephan Bahr;
Stephan Bahr
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
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Paul Dietrich
;
Paul Dietrich
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
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Michael Meyer;
Michael Meyer
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
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Andreas Thißen;
Andreas Thißen
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
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Matthew R. Linford
Matthew R. Linford
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
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Dhananjay I. Patel
1
Tuhin Roychowdhury
1
Varun Jain
1
Dhruv Shah
1
Tahereh G. Avval
1
Shiladitya Chatterjee
1
Stephan Bahr
2
Paul Dietrich
2
Michael Meyer
2
Andreas Thißen
2
Matthew R. Linford
1
1
Department of Chemistry and Biochemistry, Brigham Young University
, C100 BNSN, Provo, Utah 84602
2
SPECS Surface Nano Analysis GmbH
, Voltastrasse 5, 13355 Berlin, Germany
Surf. Sci. Spectra 26, 016801 (2019)
Article history
Received:
May 06 2019
Accepted:
June 14 2019
Connected Content
A companion article has been published:
New demonstrations show the potential of near-ambient pressure X-ray photoelectron spectroscopy
Citation
Dhananjay I. Patel, Tuhin Roychowdhury, Varun Jain, Dhruv Shah, Tahereh G. Avval, Shiladitya Chatterjee, Stephan Bahr, Paul Dietrich, Michael Meyer, Andreas Thißen, Matthew R. Linford; Introduction to near-ambient pressure x-ray photoelectron spectroscopy characterization of various materials. Surf. Sci. Spectra 1 June 2019; 26 (1): 016801. https://doi.org/10.1116/1.5109118
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